• Title/Summary/Keyword: BLSF

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Orbit Determination of Korea Regional Navigation Satellite System Using Inter-Satellite Links and Ground Observations

  • Choi, Jungmin;Oh, Hyungjik;Park, Chandeok;Park, Sang-Young
    • International Journal of Aeronautical and Space Sciences
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    • v.18 no.2
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    • pp.327-333
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    • 2017
  • This study presents the orbit determination (OD) of a candidate Korea Regional Navigation Satellite System (KRNSS) using both inter-satellite links (ISLs) and ground observations. The candidate constellation of KRNSS is first introduced. The OD algorithm based on both ISL and ground observation is developed, and consists of three main components: dynamic model for Korean navigation satellites, measurement model for ISLs and ground observations, and the batch least-square filter for estimating OD parameters. As numerical simulations are performed to analyze the OD performances, the present study focuses on investigating the effects of ISL measurements on the OD accuracy of KRNSS. Simulation results show that the use of ISLs can considerably enhance the OD accuracy to one meter (design preference) under certain distributions of ground stations.

A Test Algorithm for Word-Line and Bit-line Sensitive Faults in High-Density Memories (고집적 메모리에서 Word-Line과 Bit-Line에 민감한 고장을 위한 테스트 알고리즘)

  • 강동철;양명국;조상복
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.4
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    • pp.74-84
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    • 2003
  • Conventional test algorithms do not effectively detect faults by word-line and bit-line coupling noise resulting from the increase of the density of memories. In this paper, the possibility of faults caused by word-line coupling noise is shown, and new fault model, WLSFs(Word-Line Sensitive Fault) is proposed. We also introduce the algorithm considering both word-line and bit-line coupling noise simultaneously. The algorithm increases probability of faults which means improved fault coverage and more effective test algorithm, compared to conventional ones. The proposed algorithm can also cover conventional basic faults which are stuck-at faults, transition faults and coupling faults within a five-cell physical neighborhood.