• 제목/요약/키워드: Bridgman Method

검색결과 101건 처리시간 0.019초

단일 온도대역 수평 Bridgman(1-T HB) 법에 의한 GaAs 단결정 성장 (Single Crystal Growth of GaAs by Single Temperature Zone horizontal Bridgman(1-T HB) Method)

  • 오명환;주승기
    • 한국결정학회지
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    • 제7권1호
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    • pp.73-80
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    • 1996
  • 단일 온도대역 수평 Bridgman(1-T HB)법에 의해 2인치 직경의 GaAs 단결정을 성장시키기 위하여 그 장치를 설계·제작하였고, undoped, Si-doped 및 Zn-doped 단결정을 성장하였다. 단결정성의 측면에서 성장횟수별 비로 0.73의 단결정성을 보였고, 격자결함 밀도(etch pit density)는 n-type의 경우 평균 5,000/cm2, p-type의 경우 10,000/cm2, 그리고 undoped의 경우 20,000/cm2 정도를 보였다. 한편 undoped GaAs 단결정의 경우, Hall 측정에 의한 carrier 농도가 ∼1×1016/cm3인 것으로 나타나 기존의 이중 온도대역(2-T : double temperature zone) 또는 삼중 온도대역(3-T : three temperature zone) 수평 Bridgman 방식에 비하여 Si 유입량이 절반 수준인 것으로 측정되었다. 따라서 1-T HB 방식에 의하여 2-T나 3-T HB 방법보다 나은 수율을 갖고 더 순도가 높은 GaAs 단결정을 성장시킬 수 있었다.

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Control of axial segregation by the modification of crucible geometry

  • Lee, Kyoung-Hee
    • 한국결정성장학회지
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    • 제18권5호
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    • pp.191-194
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    • 2008
  • We will focus on the horizontal Bridgman growth system to analyze the transport phenomena numerically, because the simple furnace system and the confined growth environment allow for the precise understanding of the transport phenomena in solidification process. In conventional melt growth process, the dopant concentration tends to vary significantly along the crystal. In this work, we propose the modification of crucible geometry for improving the productivity of silicon single-crystal growth by controlling axial specific resistivity distribution. Numerical analysis has been performed to study the transport phenomena of dopant impurities in conventional and proposed Bridgman silicon growth using the finite element method and implicit Euler time integration. It has been demonstrated using mathematical models and by numerical analysis that proposed method is useful for obtaining crystals with superior uniformity along the growth direction at a lower cost than can be obtained by the conventional melt growth process.

수직 Bridgman 법에 의한 CdTe 단결정 성장과 특성 (Growth and characterization of CdTe single crystal by vertical Bridgman method)

  • 홍명석;홍광준
    • 센서학회지
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    • 제14권6호
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    • pp.369-373
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    • 2005
  • High quality CdTe single crystal for the solar cell fabrication was grown by vertical Bridgman method. The etch pits patterns of (111) surfaces of CdTe etched by Nakagawa solution was observed the (111)A compesed of Cd atoms with typical triangle etch pits of pyramid mode. From the photoluminescence measurement on (111)A, we observed free exciton ($E_{x}$) existing only high quality crystal and neutal acceptor bound exciton ($A^{0}$,X) having very strong peak intensity. Then, the full width at half maximum and binding energy of neutral acceptor bound exciton were 7 meV and 5.9 meV, respectively. By Haynes rule, an activation enery of impurity was 59 meV. Therefore, the origins on impurity level acting as a neutral acceptor were associated Ag or Cu elements.

Bridgman 방법으로 성장된 CdTe의 광발광 특성 (Photoluminescent properties for CdTe crystal grown by Bridgman method)

  • 홍광준;유상하
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2004년도 춘계학술대회 논문집 반도체 재료 센서 박막재료 전자세라믹스
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    • pp.42-45
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    • 2004
  • High quality CdTe single crystal for the solar cell fabrication was grown by vertical Bridgman method. The etch pits patterns of {111}surfaces of CdTe etched by Nakagawa solution was observed the {111} A composed of Cd atoms with typical triangle etch pits of pyramid mode. From the photoluminescence measurement on {111}A, we observed free exciton($E_x$) existing only higy quality crystal and neytral acceptor bound exciton($A^0$,X) having very strong peak intensity. Then, the full width at half maximum and binding energy of neutral acceptor bound exciton were 7 meV and 5.9 meV, respectively. By Haynes rule, an actibation energy of impurity was 59 meV. Therefore, the origins on impurity level acting as a neutral acceptor were associated Ag or Cu elements.

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Bridgman법에 의한 $Cdln_2Te_4$ 단결정 성장과 에너지 밴드갭의 온도 의존성 (Growth and temperature dependence of energy band gap for $Cdln_2Te_4$ Single Crystal by Bridgman method)

  • 홍광준;박창선
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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    • pp.112-113
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    • 2006
  • A stoichiometric mixture for $Cdln_2Te_4$ single crystal was prepared from horizontal electric furnace. The $Cdln_2Te_4$ single crystal was grown in the three-stage vertical electric furnace by using Bridgman method. The quality of the grown crystal has been investigated by the x-ray diffraction and the photoluminescence measurements. The (001) growth plane of oriented $Cdln_2Te_4$ single crystal was confirmed from back-reflection Laue patterns. The carrier density and mobility of $Cdln_2Te_4$ single crystal measured with Hall effect by van der Pauw method are $8.61{\times}10^{16}\;cm^{-3}$ and $242\;cm^2/V{\cdot}s$ at 293 K, respectively. The temperature dependence of the energy band gap of the $Cdln_2Te_4$ single crystal obtained from the absorption spectra was well described by the Varshni's relation, $E_g(T)\;=\;1.4750\;eV\;-\;(7.69{\times}\;10^{-3}\;eV)T^2/(T+2147)$.

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Bridgman법으로 성장한 CdIn2Te4 단결정의 광전류 온도 의존성 (Temperature dependence of photocurrent for CdIn2Te4 single crystal grown by Bridgman method)

  • 유상하;홍광준
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2003년도 추계학술발표강연 및 논문개요집
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    • pp.157-157
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    • 2003
  • 수평 전기로에서 CdIn2Te4 다결정을 용융법으로 합성하고 Bridgman법으로 tetragonal structure의 c축에 평행한 CdIn2Te4 단결정을 성장시켰다. c축에 평행한 시료의 광흡수와 광전류 spectra를 293K에서 10K까지 측정하였다. 광흡수 spectra에 의해 band gap Eg(T)는 varshni공식에 따라 계산한 결과 1.4753eV-(7.78$\times$$10^{-3}$eV/K)T$^2$/(T+2155K)임을 확인하였다. Hall 효과는 van der Pauw 방법에 의해 측정되었으며, 온도에 의존하는 운반자 농도와 이동도는 293K에서 각각 9.01$\times$$10^{16}$ /㎤, 219 $\textrm{cm}^2$/V.S였다. 광전류 스펙트럼으로부터 Hamilton matrix(Hopfield quasicubic mode)법으로 계산한 결과 crystal field splitting $\Delta$cr값이 0.2704 eV이며 spin-orbit $\Delta$so 값은 0,1465 eV임을 확인하였다. 10K일 때 광전류 봉우리들은 n=1일때 Al-, Bl-와 Cl-exciton 봉우리임을 알았다.

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Numerical Study on the Vertical Bridgman Crystal Growth with Thermosolutal Convection

  • Park, Byung-Kyu;Kim, Moo-Geun;Kim, Geun-Oh
    • Journal of Mechanical Science and Technology
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    • 제15권8호
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    • pp.1188-1195
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    • 2001
  • A numerical analysis has been carried out to investigate the influences of thermosolutal convection on the heat and mass transfer and solute segregation in crystals grown by the vertical Bridgman technique. The governing equations are solved by a finite-volume method using the power law scheme and the SIMPLE algorithm in which body-fitted coordinate system has been used. A primary convective cell driven by thermal gradients forms in the bulk of the domain, while a secondary convective cell driven by solutal gradients forms near interface. As the solutal Rayleigh number increases, secondary cell becomes to be stronger and has a great influence on the radial concentration along the interface.

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Bridgman법에 의한 $Cdln_2Te_4$단결정의 성장과 가전자대 갈라짐에 대한 광전류 연구 (Photocurrent study on the splitting of the valence band and growth of $Cdln_2Te_4$ single crystal by Bridgman method)

  • 홍광준;이관교;이봉주;박진성;신동찬
    • 한국결정성장학회지
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    • 제13권3호
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    • pp.132-138
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    • 2003
  • 수평 전기로에서 $CdIn_2Te_4$ 다결정을 용응법으로 합성하고 Bridgman법으로 tetragonal structure의 $CdIn_2Te_4$ 단견정을 성장시켰다. c축에 수직한 시료의 광흡수와 광전류 spectra를 293k에서 10K까지 측정하였다. Hall효과는 van der Pauw 방법에 의해 측정되었으며, 온도에 의존하는 운반자 농도와 이동도는 293 K에서 각각 $8.61\times 10^{16}\textrm{cm}^3,\;242\textrm{cm}^$V .s였다. $CdIn_2Te_4$ 단결정의 광흡수와 광전류 spectra를 293k에서 10K까지 측정하였다. 광흡수 스펙트럼으로부터 band gap $E_g$(T)는 Varshni 공식에 따라 계산한 결과 $1.4750ev - (7.69\times10^{-3})\; ev/k)\;T^2$/(T + 2147k)이었다. 광전류 스펙트럼으로부터 Hamilton matrix(Hopfield quasicubic mode)법으로 계산한 결과 crystal field splitting Δcr값이 0.2704 eV이며 spin-orbit $\Delta$so값은 0.1465 eV임을 확인하였다. 10K일 때 광전류 봉우리들은 n : 1일때 $A_\;{1-} B_\;{1-}$$C_\;{1-}$-exciton봉우리임을 알았다

수직 Bridgman 방법으로 성장된 CdTe {111} 면의 결정학과 광발광 특성 (Photoluminescent and crystallographic characterization of CdTe {111} surfaces grown by the ertical Bridgman method)

  • 정태수;박은옥;유평렬;김택성;이훈;신영진;홍광준
    • 한국진공학회지
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    • 제8권3B호
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    • pp.297-301
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    • 1999
  • High quality CdTe single crystal for the solar cell fabrication was grown by vertical Bridgman method. The etch pits patterns of {111} surfaces of CdTe etched by Nakagawa solution was observed the {11} A composed of Cd atoms with typical triangle etch pits of pyramid mode. From the photoluminescence measurement of {111} A, we observed free exciton $(E_x)$ existing only high quality crystal and neutral acceptor bound exciton ($A^{\circ}$, X) having very strong peak intensity. Then, the full width at half maximum and binding energy of neutral acceptor bound exciton were 7 meV and 5.9 meV, respectively. By Haynes rule, and activation energy of impurity was 59meV. Therefore, the origins on impurity level acting as a neutral acceptor were associated Ag or Cu elements.

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