• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.2
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• pp.126-136
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• 2003

We propose a new technique to improve the parametric fault coverage of oscillation test method (OTM). The OTM has been popular as a vectorless scheme for analog circuit test, both as a general defect-oriented technique, as well as an oscillation built-in self- test (BIST) scheme. However, it still requires improvement in several aspects. This paper analyzes the limitation of OTM, and proposes new signature analysis scheme to improve its performance.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.8 no.2
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• pp.449-455
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• 2004

This paper presents a novel defect detection method for one chip RF front end with fault detection circuits using input matching measurement. We present a BIST circuit using 40.25{\mu}m$ CMOS technology. We monitor the input transient voltage of the RF front end to differentiate faulty and fault-free RF front end. Catastrophic as well as parametric variation fault models are used to simulate the faulty response of the RF front end. This technique has several advantages with respect to the standard approach based on current test stimulus and frequency domain measurement. Because DUT and fault detection circuits are implemented in the same chip, this test technique only requires use of digital voltmeter (RMS meter) and RF voltage source generator for simpleand inexpensive testing.

• The Journal of the Acoustical Society of Korea
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• v.18 no.1
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• pp.67-71
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• 1999

In this paper, we design circuits embedded in memory chip which perform memory testing algorithms using BIST scheme to reduce testing time and cost for testing. In order to implement circuits for MSCAN, Marching and checkerboard test algorithms, which have widely used in memory testing, we survey structure of the BIST circuits and describe each block of BIST circuits by using VHDL. Thereafter, We verify behavior of each VHDL coding block and extract BIST circuits for target testing algorithms by CAD tool for simulation and synthesis. Extracted circuits have very low area overhead.

• The Magazine of the IEIE
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• v.19 no.5
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• pp.108-116
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• 1992

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.49 no.6
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• pp.322-329
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• 2000

BIST(Built-in Self Test) has been considered as the most promising DFT(design-for-test) scheme for the present and future test strategy. The most serious problem in applying BIST(Built-in Self Test) into a large circuit is the excessive increase in test time. This paper is focused on this problem. We proposed a new BIST construction scheme which uses a parallel divide-and-conquer method. The circuit division is performed with respect to some internal nodes called test points. The test points are selected by considering the nodal connectivity of the circuit rather than the testability of each node. The test patterns are generated by only one linear feedback shift register(LFSR) and they are shared by all the divided circuits. Thus, the test for each divided circuit is performed in parallel. Test responses are collected from the test point as well as the primary outputs. Even though the divide-and-conquer scheme is used and test patterns are generated in one LFSR, the proposed scheme does not lose its pseudo-exhaustive property. We proposed a selection procedure to find the test points and it was implemented with C/C++ language. Several example circuits were applied to this procedure and the results showed that test time was reduced upto 1/2151 but the increase in the hardware overhead or the delay increase was not much high. Because the proposed scheme showed a tendency that the increasing rates in hardware overhead and delay overhead were less than that in test time reduction as the size of circuit increases, it is expected to be used efficiently for large circuits as VLSI and ULSI.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.6
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• pp.43-48
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• 2008

Power consumption during test can be much higher than that during normal operation since test vectors are determined independently. In order to reduce the power consumption during test process, a new BIST(Built-In Self Test) architecture is proposed. In the proposed architecture, test vectors generated by an LFSR(Linear Feedback Shift Resister) are transformed into the new patterns with low transitions using Bit Generator and Bit Dropper. Experiments performed on ISCAS'89 benchmark circuits show that transition reduction during scan testing can be achieved by 62% without loss of fault coverage. Therefore the new architecture is a viable solution for reducing both peak and average power consumption.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.6
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• pp.70-76
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• 2015

This paper introduces an FPGA self-test architecture reusing FPGA boundary scan chain as self-test circuits. An FPGA boundary scan cell is two or three times bigger than a normal boundary scan cell because it is used for configuring the function of input/output pins functions as well as testing and debugging. Accordingly, we analyze the architecture of an FPGA boundary scan cell in detail and design a set of built-in self-test (BIST) circuits in which FPGA boundary scan chain and a small amount of FPGA logic elements. By reusing FPGA boundary scan chain for self-test, we can reduce area overhead and perform a processor based on-board FPGA testing/monitoring. Experimental results show the area overhead comparison and simulation results.

• Proceedings of the IEEK Conference
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• 2003.11b
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• pp.27-30
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• 2003

The recent technology developments introduce new difficulties into the test process by the increased complexity of the chip. Most widely used method for testing high complexity and embedded systems is built-in self-test(BIST). In this paper, we describe 5-stage pipeline system as circuit under testing(CUT) and proposed a BIST scheme for the hazard detection unit of the pipeline system. The proposed BIST scheme can generate sequential instruction sets by pseudo-random pattern generator that can detect all hazard issues and compare the expected hazard signals with those of the pipelined system. Although BIST schemes require additional area in the system, it proves to provide a low-cost test solution and significantly reduce the test time.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.713-715
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• 2012

본 논문은 24GHz 차량 추돌 예방 레이더 시스템-온-칩을 위한 입력 임피던스, 전압이득 및 잡음지수를 자동으로 측정할 수 있는 새로운 형태의 고주파 자체 내부검사(BIST, Built-In Self-Test) 회로를 제안한다. 이러한 BIST 회로는 TSMC $0.13{\mu}m$ 혼성신호/고주파 CMOS 공정 ($f_T/f_{MAX}$=140/120GHz)으로 설계되어 있다. 알고리즘은 LabVIEW로 구현되어 있다. BIST 알고리즘은 입력 임피던스 정합과 출력 직류 전압 측정원리를 이용한다. 본 논문에서 제안하는 방법은 자동으로 쉽게 고주파 회로의 성능변수를 측정할 수 있기 때문에 시스템-온-칩의 저가 성능 검사의 대안이 될 것으로 기대한다.

• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.935-938
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• 1999

메모리 테스트는 Built-In Self Test(BIST)와 같이 메모리에 내장된 회로를 통하여 자체 점검하는 방법과 테스터를 통하여 생성된 패턴을 주입하는 방법이 있다. 테스트 패턴 생성방법으로는 각각의 고장모델에 대한 테스트 패턴을 deterministic하게 생성해주는 방법과 Pseudo Random Pattern Generator(PRPG)를 이용하여 생성하는 경우로 구분할 수 있다. 본 연구에서는 PRPG를 패턴 생성기로 사용하여 여러 가지 메모리의 결함을 대표한다고 볼 수 있는 Static 및 Dynamic Neighborhood Pattern Sensitive Fault(NPSF) 등 다양한 종류의 고장을 점검할 수 있도록 메모리 BIST를 구성하였다. 기존의 Linear Feedback Shift Register(LFSR)보다 본 연구에서 제안하는 Linear Hybrid Cellular Automata(LHCA)를 이용한 PRPG가 높고 안정된 고장 점검도를 나타내었다.