• Title/Summary/Keyword: Bayesian reliability demonstration test

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Design of Bayesian Zero-Failure Reliability Demonstration Test and Its Application (베이지안 신뢰성입증시험 설계와 활용)

  • Kwon, Young Il
    • Journal of Applied Reliability
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    • v.13 no.1
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    • pp.1-10
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    • 2013
  • A Bayesian zero-failure reliability demonstration test method for products with exponential lifetime distribution is presented. Beta prior distribution for reliability of a product is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantees specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

Design of Bayesian Zero-Failure Reliability Demonstration Test for Products with Weibull Lifetime Distribution (와이불 수명분포를 갖는 제품에 대한 베이지안 신뢰성 입증시험 설계)

  • Kwon, Young Il
    • Journal of Applied Reliability
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    • v.14 no.4
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    • pp.220-224
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    • 2014
  • A Bayesian zero-failure reliability demonstration test method for products with Weibull lifetime distribution is presented. Inverted gamma prior distribution for the scale parameter of the Weibull distribution is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantee specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

A Statistical Design of Bayesian Two-Stage Reliability Demonstration Test for Product Qualification in Development Process (개발단계의 제품 인증을 위한 베이지언 2단계 신뢰성 실증시험의 통계적 설계)

  • Seo, Sun-Keun
    • Journal of Korean Institute of Industrial Engineers
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    • v.43 no.2
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    • pp.147-153
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    • 2017
  • In order to demonstrate a target reliability with a specified confidence level, a new two-stage Bayesian Reliability Demonstration Test (RDT) plans that is known to be more effective than a corresponding single-stage one is proposed and developed by Bayesian framework with beta prior distribution for Weibull life time distribution. A numerical example is provided to illustrate the proposed RDT plans and compared with other non-Bayesian and Bayesian plans. Comparative results show that the proposed Bayesian two-stage plans have some merits in terms of required and expected testing time and probability of acceptance.

Reliability Demonstration Test for a Finite Population Based on the Conjugacy of the Beta-Binomial Distribution (베타-이항분포의 공액성을 근거로 한 유한 모집단의 신뢰성 입증 시험)

  • Jeon, Jong-Seon;Ahn, Sun-Eung
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.35 no.2
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    • pp.98-105
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    • 2012
  • This paper describes the Bayesian approach for reliability demonstration test based on the samples from a finite population. The Bayesian approach involves the technical method about how to combine the prior distribution and the likelihood function to produce the posterior distribution. In this paper, the hypergeometric distribution is adopted as a likelihood function for a finite population. The conjugacy of the beta-binomial distribution and the hypergeometric distribution is shown and is used to make a decision about whether to accept or reject the finite population judging from a viewpoint of faulty goods. A numerical example is also given.

A Study of Economical Sample Size for Reliability Test of One-Shot Device with Bayesian Techniques (베이지안 기법을 적용한 일회성 장비의 경제적 시험 수량 연구)

  • Lee, Youn Ho;Lee, Kye Shin;Lee, Hak Jae;Kim, Sang Moon;Moon, Ki Sung
    • Journal of Applied Reliability
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    • v.14 no.3
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    • pp.162-168
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    • 2014
  • This paper discusses the application of Bayesian techniques with test data on similar products for performing the Economical Reliability Test of new one-shot device. Using the test data on similar products, reliability test required lower sample size currently being spent in order to demonstrate a target reliability with a specified confidence level. Furthermore, lower sample size reduces cost, time and various resources on reliability test. In this paper, we use similarity as calculating weight of similar products and analyze similarity between new and similar product for comparison of the essential function.