• Proceedings of the KIEE Conference
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• 2003.11c
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• pp.414-416
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• 2003

As environmental conditions for memory products are increasingly high speed/high density, adopting diverse system configuration, it's more and more difficult for current component tester to adopt the actual condition of field application. If system test screening is realized in component level, test coverage failure can be made more secured in the initial stage, evaluation cost can be reduced and the effectiveness of investment for the facility can be maximized. Based on the above background, component automatic system tester was developed and showed off satisfactory results per each memory device family. In this paper, component quality stabilization strategy and cost saving for tester investment through future Quality monitoring and application to mass production will be presented.

• Journal of the Institute of Electronics Engineers of Korea CI
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• v.47 no.5
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• pp.41-49
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• 2010

Being popularized the use of portable entertainment/information devices, the demand on flash memory has been also increased radically. In general, flash memory reveals various error patterns by the devices it is mounted, and thus the memory makers are trying to minimize error ratio in the final process through not only the electric test but also the data integrity test under the same condition as real application devices. This process is called an application-level memory test. Though currently various flash memory testing devices have been used in the production lines, most of the works related to memory test depend on the sensual abilities of human testers. In case of testing the flash memory for MP3 devices, the human testers are checking if the memory has some errors by hearing the audio played on the memory testing device. The memory testing process like this has become a bottleneck in the flash memory production line. In this paper, we propose an audio comparison technique to support the efficient flash memory test for MP3 devices. The technique proposed in this paper compares the variance change rate between the source binary file and the decoded analog signal and checks automatically if the memory errors are occurred or not.