• Journal of IKEEE
• /
• v.24 no.3
• /
• pp.719-726
• /
• 2020

A threshold-voltage sensing circuit is proposed to compensate for pixel aging in active matrix organic light-emitting diodes. The proposed threshold-voltage sensing circuit consists of sample-hold (S/H) circuits and a single-ended successive approximation register (SAR) analog-to-digital converter (ADC) with a resolution of 10 bits. To remove a scale down converter of each S/H circuit and a voltage gain amplifier with a signl-to-differentail converter, the middle reference voltage calibration and input range calibration for the single-ended SAR ADC are performed in the capacitor digital-to-analog converter and reference driver. The proposed threshold-voltage sensing circuit is designed by using a 180-nm CMOS process with a supply voltage of 1.8 V. The ENOB and power consimption of the single-ended SAR ADC are 9.425 bit and 2.83 mW, respectively.

• Proceedings of the IEEK Conference
• /
• 2001.06b
• /
• pp.253-256
• /
• 2001

This paper introduces the design of high-speed analog- to-digital converter for high-definition TV, camcorders, portable equipments and implemented in a 0.65${\mu}{\textrm}{m}$ CMOS technology. Key circuits developed for low power and high speed A/D converter are a dynamic comparator that consumes no static power, a source follower buffered op amp that achives wide bandwidth using large input devices. The converter achieves low power dissipation of 40-mW at 3.3-V power supply. Measured performance includes 0.53 LSB of INL and 0.48 LSB of DNL while sampling at 60MHz.

• Proceedings of the KIEE Conference
• /
• 2003.11c
• /
• pp.361-364
• /
• 2003

In this paper, a high-resolution multibit sigma-delta modulator implemented in a.0.35-um CMOS technology is introduced. This modulator consists of two switched capacitor integrators, 3-bits A/D converter, and 3-bits D/A converter For the verification of the internal function blocks, HSPICE simulator is used. This circuit is normally operated at 130 MHz clock and the total power dissapation is 70 mW.

• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.8 no.7
• /
• pp.1442-1447
• /
• 2004

In this paper, a 6-Bit CMOS Folding and Interpolating AD Converter is presented. The converter is considered to be useful as an integrated part of a VLSI circuit handling both analog and digital signals as in the case of HDD or LAN applications. A built-in analog circuit for VLSI of a high-speed data communication requires a small chip area, low power consumption, and fast data processing. The proposed folding and interpolating AD Converter uses a very small number of comparators and interpolation resistors, which is achieved by cascading a couple of folders working in different principles. This reduced number of parts is a big advantage for a built-in AD converter design. The design is based on 0.25m double-poly 2 metal n-well CMOS process. In the simulation, with the applied 2.5V and a sampling frequency of 500MHz, the measurements are as follows: power consumption of 27mw, INL and DNL of $\pm$0.1LSB, $\pm$0.15LSB each, SNDR of 42dB with an input signal of 10MHz.

• Journal of Power Electronics
• /
• v.14 no.4
• /
• pp.796-805
• /
• 2014

A digital controller with a low-power approach for point-of-load synchronous buck converters is discussed and compared with its analog counterpart to confirm its feasibility for system integration. The tri-mode digital controller IC in $0.35{\mu}m$ CMOS process is presented to demonstrate solutions that include a PID, quarter PID, and robust RST compensators. These compensators address the steady-state, stand-by, and transient modes according to the system operating point. An idle-tone free condition for ${\Sigma}-{\Delta}$ DPWM reduces the inherent tone noise under DC-excitation. Compared with that of the traditional approach, this condition generates a quasi-pure modulation signal. Experimental results verify the closed-loop performances and confirm the power-saving mechanism of the proposed controller.

• Journal of the Institute of Electronics and Information Engineers
• /
• v.54 no.2
• /
• pp.47-52
• /
• 2017

In this paper, CMOS SAR A/D converter 1.8V supply for the design of an A/D converter having an middle speed for the biological signal processing was designed. This paper proposes design of a 10-bit SAR Analog to Digital Converter improving linearity driven by MSB node of C-DAC array divided into 4 equal parts. It enhances linearity property, by retaining the analog input signal charging time at MSB node. Because MSB node samples analog input, it enhances resolution through getting initial input signal precisely. By using split capacitor on C-DAC array, it reduced chip size and power dissipation. The Proposed SAR A/D Converter is fabricated in 0.18um CMOS and measured 7.5 bits of ENOB at sampling frequency 4MS/s and power supply of 1.8V. It occupies a core area of $850{\times}650um^2$ and consumes 123.105uW. Therefore it results in 170.016fJ/step of FOM(Figure of Merit).

• Journal of the Institute of Electronics Engineers of Korea SC
• /
• v.39 no.4
• /
• pp.16-24
• /
• 2002

This work describes a 10b 120 MSample/s CMOS pipelined A/D converter(ADC) based on a merged-capacitor switching(MCS) technique for high signal processing speed and high resolution. The proposed ADC adopts a typical multi-step pipelined architecture to optimize sampling rate, resolution, and chip area, and employs a MCS technique which improves sampling rate and resolution reducing the number of unit capacitor used in the multiplying digital-to-analog converter (MDAC). The proposed ADC is designed and implemented in a 0.25 um double-poly five-metal n-well CMOS technology. The measured differential and integral nonlinearities are within ${\pm}$0.40 LSB and ${\pm}$0.48 LSB, respectively. The prototype silicon exhibits the signal-to-noise-and-distortion ratio(SNDR) of 58 dB and 53 dB at 100 MSample/s and 120 MSample/s, respectively. The ADC maintains SNDR over 54 dB and the spurious-free dynamic range(SFDR) over 68 dB for input frequencies up to the Nyquist frequency at 100 MSample/s. The active chip area is 3.6 $mm^2$(＝ 1.8 mm ${\times}$ 2.0 mm) and the chip consumes 208 mW at 120 MSample/s.

• International Journal of Internet, Broadcasting and Communication
• /
• v.5 no.2
• /
• pp.11-14
• /
• 2013

This paper describes the sigma-delta ADC/DAC digital block with two channels. The ADC block has comb filter and three half band filters. And the DAC block has 5th Cascaded-of-Integrators Feedback DSM. The ADC and DAC support I2S, RJ, LJ and selectable input data modes of 24bit, 20bit, and 16bit. It is fabricated with 0.35um Hynix standard CMOS cell library. The chip size is 3700*3700um. It has been verified using NC Verilog Simulator and Matlab Tool.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.11 no.2
• /
• pp.104-110
• /
• 2011

A CMOS Image Sensor (CIS) mounted on mobile appliances requires low power consumption due to limitations of the battery life cycle. In order to reduce the power consumption of CIS, we propose novel power reduction techniques such as a data flip-flop circuit with leakage current elimination and a low power single slope analog-to-digital (A/D) converter with a sleep-mode comparator. Based on 0.13 ${\mu}m$ CMOS process, the chip satisfies QVGA resolution (320 ${\times}$ 240 pixels) that the cell pitch is 2.25 um and the structure is a 4-Tr active pixel sensor. From the experimental results, the performance of the CIS has a 10-b resolution, the operating speed of the CIS is 16 frame/s, and the power dissipation is 25 mW at a 3.3 V(analog)/1.8 V(digital) power supply. When we compare the proposed CIS with conventional ones, the power consumption was reduced by approximately 22% in the sleep mode, and 20% in the active mode.

• Journal of IKEEE
• /
• v.17 no.3
• /
• pp.234-240
• /
• 2013

This paper presents an incremental delta-sigma analog-to-digital converter (ADC) for a single-electrode capacitive touch sensor. The second-order cascade of integrators with distributed feedback (CIFB) delta-sigma modulator with 1-bit quantization was fabricated by a $0.18-{\mu}m$ CMOS process. In order to achieve a wide input range in this incremental delta-sigma analog-to-digital converter, the shielding signal and the digitally controlled offset capacitors are used in front of a converter. This circuit operated at a supply voltage of 2.6 V to 3.7 V, and is suitable for single-electrode capacitive touch sensor for ${\pm}10-pF$ input range with sub-fF resolution.