• Journal of the Korea Institute of Information and Communication Engineering
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• v.18 no.10
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• pp.2503-2508
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• 2014

This study is about the selection and noise test of electronic sensor which is preceded by electric Operating Cell(EOC) development using electronic sensor technology to solve the structural weakness of Mechanism Operated Cell(MOC) in VCB, and has a final target in product development minimizing contact malfunction of the chattering or rebounce states caused by existing MOC. In this test results, when opening and closing VCB, rising velocity of surge voltage in opening time was measured 4.2 times faster than closing time and noise decibel value was measured respectively 120dB and 110dB. When supplying 60kV power frequency overvoltage, we found that sensor output graph in VCB opening and closing times operated stably without distortion. When supplying 150kV $1.2{\times}50{\mu}s$ impulse frequency voltage, we found that voltage graph of output contact in sensor opening and closing sides maintained a normal condition without distortion, and when supplying 2500A current, we found that tested result of electric field noise operated stably without distortion.