• Journal of Korea Multimedia Society
• /
• v.13 no.5
• /
• pp.641-650
• /
• 2010

Color image sensors (CIS) output color images through image sensors and image signal processing. Image sensors that convert light to electrical signal are divided into CMOS image sensor and CCD image sensor according to transferring method of signal charge. In general, a CIS has RGB output signals from tri-stimulus XYZ of the scene through image signal processing. This paper presents an adaptive colorimetric analysis method to obtain chromaticity and luminance using CIS under various environments. An image sensor for the use of colorimeter is characterized based on the CIE standard colorimetric observer. We use the method of least squares to derive a colorimetric characterization matrix between camera RGB output signals and CIE XYZ tristimulus values. We first survey the camera characterization in the standard environment then derive a SGL(shutter-gain-level) function which is relationship between luminance and auto exposure (AE) characteristic of CIS, and read the status of an AWB(auto white balance) function. Then we can apply CIS to measure luminance and chromaticity from camera outputs and AE resister values without any preprocessing. Camera RGB outputs, register values, and camera photoelectric characteristic are used to analyze the colorimetric results for real scenes such as chromaticity and luminance. Experimental results show that the proposed method is valid in the measuring performance. The proposed method can apply to various fields like surveillant systems of the display or security systems.

• Korean Journal of Optics and Photonics
• /
• v.28 no.3
• /
• pp.108-115
• /
• 2017

We report the assembly procedure and performance evaluation of a visible and near-infrared spectrometer in the wavelength region of 400-900 nm, which is later to be combined with fore-optics (a telescope) to form a f/2.5 imaging spectrometer with a field of view of ${\pm}7.68^{\circ}$. The detector at the final image plane is a $640{\times}480$ charge-coupled device with a $24{\mu}m$ pixel size. The spectrometer is in an Offner relay configuration consisting of two concentric, spherical mirrors, the secondary of which is replaced by a convex grating mirror. A double-pass test method with an interferometer is often applied in the assembly process of precision optics, but was excluded from our study due to a large residual wavefront error (WFE) in optical design of 210 nm ($0.35{\lambda}$ at 600 nm) root-mean-square (RMS). This results in a single-path test method with a Shack-Hartmann sensor. The final assembly was tested to have a RMS WFE increase of less than 90 nm over the entire field of view, a keystone of 0.08 pixels, a smile of 1.13 pixels and a spectral resolution of 4.32 nm. During the procedure, we confirmed the validity of using a Shack-Hartmann wavefront sensor to monitor alignment in the assembly of an Offner-like spectrometer.