• Title/Summary/Keyword: Atomic vapor

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Study of multi-stacked InAs quantum dot infrared photodetector grown by metal organic chemical vapor deposition

  • Kim, Jeong-Seop;Ha, Seung-Gyu;Yang, Chang-Jae;Lee, Jae-Yeol;Park, Se-Hun;Choe, Won-Jun;Yun, Ui-Jun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.129-129
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    • 2010
  • 적외선 검출소자(Infrared Photodetector)는 근적외선에서 원적외선 영역에 이르는 광범위한 파장 범위의 적외선을 이용하는 기기로서 대상물이 방사하는 적외선 영역의 에너지를 흡수하여 이를 영상화할 수 있는 장비이다. 적외선 관련 기술은 2차 세계대전 기간에 태동하였으며, 현재에는 원거리 감지기술 등과 접목되면서 그 활용 분야가 다양해지고 있다. 특히 능동형 정밀 타격무기를 비롯한 감시 정찰 장비 및 지능형 전투 장비 시스템 등에 대한 요구를 바탕으로 보다 정밀하고 신속한 표적 감지 및 정보처리 기술에 관한 연구가 선진국을 통해서 활발히 진행되고 있다. 기존의 Bolometer 형식의 열 감지 소자는 반응 속도가 느리고 측정 감도가 낮은 단점이 있으며, MCT(HgCdTe)를 이용한 적외선 검출기의 경우 높은 기계적 결함과 77K 저온에서 동작해야하기 때문에 발생하는 추가 비용 등이 문제점으로 지적되고 있다[1]. 이에 반해 화합물 반도체 자기조립 양자점(self-assembled quantum dot)을 이용한 적외선 수광소자는 양자점이 가지는 불연속적인 내부 에너지 준위로 인하여, 높은 내부 양자 효율과 온도 안정성을 기대할 수 있으며, 고성능, 고속처리, 저소비전력 및 저소음의 실현이 가능하다. 본 연구에서는 적층 InAs/InGaAs dot-in-a-well 구조를 유기금속화학기상증착법을 이용하여 성장하고 이를 소자에 응용하였다. 균일한 적층 양자점의 성장을 위해서 원자현미경(atomic force microscopy)을 이용하여, 각 층의 양자점의 크기와 밀도를 관찰하였고, photoluminescence (PL)를 이용하여 발광특성을 연구하였다. 각 층간의 GaAs space layer의 두께와 온도 조절 과정을 조절함으로써 균일한 적층 양자점 구조를 얻을 수 있었다. 이를 이용하여 양자점의 전도대 내부의 에너지 준위간 천이(intersubband transition)를 이용하는 n-type GaAs/intrinsic InAs 양자점/n-type GaAs 구조의 양자점 적외선수광소자 구조를 성장하였다. 이 과정에서 상부 n-type GaAs의 성장 온도가 600도 이상이 되는 경우 발광효율이 급격히 감소하고, 암전류가 크게 증가하는 것을 관찰하였다. 이는 InAs 양자점과 주변 GaAs 간의 열에 의한 상호 확산에 의하여 양자점의 전자 구속 효과를 저해하는 것으로 설명된다.

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New Evaluation of Initial Growth Mechanisms of Hydroxyapatite on Self-assembled Collagen Nanofibrils by Using ToF-SIMS and AFM Techniques

  • Park, Young-Jae;Choi, Gyu-Jin;Lee, Tae-Geol;Lee, Won-Jong;Moon, Dae-Won
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.397-397
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    • 2010
  • Bone is considered as hierarchically organized biocomposites of organic (collagen) and inorganic (hydroxyapatite) materials. The precise structural dependence between hydroxyapatite (HAp, $Ca_{10}(PO_4)_6(OH)_2)$ crystals and collagen fibril is critical to unique characteristics of bone. To meet those conditions and obtain optimal properties, it is essential to understand and control the initial growth mechanisms of hydroxyapatite at the molecular level, such as other nano-structured materials. In this study, collagen fibrils were prepared by adsorbing native type I collagen molecules onto hydrophobic surface. Hydrophobicity was introduced on the Si wafer surface by using PECVD (plasma enhanced chemical vapor deposition) method and cyclohexane as a precursor. Biomimetic nucleation and growth of HAp on the self-assembled collagen nanofibrils were occurred through incubation of the sample in SBF (simulated body fluid). Chemical and morphological evolution of HAp nanocrystals was investigated by surface-sensitive analytical techniques such as ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) and AFM (Atomic Force Microscopy) in the early growth stages (< 24 hrs). The very initial stages (< 12 hrs) of mineralization could be clearly demonstrated by ToF-SIMS chemical mapping of surface. In addition to ToF-SIMS and AFM measurement, scanning electron microscopy, energy dispersive spectroscopy and X-ray diffraction analysis were conducted to characterize the HAp layer in the late stages. This study is of great importance in the growth of real bone-like materials with a structure analogous to that of natural bones and the development of biomimetic nanomaterials.

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전기화학적증착법(ECD)을 사용해 형성한 성장 시간에 따른 Al-doped ZnO 나노결정체의 구조적 성질 및 광학적 성질

  • Chu, Dong-Hun;Kim, Gi-Hyeon;No, Yeong-Su;Lee, Dae-Uk;Kim, Tae-Hwan
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.262.2-262.2
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    • 2013
  • ZnO는 광학적 및 전기적 성질의 여러 가지 장점 때문에 메모리, 나노발전기, 트랜지스터, 태양전지, 광탐지기 및 레이저와 같은 전자소자 및 광소자로 여러 분야에서 다양하게 사용되고 있다. Al이 도핑된 ZnO 나노결정체를 전기화학적 증착법을 이용하여 형성하고, 형성시간의 변화에 따른 구조적 및 광학적 성질을 관찰했다. ITO로 코팅된 유리 기판에 전기화학증착법을 이용해 Al 도핑된 ZnO를 성장시켰다. Sputtering, pulsed laser vapor deposition, 화학기상증착, atomic layer epitaxy, 전자빔증발법 등으로 Al 도핑된 ZnO 나노구조를 형성할 수 있지만, 본 연구에서는 간단한 공정과정, 저온증착, 고속, 저가의 특성 등으로 경제적인 면에서 효율적인 전기화학증착법을 이용했다. 반복실험을 통하여 Al의 도핑 농도는 Zn와 Al의 비율이 98:2이 되도록, ITO 양극과 Pt 음극의 전위차가 -2.25 V가 되도록 실험조건을 고정했고, 성장시간을 각각 1분, 5분, 10분으로 변화하였다. 주사전자현미경 사진을 보면 Al 도핑된 ZnO는 성장 시간이 증가함에 따라 나노구조의 직경이 커지는 것을 알 수 있다. 광루미네센스 측정 결과는 산소 공핍의 증가로 보이는 500~600 nm대의 파장에서 나타난 피크의 위치가 에너지가 큰 쪽으로 증가했다. 위 결과로부터 성장 시간에 따른 Al 도핑된 ZnO의 구조적 및 광학적 특성변화를 관찰했고, 이 연구 결과는 Al 도핑된 ZnO 나노구조 기반 전자소자 및 광소자에 응용 가능성을 보여주고 있다.

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성장 온도에 따른 InP/GaP SPS 구조의 광학적 특성

  • Byeon, Hye-Ryeong;Ryu, Mi-Lee;Song, Jin-Dong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.229.1-229.1
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    • 2013
  • 초격자는 동종의 III-V 삼원 합금층을 성장하는 동안 스피노달 분해(spinodal decomposition)로 인한 원자배열(atomic ordering)과 상분리phase separation)에 의해서 발생하는데 MBE (molecular beam epitaxy)과 MOVPE (metalorganic vapor phase epitaxy)를 이용하여 성장시킬 때 주로 발생한다. 본 논문에서는 성장온도에 따른 InP/GaP SPS (short-period superlattices) 구조의 광학적 특성 변화를 시료의 온도와 여기광의 세기를 이용하여 분석하였다. 시료는 MBE 장비를 이용하여 성장하였으며, SPS층은 659쌍의 GaP(2.9 ${\AA}$)과 InP(3.1 ${\AA}$)로 이루어져 있고, GaP 층을 처음에 증착한 뒤, InP 층을 증착 하였다. 성장시 온도를 $400^{\circ}C$, $425^{\circ}C$, $460^{\circ}C$ 그리고 $490^{\circ}C$로 변화를 주어 성장하였다. 이들 시료를 GT400, GT425, GT460 그리고 GT490이라 하였고 이에 대한 광학적 특성을 PL (photoluminescence)를 이용하여 분석하였다. 10 K에서 PL 피크는 GT400 시료는 634 nm, GT425 시료는 636 nm, GT460 시료는 680nm, 그리고 GT490 시료는 692 nm에서 나타났으며, GT425 시료의 PL 세기가 가장 강하게 나타나고 GT400 시료의 PL 세기가 가장 약하게 나타났다. 그러나 260 K에서 PL 세기는 GT460 시료가 가장 강하게 나타나고 GT425 시료가 가장 약하게 나타났다. 성장온도가 증가함에 따라 밴드갭이 감소하는 것은 특정 성장온도($460^{\circ}C$) 이상에서 LCM (lateral composition modulation)이 형성되는 것으로 설명할 수 있다. GT400 시료와 GT425 시료의 PL 피크가 1.94 eV와 1.95 eV로 비슷하고, GT460 시료와 GT490 시료의 PL 피크가 1.82 eV과 1.79 eV로 비슷하게 나타난 것은 $460^{\circ}C$이상에서 성장한 시료에서 LCM 구조 형성으로 설명할 수 있다.

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Characteristics of Thick GaN on Si using AlN and LT-GaN Buffer Layer (AlN과 저온 GaN 완충층을 이용한 Si 기판상의 후막 GaN 성장에 관한 연구)

  • Baek, Ho-Seon;Lee, Jeong-Uk;Kim, Ha-Jin;Yu, Ji-Beom
    • Korean Journal of Materials Research
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    • v.9 no.6
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    • pp.599-603
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    • 1999
  • We have investigated the growth characteristics of thick GaN on Sim substrate with AlN and low temperature GaN buffer layer. The vertical hydride vapor phase epitaxy system with $GaCl_3$ precursor was used for growth of GaN. AlN and GaN buffer layer were deposited on Si substrate to reduce the lattice mismatch and the thermal expansion coefficient mismatch between si and GaN. Optimization of deposition condition for AlN and low temperature GaN buffer layers were carried out. We studied the effects of growth temperature, V/III ratio on the properties of thick GaN. Surface morphology, growth rate and crystallinity of thick GaN were measured using Atomic Force Microscopy (AFM), $\alpha-step$-, Scanning Electron Microscopy (SEM) and X-Ray Diffractometer(XRD).

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Silicon Nitride Layer Deposited at Low Temperature for Multicrystalline Solar Cell Application

  • Karunagaran, B.;Yoo, J.S.;Kim, D.Y.;Kim, Kyung-Hae;Dhungel, S.K.;Mangalaraj, D.;Yi, Jun-Sin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.11a
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    • pp.276-279
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    • 2004
  • Plasma enhanced chemical vapor deposition (PECVD) of silicon nitride (SiN) is a proven technique for obtaining layers that meet the needs of surface passivation and anti-reflection coating. In addition, the deposition process appears to provoke bulk passivation as well due to diffusion of atomic hydrogen. This bulk passivation is an important advantage of PECVD deposition when compared to the conventional CVD techniques. A further advantage of PECVD is that the process takes place at a relatively low temperature of 300t, keeping the total thermal budget of the cell processing to a minimum. In this work SiN deposition was performed using a horizontal PECVD reactor system consisting of a long horizontal quartz tube that was radiantly heated. Special and long rectangular graphite plates served as both the electrodes to establish the plasma and holders of the wafers. The electrode configuration was designed to provide a uniform plasma environment for each wafer and to ensure the film uniformity. These horizontally oriented graphite electrodes were stacked parallel to one another, side by side, with alternating plates serving as power and ground electrodes for the RF power supply. The plasma was formed in the space between each pair of plates. Also this paper deals with the fabrication of multicrystalline silicon solar cells with PECVD SiN layers combined with high-throughput screen printing and RTP firing. Using this sequence we were able to obtain solar cells with an efficiency of 14% for polished multi crystalline Si wafers of size 125 m square.

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Optical Properties of Silicon Oxide (SiOx, x<2) Thin Films Deposited by PECVD Technique (PECVD 방법으로 증착한 SiOx(x<2) 박막의 광학적 특성 규명)

  • Kim, Youngill;Park, Byoung Youl;Kim, Eunkyeom;Han, Munsup;Sok, Junghyun;Park, Kyoungwan
    • Korean Journal of Metals and Materials
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    • v.49 no.9
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    • pp.732-738
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    • 2011
  • Silicon oxide thin films were deposited by using a plasma-enhanced chemical-vapor deposition technique to investigate the light emission properties. The photoluminescence characteristics were divided into two categories along the relative ratio of the flow rates of $SiH_4$ and $N_2O$ source gases, which show light emission in the broad/visible range and a light emission peak at 380 nm. We attribute the broad/visible light emission and the light emission peak to the quantum confinement effect of nanocrystalline silicon and the Si=O defects, respectively. Changes in the photoluminescence spectra were observed after the post-annealing processes. The photoluminescence spectra of the broad light emission in the visible range shifted to the long wavelength and were saturated above an annealing temperature of $900^{\circ}C$ or after 1 hour annealing at $970^{\circ}C$. However, the position of the light emission peak at 380 nm did not change at all after the post-annealing processes. The light emission intensities at 380 nm initially increased, and decreased at annealing temperatures above $700^{\circ}C$ or after 1 hour annealing at $700^{\circ}C$. The photoluminescence behaviors after the annealing processes can be explained bythe size change of the nanocrystalline silicon and the density change of Si=O defect in the films, respectively. These results support the possibility of using a silicon-based light source for Si-optoelectronic integrated circuits and/or display devices.

N2 plasma treatment of pigments with minute particle sizes to improve their dispersion properties in deionized water

  • Zhang, Jingjing;Park, Yeong Min;Tan, Xing Yan;Bae, Mun Ki;Kim, Dong Jun;Jang, Tae Hwan;Kim, Min Su;Lee, Seung Whan;Kim, Tae Gyu
    • Journal of Ceramic Processing Research
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    • v.20 no.6
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    • pp.589-596
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    • 2019
  • Pigments with minute particle sizes, such as carbon black (CB) and pigment red 48:2 (P.R.48:2), are the most important types of pigment and have been widely used in many industrial applications. However, minute particles have large surface areas, high oil absorption and low surface energy. They therefore tend to be repellent to the vehicle and lose stability, resulting in significant increases in viscosity or reaggregation in the vehicle. Therefore, finding the best way to improve the dispersion properties of minute particle size pigments presents a major technical challenge. In this study, minute particle types of CB and P.R.48:2 were treated with nitrogen gas plasma generated via radio frequency-plasma enhanced chemical vapor deposition (RF-PECVD) to increase the dispersion properties of minute particles in deionized (DI) water. The morphologies and particle sizes of untreated and plasma treated particles were evaluated using scanning electron microscopy (SEM) and atomic force microscopy (AFM). The average distributions of particle size were measured using a laser particle sizer. Fourier transform infrared spectroscopy was carried out on the samples to identify changes in molecular interactions during plasma processing. The results of our analysis indicate that N2 plasma treatment is an effective method for improving the dispersibility of minute particles of pigment in DI water.

Study on the Performance Improvement of ZnO-based NO2 Gas Sensor through MgZnO and MgO (ZnO 기반 NO2 가스센서의 MgZnO와 MgO을 통한 성능 향상에 대한 연구)

  • So-Young, Bak;Se-Hyeong, Lee;Chan-Yeong, Park;Dongki, Baek;Moonsuk, Yi
    • Journal of Sensor Science and Technology
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    • v.31 no.6
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    • pp.455-460
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    • 2022
  • Brush-like ZnO hierarchical nanostructures decorated with MgxZn1-xO (x = 0.1, 0.2, 0.3, 0.4, and 0.5) were fabricated and examined for application to a gas sensor. They were synthesized using vapor phase growth (VPG) on indium tin oxide (ITO) substrates. To generate electronic accumulation at ZnO surface, MgZnO nanoparticles were prepared by sol-gel method, and the ratio of Mg and Zn was adjusted to optimize the device for NO2 gas detection. As the electrons in the accumulation layer generated by the heterojunction reacted faster and more frequently with the gas, the sensitivity and speed improved. When tested as sensing materials for gas sensors at 100 ppm NO2 at 300℃, these MgZnO decorated ZnO nanostructures exhibited an improvement from 165 to 514 times compared to pristine ZnO. The response and recovery time of the MgZnO decorated ZnO samples were shorter than those of the pristine ZnO. Various analyzing techniques, including field-emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectroscopy (EDS), and X-ray powder diffraction (XRD) were employed to confirm the growth morphology, atomic composition, and crystalline information of the samples, respectively.

Machining Characteristics of SiC reinforced Composite by multiple diamond-coated drills (다이아몬드 피복공구에 의한 SiC 강화 복합재료의 절삭특성)

  • M. Chen;Lee, Y. M.;S. H. Yang;S. I. Jang
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2003.06a
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    • pp.533-537
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    • 2003
  • Compared to sintered polycrystalline diamond (PCD), the deposited thin film diamond has a great advantage on the fabrication of cutting tools with complex geometries such as drills. Because of high performance in high speed machining non-ferrous difficult-to-cut materials in the field of automobiles industry, aeronautics and astronautics industry, diamond-coated drills find large potentialities in commercial applications. However, the poor adhesion of the diamond film on the substrate and high surface roughness of the drill flute adversely affect the tool lift and machining quality and they become the main technical barriers for the successful development and commercialization of diamond-coated drills. In this paper, diamond thin films were deposited on the commercial WC-Co based drills by the electron aided hot filament chemical vapor deposition (EACVD). A new multiple coating technology based on changing gas pressure in different process stages was developed. The large triangular faceted diamond grains may have great contribution to the adhesive strength between the film and the substrate, and the overlapping ball like blocks consisted of nanometer sized diamond crystals may contribute much to the very low roughness of diamond film. Adhesive strength and quality of diamond film were evaluated by scanning electron microscope (SEM), atomic force microscope (AFM), Raman spectrum and drilling experiments. The ring-block tribological experiments were also conducted and the results revealed that the friction coefficient increased with the surface roughness of the diamond film. From a practical viewpoint, the cutting performances of diamond-coated drills were studied by drilling the SiC particles reinforced aluminum-matrix composite. The good adhesive strength and low surface roughness of flute were proved to be beneficial to the good chip evacuation and the decrease of thrust and consequently led to a prolonged tool lift and an improved machining quality. The wear mechanism of diamond-coated drills is the abrasive mechanical attrition.

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