• Title/Summary/Keyword: Atmospheric microwave plasma

Search Result 25, Processing Time 0.023 seconds

Plasma Upflows and Microwave Emission in Hot Supra-arcade Structure associated with M1.6 Limb Flare

  • Kim, Sujin;Shibasaki, Kiyoto;Bain, Hazel M.;Cho, Kyung-Suk
    • The Bulletin of The Korean Astronomical Society
    • /
    • v.39 no.1
    • /
    • pp.74.1-74.1
    • /
    • 2014
  • We have investigated a supra-arcade structure associated with an M1.6 flare, which occurred on the south-east limb in the 4th of November 2010. It is ob- served in extreme ultraviolet (EUV) with the Atmospheric Imaging Assembly (AIA) onboard the Solar Dynamics Observatory (SDO), microwaves at 17 and 34 GHz with the Nobeyama Radioheliograph (NoRH), and soft X-rays of 8-20 keV with the Reuven Ramaty High Energy Solar Spectroscopic Imager (RHESSI). Interestingly, we found exceptional properties of the supra-arcade thermal plasma from the AIA 131 A and the NoRH: 1) plasma upflows along large coronal loops and 2) enhancing microwave emission. RHESSI detected two soft X-ray sources, a broad one in the middle of supra-arcade structure and a bright one just above the flare-arcade. We estimated the number density and thermal energy for these two source regions during the decay phase of the flare. In the supra-arcade source, we found that there were increases of the thermal energy and the density at the early and the last stages, respectively. On the contrary, the density and thermal energy of the source on the top of the flare-arcade decreases throughout. The observed upflows imply that there is continuous energy supply into the supra- arcade structure from below during the decay phase of the flare. It is hard to be explained by the standard flare model in which the energy release site is located high in corona. Thus, we suggest that the potential candidate as the energy source for the hot supra-arcade structure is the flare-arcade which has exhibited a predominant emission throughout.

  • PDF

Characteristics of Low Dielectric Constant SiOF Thin Films with Post Plasma Treatment Time (플라즈마 후처리 시간에 따른 저유전율 SiOF 박막의 특성)

  • 이석형;박종완
    • Journal of the Korean Vacuum Society
    • /
    • v.7 no.3
    • /
    • pp.167-272
    • /
    • 1998
  • The fluorine doped silicon oxide (SiOF) intermetal dielectric (IMD) films havc been of interest due to their lower dielectric constant and compatibility with existing process tools. However, instability issues related to hond and increasing dielectric constant due to water absorption when the SiOF film was exposured to atmospheric ambient. Therefore, the purpose nf this research is to study the effect of post oxygen plasma treatment on the resistance of nioisture absorption and reliability of SiOF film. Improvement of moisture ahsorption resistance of SiOF film is due to the forming of thin $SiO_2$ layer at the SiOF film surface. It is thought that the main effect of the improvement of moisture absorption resistance was densification of the top layer and reduction in the numher of Si-F honds that tend to associate with OH honds. However, the dielectric constant was inucased when plasma treatment time is above 5 min. In this study, therefore, it is thought that the proper plasma treatment time is 3 min when plasma treatment condition is 700 W of microwave power, 3 mTorr of process pressure and $300^{\circ}C$ of substrate temperature.

  • PDF

Characteristics of Low Dielectric Constant SiOF Thin Films with Post Plasma Treatment Time (플라즈마 후처리 시간에 따른 저유전율 SiOF 박막의 특성)

  • Lee, Seok Hyeong;Park, Jong Wan
    • Journal of the Korean Vacuum Society
    • /
    • v.7 no.3
    • /
    • pp.267-267
    • /
    • 1998
  • The fluorine doped silicon oxide (SiOF) intermetal dielectric (IMD) films have been of interest due to their lower dielectric constant and compatibility with existing process tools. However instability issues related to bond and increasing dielectric constant to water absorption when the SiOF films was exposured to atmospheric ambient. Therefore, the purpose of this research is to study the effect of post oxygen plasma treatment on the resistance of moisture absorption and reliability of SiOF film. Improvement of moisture absorption resistance of SiOF film is due to the forming of thin SiO₂layer at the SiOF film surface. It is thought that the main effect of the improvement of moisture absorption resistance was densification of the top layer and reduction in the number of Si-F bonds that tend to associate with OH bonds. However, the dielectric constant was increased when plasma treatment time is above 5 min. In this study, therefore, it is thought that the proper plasma treatment time is 3 min when plasma treatment condition is 700 W of microwave power, 3 mTorr of process pressure and 300℃ of substrate temperature.

Determination of Metallic Elements in Urban Particulate Matter (SRM 1648) by ICP-MS and AAS (ICP-MS와 AAS를 이용한 대기 입자상 표준물질 (SRM 1648) 금속성분의 정량에 관한 연구)

  • Yoo Su-Young;Choi Kum-Chan;Kim Ki-Hyun
    • Journal of Korean Society for Atmospheric Environment
    • /
    • v.21 no.4
    • /
    • pp.423-430
    • /
    • 2005
  • This study was investigated with sample digestion techniques and a reliability of the analytical results for a quantitative analysis of a standard reference material ('urban particulate matter', SRM 1648). The metallic elements were analyzed by inductively coupled plasma mass spectrometry (ICP-MS) with closed vessel microwave acid digestion method and atomic absorption spectroscopy (AAS). Quality control of the overall analytical procedures for metallic element determinations of standard reference material were estimated by analysis of a SRM 1648. Three digestion solutions $(type\;1:\;HNO_3,\;type\;2:\;HNO_3\;and\;H2O_2(4'1)\;mixture,\;type\;3:5.55\%\; HNO_3\;and\;16.75\%\;HCI\;mixture)$ were applied to SRM 1648. As a result, three digestion solutions used in this study are completely unable to digest Cr of SRM 1648. Reliability of Cr and As showed some errors in the digestion with digestion solution type (3) due to the influence of chlorides. Type (3) digestion solutions are sufficient to fulfill the digestion of As as well as Se in SRM 1648. ICP-MS results showed the improvement in accurate and precise determination of some trace elements like Cd, V and Pb in SRM 1648. It is important to use the proper digestion solution for each element to qualify analytical precision.

Radio and Hard X-ray Study of the 2011 August 09 Flare

  • Hwangbo, Jung-Eun;Bong, Su-Chan;Lee, Jeongwoo;Lee, Dae-Young;Park, Seong-Hong;Park, Young-Deuk
    • The Bulletin of The Korean Astronomical Society
    • /
    • v.38 no.1
    • /
    • pp.65.1-65.1
    • /
    • 2013
  • The 2011 August 09 Flare is one of the largest X-ray flares of Sunspot Cycle 24 to attract a lot of attention for its various activities detected in coronal images. In this study we concern ourselves mostly on information of high energy electrons produced during this flare provided by hard X ray data from the Reuven Ramaty High-Energy Solar Spectroscopic Imager (RHESSI) and radio data from the Korean Solar Radio Burst Locator (KSRBL) and Ondrejov. EUV images obtained by the Atmospheric Imaging Assembly (AIA) on board the Solar Dynamic Observatory are used to provide the context of magnetic reconnection. In our results, (1) HXR spectra have a rich spectral morphology. Initially it could be fit by one thermal component (T~30MK) and one single power law nonthermal spectrum, but later a better fit could be made by introducing an additional thermal component (T~55 MK). (2) Time delays between the KSRBL burst and the RHESSI hard X-ray emission were found which are more obvious at low frequencies and insignificant at high frequencies. (3) The HXR source lies in the core of the quadrupolar active region. In our interpretation based on AIA 94 A images, the outer part of the active region erupted to be blown out, leaving the intense hard X-ray emission concentrated in the core. We relate the appearance of the second thermal component to the evolution of the AIA 171 and 94 A images. The time delays of microwave peaks to HXR peaks are interpreted as indicating presence of trapped electrons in larger closed magnetic loops. With these result we conclude that the hard X ray and microwaves are due to impulsive acceleration in the low and high heights and a sigmoidal reconnection scenario.

  • PDF