• 정보저장시스템학회논문집
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• 제3권3호
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• pp.118-122
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• 2007

Phase-change wet-etching technology using GeSbTe phase-change films is developed. Selective etching between an amorphous and a crystalline phase can be carried out with an alkaline etchant of NaOH. Etching selectivity is dependent not only on the concentration of the alkaline etchant but also on the film structure. Specifically, metal films for heat control cause marked effects on the etching properties of GeSbTe film. Surviving amorphous pits can be obtained with Al metal layer, however etched amorphous pits are seen with Ag metal layer. An opposite selective etching behavior can be observed between samples with two different metal layers.

• Journal of Magnetics
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• 제3권3호
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• pp.78-81
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• 1998

Large magneto crystalline anisotropy energy and demagnetization energy of rare earth-transition metal (RF-TM) alloys play roles of bottlenecks towards their commercial applications for giant magnetostrictive and blue wavelength magneto optical recording materials, respectively. To solve the above problems, boron is added into amorphous RE-TM alloys to produce its electron transferring. The boron added amorphous RE-TM alloys show novel magnetic and magneto-optical properties as follows; 1) an amorphous $(Sm_{33}Fe_{76})$97B3 alloy obtains the magnetostriction of$ -550{times}10^{-6}$ at 400 Oe compared with saturation magnetostriction of$ -60{\times}10^{-6}$ in conventional Ni based alloys, 2) an amorphous$ (Nd_{33}Fe_{67})_{95}B_5$ alloy increases effective magnetic anisotropy to$ -0.5{\times}10^{-6} ergs/cm^3 from -3.5{\times}10^6 ergs/cm^3$ without boron, which correspond to the polar Kerr rotation angles of 0.52$^{\circ}$and 0.33$^{\circ}$, respectively. These results attribute to selective 2p-3d electron orbits exchange coupling (SEC).

• 한국진공학회:학술대회논문집
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• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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• pp.368.1-368.1
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• 2014

We proposed amorphous GeSe-based ReRAM device of metal-insulator-metal (M-I-M) structure. The operation characteristics of memory device occured unipolar switching characteristics. By introducing the concepts of valance-alternation-pairs (VAPs) and chalcogen vacancies, the unipolar resistive switching operation had been explained. In addition, the current transport behavior were analyzed with space charge effect of VAPs, Schottky emission in metal/GeSe interface and P-F emission by GeSe bulk trap in mind. The GeSe ReRAM device of M-I-M structure indicated the stable memory switching characteristics. Furthermore, excellent stability, endurance and retention characteristics were also verified.

• 전기의세계
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• 제29권2호
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• pp.111-117
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• 1980

Contacts formed by vacuum evaporation of As-Te-Si-Ge chalcogenide glass onto Al metal (99.9999%) are studied by measuring paralle capacitance C(V), Cp(w), resistance R(V), Rp(w), and I-V characteristics. The fact that contact metal alloying produced high-resistance region is confirmed from the measurements of parallel capacitance and resistance. From the I-V characteristics in the pre-switcing region, it is found that electronic conduction and sitching occurs in the vicinity of metal-amorphous semiconductor interface. From the experimental obsevations, it is concuded that the current flow in the thin film is space-charge limited current (SCLC) due to the tunneling of electrons through the energy barriers.

• 한국결정성장학회지
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• 제11권4호
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• pp.160-165
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• 2001

The effects of various metals on Field Aided Lateral Crystallization (FALC) behaviors of amorphous silicon (a-Si) were investigated. Under an influence of electric field, metals such s Cu, Ni and Co were found to fasten the lateral crystallization toward a metal-free region, exhibiting a typical FALC behavior while the lateral crystallization of a-Si was not obvious for Pd. However, Au, Al and Cr did not induce the lateral crystallization of a-Si in metal-free region. Such phenomenological differences in various metals were studied in terms of dominant diffusing species (DDS) in the reaction between metal and Si. It was judged that the applied electric field enhanced the crystallization velocity by accelerating the diffusion of metal atoms since the occurrence of lateral crystallization would be strongly dependent on the diffusion of metal atoms than that of Si atoms. Therefore, it was concluded that he only metal-dominant diffusing species in the reaction between metal and Si results in the crystallization of a-Si in metal-free region.

• 한국산학기술학회논문지
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• 제7권2호
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• pp.113-119
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• 2006

중수로형 핵연료 제조공정 중 연료봉 피복관에 간격체와 지지체 등의 부착물이 브레이징으로 접합된다. 본 연구에서는 베릴륨을 물리 증착법(PVD)으로 접합될 부착물의 표면에 증착한 것과 비정질 용가재[$Zr_{1-x}Be_{x}(0.3{\le}x{\le}0.5)$]를 사용하여 브레이징된 접합부의 미세조직과 경도 등의 특성을 비교하고 브레이징 온도가 접합부에 미치는 영향 조사하였다. 비정질 용가재에 의한 접합층의 두께는 PVD-Be의 경우와 비교하여 더 얇았고, Be 함량이 감소할수록 접합층의 두께는 감소하였으며 모재의 침식은 거의 없었다. PVD-Be의 경우 공정 반응, 액상 출현, 모세관 현상과 확산으로 브레이징 되나 비정질 합금은 용가재 만이 용융되어 액상 접합되는 것으로 사료된다. PVD-Be 접합부의 미세조직은 계면에서 수지상이 형성되어 내부로 성장하나, 비정질 합금에 의한 접합부는 석출된 제2상들이 구상으로 구성되며 브레이징 온도가 증가할수록 구상은 더욱 커졌다. 비정질 합금 접합부의 경도는 Be 함량이 감소할수록 경도는 증가하였다. 본 연구에 사용된 비정질 합금 중 $Zr_{0.7}Be_{0.3}$ 합금은 접합부에서 Be의 모재로의 확산이 적어 부드러운 계면과 모재의 침식이 없었고 높은 경도 때문에 핵연료 피복재 접합에 가장 적합한 용가재로 사료된다.

• 한국재료학회지
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• 제12권2호
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• pp.140-145
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• 2002

This study was conducted to investigate the brazing characteristics between Zircaloy-4 nuclear fuel cladding tubes and bearing pads with filler metals of amorphous $Zr_{1-x}Be_x$(0.3$\leq$x$\leq$0.5) binary alloy, in which they were produced in the ribbon form by the melt-spinning metod. The crystallization behavior, stability, hardness and micro-structure of brazed zone were examined by X-ray diffraction, differential scanning calorimetry, micro-Vickers hardness test, optical microscopy, and transmission electron microscopy. $Zr_{1-x}Be_x$(0.3$\leq$x$\leq$0.4) amorphous alloys were crystallized to $\alpha$-Zr with increasing the temperature, and the rest were transformed to ZrBe$_2$at higher temperatures. On the other hand, $Zr_{1-x}Be_x$(0.4$\leq$x$\leq$0.5) amorphous alloys were crystallized to $\alpha$-Zr and ZrBe$_2$, simultaneously. The thickness of the layer brazed with amorphous alloy was increased with increasing the beryllium content due to the higher diffusion of Be. The morphology of brazed layer with PVD Be filler metal showed dendrite while that brazed with amorphous alloys appeared globular. Micro-Vickers hardness of brazed zone increased as the beryllium content of filler metal was decreased.

• Journal of Information Display
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• 제2권2호
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• pp.7-12
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• 2001

A viscous Ni solution was coated over amorphous Si thin film for evenly spread of Ni metal source. The Ni s. prepared by dissolving $NiCl_2$ into IN HCI and mixing with propylene glycol. $NiCl_2$ and Ni were deposited on the amorphous film after oven dry and they enabled to obtain a uniform crystallization. The crystallization using the viscous Ni solution was a Ni-silicide mediated process, the same process used with Ni metal layer. The crystallization temperature was lowered to $480^{\circ}C$ by the synergy effect of silicide-mediated crystallization and microwave-induced crystallization. Lateral crystallization was also enhanced such that the velocity of lateral crystallization by microwave annealing became faster than by furnace annealing.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 추계학술대회 논문집
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• pp.497-500
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• 2001

Due to their better photosensitivity in X-ray, the amorphous selenium based photoreceptor is widely used on the X-ray conversion materials. It was possible to control the charge carrier transport of amorphous selenium by suitably alloying a-Se with other elements(e,g. As, Cl). The charge transport properties of amorphous Selenium is decided on hole which is induced from metal to selenium in metal-selenium junction and which is transferred in a-Se bulk. This phenomenon is resulted of changing electric field owing to increasing of space charge by deep trap of a-Se bulk. In this paper, We dopped the chlorine to compensate deep hole trap and deposited blocking layer using dielectric material to prevent from increasing space charge for injection charge between metal electrode and a-Se layer. We compared space charge and the decreasing of trap density through measuring dark and photo current.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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• pp.268-271
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• 2004

The phase transition from amorphous to crystalline states, and vice versa, of $Ge_2Sb_2Te_5$ films by applying electrical pulses have been studied. This material can be used as nonvolatile memory. The reversible phase transition between the amorphous and crystalline states, which is accompanied by a considerable change in electrical resistivity, is exploited as means to store bits of information. The nonvolatile memory cells are composed of a simple sandwich (metal/chalcogenide/metal). It was formed that the threshold voltage depends on thickness, electrode distance, annealing time and temperature, respectively.