• Journal of the Korean Institute of Telematics and Electronics
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• v.23 no.5
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• pp.726-731
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• 1986

An effective filtering algorithm which can reduce noise and preserve edges for the restoration of an image degraded by additive white Gaussian noise is presented. The algorithm proposed in this paper is an extension of Lee's algorithm modified to use local gradient information as well as local statistics. It does not require image modeling, and removes noise along the orientaiton of edges so that it does not blur the edge.

• Current Optics and Photonics
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• v.2 no.1
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• pp.69-78
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• 2018

This paper presents a precise edge detection algorithm for the critical dimension (CD) measurement of a Thin-Film Transistor Liquid-Crystal Display (TFT-LCD) pattern. The sigmoid surface function is proposed to model the blurred step edge. This model can simultaneously find the position and geometry of the edge precisely. The nonlinear least squares fitting method (Levenberg-Marquardt method) is used to model the image intensity distribution into the proposed sigmoid blurred edge model. The suggested algorithm is verified by comparing the CD measurement repeatability from high-magnified blurry and noisy TFT-LCD images with those from the previous Laplacian of Gaussian (LoG) based sub-pixel edge detection algorithm and error function fitting method. The proposed fitting-based edge detection algorithm produces more precise results than the previous method. The suggested algorithm can be applied to in-line precision CD measurement for high-resolution display devices.