• 한국진공학회:학술대회논문집
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• 한국진공학회 2000년도 제18회 학술발표회 논문개요집
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• pp.212-212
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• 2000

Since the first obserbvation of carbon nanotubes, extensive researches have been done for the synthesis using arc discharge, laser vaporization, and plasma-enhanced chemical vapor deposition. Carbon nanotubes have unique physical and chemical properties and can allow nanoscale devices. Vertically aligned carbon nanotubes with high quality on a large area is particularly important to enable both fundamental studies and applications, such as flat panel displays and vacuum microelectronics. we have grown vertically aligned carbon nanotubes on a large area of Si substrates by thermal chemical vapor deposition using C2H2 gas at 750-950$^{\circ}C$. we deposited catalytic metal on Si susbstrate using thermal evaporation. The nanotubes reveal highly purified surface. The carbon nanotubes have multi-wall structure with a hollow inside and it reveals bamboo structure agreed with base growth model. Figure 1 shows SEM micrograph showing vertically aligned carbon nanotubes whih were grown at 950$^{\circ}C$ on a large area (20mm${\times}$30mm) of Si substrates. Figure 2 shows TEM analysis was performed on the carbon nanotubes grown at 950$^{\circ}C$ for 10 min. The carbon nanotubes are multi-wall structure with bamboo shape and the lack of fringes inside the nanotube indicates that the core of the structure is hollow. In our experiment, carbon nanotubes grown by the thermal CVD indicate base growth model.

• 한국전기전자재료학회논문지
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• 제36권1호
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• pp.74-80
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• 2023

Gallium oxide (Ga₂O₃) thin films were grown on c-, a-, m-, r-plane sapphire substrates using a mist chemical vapor deposition system. Various growth temperature range of 400~600℃ was applied for Ga₂O₃ thin film deposition. Then, several structural properties were characterized such as film thickness, crystal phase, lattice orientation, surface roughness, and optical bandgap. Under the certain growth temperature of 500℃, all grown Ga₂O₃ featured rhombohedral crystal structures and well-aligned preferred orientation to sapphire substrate. The films grown on c-and r-plane sapphire substrates, showed low surface roughness and large optical bandgap compared to those on a-and m-plane substrates. Therefore, various sapphire orientation can be potentially applicable for future Ga₂O₃-based electronics applications.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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• pp.375-375
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• 2012

Graphene is a sp2-hybridized carbon sheet with an atomic-level thickness and a wide range of graphene applications has been intensely investigated due to its unique electrical, optical, and mechanical properties. In particular, hybrid graphene structures combined with various nanomaterials have been studied in energy- and sensor-based applications due to the high conductivity, large surface area and enhanced reactivity of the nanostructures. Conventional metal-catalytic growth method, however, makes useful applications difficult since a transfer process, used to separate graphene from the metal substrate, should be required. Recently several papers have been published on direct graphene growth on the two dimensional planar substrates, but it is necessary to explore a direct growth of hierarchical nanostructures for the future graphene applications. In this study, uniform graphene layers were successfully synthesized on highly dense dielectric nanowires (NWs) without any external catalysts. We also demonstrated that the graphene morphology on NWs can be controlled by the growth parameters, such as temperature or partial pressure in chemical vapor deposition (CVD) system. This direct growth method can be readily applied to the fabrication of nanoscale graphene electrode with designed structures because a wide range of nanostructured template is available. In addition, we believe that the direct growth growth approach and morphological control of graphene are promising for the advanced graphene applications such as super capacitors or bio-sensors.

• 한국진공학회지
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• 제20권2호
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• pp.155-163
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• 2011

탄소나노튜브(CNT)와 합성기판 사이의 전도성 향상을 목적으로, 현재 리튬이온이차전지 등의 분야에서 전극으로 이용되고 있는 구리 호일을 합성기판으로 하여, 그 위에 수직배향 CNT 성장의 합성 최적화를 도모하였다. 합성은 수평식 CVD 합성장비를 이용하였으며, 최적의 합성조건은 구리호일 위에 10 nm의 Al2O3 버퍼층과 1 nm 두께의 Fe 촉매층을 증착한 후, 아세틸렌 가스를 이용하여 $800^{\circ}C$에서 20분간 합성한 조건으로 설정하였다. CNT는 base-growth의 성장형태를 따랐고, Fe 1 nm 두께인 경우, $7.2{\pm}1.5nm$의 촉매나노입자가 형성되었으며, 이를 이용하여 $800^{\circ}C$에서 20분 성장결과, 직경 8.2 nm, 길이 $325{\mu}m$의 수직배향 CNT를 얻을 수 있었다. 합성시간이 길어져도 CNT의 결정성, 직경 및 겹(wall) 수에는 큰 변화가 없었다. 끝으로, 구리호일 위에 수직 성장시킨 CNT의 전계방출 특성을 측정한 결과, 실리콘 산화막 위에 성장시킨 CNT와 비교하여, 월등히 낮은 전계방출 문턱전압과 10배 정도 높은 전계향상계수를 보였다. 이는 CNT와 금속기판 사이의 계면에서 전기전도도가 향상된 결과에 기인하는 것으로 사료된다.

• Composites Research
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• 제31권2호
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• pp.43-50
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• 2018

화학기상증착 탄화규소(CVD-SiC)의 높은 증착율과 우수한 굽힘강도 특성을 얻기 위해 증착온도에 대한 영향을 연구하였다. Hot-wall CVD 방법으로 메틸트리클로로실란(MTS : $CH_3SiCl_3$)을 이용하여 $1250{\sim}1400^{\circ}C$ 조건에서 제조된 탄화규소는 $95.7{\sim}117.2{\mu}m/hr$ 정도의 증착율을 보였다. 율속반응은 $1300^{\circ}C$ 미만에서는 표면반응, 그 이상의 온도에서는 물질전달 지배영역 특성을 나타내었다. Arrhenius plot을 통해 계산한 활성화 에너지는 각각 11.26 kcal/mole과 4.47 kcal/mole이였다. 증착온도별 표면 형상은 $1250^{\circ}C$ pebble에서 $1300^{\circ}C$ facet 구조로 변하였고, $1350^{\circ}C$ 이상에서는 multi-facet 구조를 나타내었다. 단면 형상은 $1300^{\circ}C$ 이하에서 columnar, $1350^{\circ}C$ 이상에서 isometric 구조를 보였다. 결정상은 모두 ${\beta}$-SiC로 확인되었지만 결정성장 방향은 $1250^{\circ}C$ (111)에서 $1300^{\circ}C$ 이상부터 (220) peak가 관찰되었으며, $1400^{\circ}C$에서는 (220)으로 완전히 변함을 알 수 있었다. 굽힘강도 특성은 증착온도가 증가할수록 치밀화되고, columnar에서 isometric 조직으로 변화되면서 $1350^{\circ}C$에서 최대값을 나타내었으며, $1400^{\circ}C$에서는 grain size 증가와 결정성장 방향이 최밀충진면인 (111)에서 (220)으로 완전히 변하면서 감소된 것으로 보인다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.197-198
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• 2009

This paper describes the Raman scattering characteristics of polycrystalline (poly) 3C-SiC films, which were deposited on the thermally oxidized Si(100) substrate by the atmosphere pressure chemical vapor deposition (APCVD) method according to growth temperature. TO and LO phonon modes to 2.0m thick poly 3C-SiC deposited at $1180^{\circ}C$ were measured at 794.4 and $965.7\;cm^{-1}$ respectively. From the intensity ratio of $I_{(LO)}/I_{(TO)}$ 1.0 and the broad full width half maximum (FWHM) of TO modes, itcan be elucidated that the crystallinity of 3C-SiC forms polycrystal instead of disordered crystal and the crystal defect is small. At the interface between 3C-SiC and $SiO_2$, $1122.6\;cm^{-1}$ related to C-O bonding was measured. Here poly 3C-SiC admixes with nanoparticle graphite with the Raman shifts of D and G bands of C-C bonding 1355.8 and $1596.8\;cm^{-1}$. Using TO mode of 2.0 m thick poly 3C-SiC, the biaxial stress was calculated as 428 MPa.

• 한국재료학회지
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• 제11권8호
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• pp.697-702
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• 2001

열화학 기상 증착법을 이용하여 암모니아 처리에 따른 촉매 금속의 표면형태와 탄소 나노튜브의 성장을 조사하였다. 암모니아 처리의 열화학 과정의 조절에 의해 고르게 분산된 수직 성장된 탄소 나노튜브를 얻었다. 탄소 나노튜브 합성시 암모니아처리는 수직성장 및 고밀도 성장에 중요한 과정으로 그 역할에 대해 알아보았다. 고밀도의 수직 배향된 탄소나노튜브의 구조와 형태는 주사전자 현미경과 투과전자 현미경, 라만을 이용하여 관찰하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.415-415
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• 2008

수분을 첨가한 열화학기상증착으로 $850^{\circ}C$에서 길게 수직 성장한 다중벽 탄소나노튜브를 합성하였다. 실리콘 웨이퍼에 열 증착기로 Al 15 nm를 입히고 그 위에 촉매 층으로 Fe 0.5 nm 를 증착한 기판을 사용하였다. 탄소나노튜브의 성장에는 분위기 가스로 Ar을, 성장 가스로 $C_2H_2$를 사용하였다. 이들 가스를 이용한 합성 중에 약 100 ppm 전후의 수분을 첨가함으로써 탄소나노튜브의 성장 길이를 10 배 가량 증가시켰다. 이것은 합성 중의 수분 첨가로 인해 금속촉매 입자들의 활동성이 증가하였기 때문이다. 수분의 첨가량를 달리하여 합성한 탄소나노튜브의 길이와 정렬도를 관찰하기 위해 주사전자현미경 (scanning electron microscopy, SEM)을 이용하였고, 탄소나노튜브의 정확한 지름과 벽의 개수를 파악하기 위해 투과전자현미경 (transmission electron microscopy)을, 결정성을 파악하기 위해 Raman 분광기를 사용하였다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1995년도 추계학술대회 논문집 학회본부
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• pp.326-328
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• 1995

SiC buffer layers were grown on Si(100) substrates by ultra-high-vacuum electron cryclotron resonance plasma (UHV ECR plasma) from $CH_4/H_2$ mixture at 700$^{\circ}C$. The electron densities and temperature were measured by single probe. The axial plasma potentials measured by emissive probe had the double layer structure at positive substrate bias. Piranha cleaning was carried out as ex-situ wet cleaning. Clean and smooth silicon surface were prepared by in-situ hydrogen plasma cleaning at 540$^{\circ}C$. A short exposure to hydrogen plasma transforms the Si surface from 1$\times$1 to 2$\times$1 reconstruction. It was monitored by reflection high energy electron diffraction (RHEED). The defect densities were analysed by the dilute Schimmel etching. The results showed that the substrate bias is important factor in hydrogen plasma cleaning. The low base pressure ($5\times10^{-10}$ torr) restrains the $SiO_2$ growth on silicon surface. The grown layers showed different characteristics at various substrate bias. RHEED and K-ray Photoelectron spectroscopy study showed that grown layer was SiC.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2008년도 제39회 하계학술대회
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• pp.1218-1219
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• 2008

Thin films (< 30 nm) of titanium carbide (TiC) are coated on carbon nanotubes (CNTs), which are directly grown on nano-sized ($\sim$ 500 nm in diameter) conical-type tungsten (W) tips, by employing an inductively coupled plasma-chemical vapor deposition (ICP-CVD) technique. Any modification in structural properties (such as length to diameter ratio, crystal quality, and growth behavior) of CNTs due to TiC-coating has been monitored by using high-resolution TEM, field-emission SEM, and Raman spectroscopy. Driving voltage for obtaining the same level of emission current in CNTs-emitter is significantly reduced by TiC-coating. It is also worthy of being noted that the degradation of emission current due to prolonged operation (up to 30 h) is remarkably suppressed by TiC-coating.