A Study on $E_1$ Transition in Si-Doped $Al_{0.32}Ga_{0.68}As$ by Electroreflectance Measurement
(Electroreflectance 측정에 의한 Si이 첨가된 $Al_{0.32}Ga_{0.68}As$ 에서의 $E_1$ 전이에 대한 연구)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.11 no.9
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- pp.687-692
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- 1998