• 제목/요약/키워드: Al substrate

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SINTERED $Al_{2}O_{3}$-TiC SUBSTRATE FOR THIN FILM MAGNETIC HEAD

  • Nakano, Osamu;Hirayama, Takasi
    • 한국분말야금학회:학술대회논문집
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    • 한국분말야금학회 1998년도 춘계학술대회 및 발표대회 강연 및 발표논문 초록집
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    • pp.6-6
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    • 1998
  • In 1957, the first magnetic disk drive compatible with a movable head was introduced as an external file memory device for computer system. Since then, magnetic disks have been improved by increasing the recording density, which has brought about the development of a high performance thin film magnetic head. The thin film magnetic head has a magnetic circuit on a ceramic substrate using IC technology. The physical property of the substrate material is very important because it influences the tribology of head/disk interface and also manufacturing process of the head. $Al_{2}O_{3}$-TiC ceramics, so called ALTIC, is known to be one of the best substrate materials which satisfies this property requirement. Even though the head is not in direct contact with the disk, frequent instantaneous contacts are unavoidable due to its high rotating speed and the close gap between them. This may cause damage in the magnetic recording media and, thus, it is very important that the magnetic head has a good wear resistance. $Al_{2}O_{3}$-TiC ceramics has an excellent tribological property in head/disk interface. Manufacturing process of thin film head is similar to that of IC, which requires extremely smooth and flat surface of the substrate. The substrate must be readily sliced into the heads without chipping. $Al_{2}O_{3}$-TiC ceramics has excellent machineability and mechanical properties. $Al_{2}O_{3}$-TiC ceramics was first developed at Nippon Tungsten Co. as cutting tool materials in 1968, which was further developed to be used as the substrate materials for thin film head in collaboration with Sumitomo Special Metals Co., Ltd. in 1981. Today, we supply more than 60% of the substrates for thin film head market in the world. In this paper, we would like to present the sintering process of $Al_{2}O_{3}$-TiC ceramics and its property in detail.

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유기물 기판 위에 증착된 ZnO:Al 투명전도막의 전기적 특성에 미치는 기판 바이어스 전압의 효과 (Effect of Substrate Bias Voltage on the Electrical Properties of ZnO:Al Transparent Conducting Film Deposited on Organic Substrate)

  • 곽동주
    • 조명전기설비학회논문지
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    • 제23권1호
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    • pp.78-84
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    • 2009
  • 본 연구에서는 ZnO:Al 박막의 필름형 염료감응 태양전지의 투명전도막으로의 웅용 가능성을 연구하기 위하여 PET 기판 위에 r. f. 마그네트론 스퍼터링법으로 ZnO:Al 박막을 증착하였으며, ZnO:Al 박막의 전기적 그리고 광학적 특성의 향상을 위하여 기판 바이어스 전압을 인가하였다. 그 결과, 정(+)의 기판 바이어스 전압은 플라즈마 중의 전자를 기판의 스퍼터 원자에 충돌하게 함으로써 박막에 부가적인 에너지를 공급하게 되어 박막의 결정성장 및 전기적 특성을 향상시키고 있음을 알 수 있었다. 그러나 +30[V] 이상의 과도한 기판 바이어스 전압을 인가한 경우, 박막의 전기적 특성은 나빠졌으며, 특히 부(-)의 바이어스 전압을 인가한 경우 결정 성장이 나타나지 알아, 전기적 특성의 향상을 위한 기판 바이어스 전압의 효과가 매우 제한적으로 작용되고 있음을 알 수 있었다. 본 연구에서는 +30(V)의 기판 바이어스 조건하에서 $1.8{\times}10^{-3}[{\Omega}-cm]$의 체적 저항율 및 87.77(%)의 광 투과율을 얻을 수 있었다.

Si (111) 기판 위에 다양한 AIN 완충층을 이용한 GaN 성장과 특성 비교 (Comparison of growth and properties of GaN with various AlN buffer layers on Si (111) substrate)

  • 신희연;이정욱;정성훈;유지범;양철웅
    • 한국진공학회지
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    • 제11권1호
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    • pp.50-58
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    • 2002
  • Si 기판 위에 GaN의 성장은 Si이 사파이어보다 값이 저렴하고, 기존의 Si의 직접회로 공정에 GaN를 쉽게 접목시킬 수 있는 측면에서 다양한 장점이 있다. 그러나, Si은 GaN와의 격자상수와 열팽창계수의 차이가 사파이어보다 크며, 이로 인해 격자부정합에 의한 여러 결함을 발생시킨다. 따라서, Si 기판 위에 고품질의 GaN를 얻기 위해서는 AlN과 같은 완충층을 사용하여 격자부정합에 의한 결함을 줄여야 한다. 본 연구에서는 Si (111) 기판 위에 MOCVD, 스퍼터링과 MOMBE의 3가지 방법으로 결정성이 다른 3가지 유형의 AlN 완충층을 얻은 후, MOCVD법으로 GaN를 증착시켜 각각의 성장특성을 비교하였다. AlN 완충층과 GaN의 격자결합, 완충층의 표면 거칠기가 격자결함에 미치는 영향, 결정성, 성장방향, 결함(공공, 적층결함, 전위) 등을 TEM, XRD를 이용해 비교 분석하였다. AlN완충층의 결정성은 GaN의 성장에 있어 매우 큰 영향을 미치는 것을 확인할 수 있었다. 초기 성장과정에서 MOCVD과 MOMBE 법으로 성장시킨 AlN 완충층은 GaN 초기 성장에서 out-of-plane의 성장방향이 틀어지는 것을 감소시켜 주었다.

Variation of the surface structure of the Al / W(110) planes according to the substrate temperature and the coverage

  • Choi, Dae Sun
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.156.2-156.2
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    • 2016
  • The variation of the surface structure of the Al adsorbed W(110) planes according to the coverage and the substrate temperature has been investigated using LEED and ISS When the Al atoms were adsorbed on the W(110) surface at room temperature, a p($1{\times}1$) of the fcc (111) face were found at the coverage higher than 4 ML. When the substrate temperature was kept at 900 K during Al adsorption and the coverage was 1.0 ML, the surface revealed a p($1{\times}1$) of the bcc(110) face and when the coverage is 1.5 ML, the surface showed a p($1{\times}1$) of the bcc (110) face together with a p($1{\times}1$) double domain structure (fcc (111) face) rotated ${\pm}3^{\circ}$ from the [100] direction of the W(110) surface. When Al atoms were adsorbed on the W(110) surface at the substrate temperature of 1000 K and the coverage was higher than 1.0 ML, the surface revealed a p($1{\times}1$) of the bcc(110) face together with p($1{\times}1$) double domain structure(fcc(111) face) rotated ${\pm}3^{\circ}{\sim}5^{\circ}$ from the [100] direction of the W(110) surface. When Al atoms were adsorbed on the W(110) surface at the substrate temperature of 1100 K and the coverage was 0.5 ML, Al atoms formed a p($2{\times}1$) double domain structure When the coverage was 1.0 ML, the double domain hexagonal structure (fcc(111) face) rotated ${\pm}5^{\circ}$ from the [100] direction of the W(110) surface and another distorted hexagonal structure was found. Low-energy electron diffraction results along with ion scattering spectroscopy results showed that the Al atoms followed the Volmer-Weber growth mode at high temperature.

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실리콘 및 사파이어 기판을 이용한 알루미늄의 양극산화 공정에 관한 연구 (Fabrication of Anodic Aluminum Oxide on Si and Sapphire Substrate)

  • 김문자;이진승;유지범
    • 한국재료학회지
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    • 제14권2호
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    • pp.133-140
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    • 2004
  • We carried out anodic aluminum oxide (AAO) on a Si and a sapphire substrate. For anodic oxidation of Al two types of specimens prepared were Al(0.5 $\mu\textrm{m}$)!Si and Al(0.5 $\mu\textrm{m}$)/Ti(0.1 $\mu\textrm{m}$)$SiO_2$(0.1 $\mu\textrm{m}$)/GaN(2 $\mu\textrm{m}$)/Sapphire. Surface morphology of Al film was analyzed depending on the deposition methods such as sputtering, thermal evaporation, and electron beam evaporation. Without conventional electron lithography, we obtained ordered nano-pattern of porous alumina by in- situ process. Electropolishing of Al layer was carried out to improve the surface morphology and evaluated. Two step anodizing was adopted for ordered regular array of AAO formation. The applied electric voltage was 40 V and oxalic acid was used as an electrolyte. The reference electrode was graphite. Through the optimization of process parameters such as electrolyte concentration, temperature, and process time, a regular array of AAO was formed on Si and sapphire substrate. In case of Si substrate the diameter of pore and distance between pores was 50 and 100 nm, respectively. In case of sapphire substrate, the diameter of pore and distance between pores was 40 and 80 nm, respectively

플라스틱 기판에 증착한 ZnO:Al 박막의 특성에 미치는 스퍼터 압력 효과 (Effects of Sputter Pressure on the Properties of Sputtered ZnO:Al Films Deposited on Plastic Substrate)

  • 이재형
    • 한국전기전자재료학회논문지
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    • 제22권3호
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    • pp.277-283
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    • 2009
  • In this paper, aluminum doped zinc oxide (ZnO:Al) thin films on plastic substrate such as poly carbonate (PC), polyethylene terephthalate (PET) were prepared by RF magnetron sputtering method for flexible solar cell applications. Effects of the sputter pressure on the structural, electrical and optical properties were investigated. The crystallinity and the degree of the (002) orientation were deteriorated with increasing the sputter pressure. When the sputter pressure was higher, the conductivity of ZnO:Al films was improved because of the high carrier concentration and the Hall mobility. High quality ZnO:Al films with resistivity as low as $1.9{\times}10^{-3}{\Omega}-cm$ and the optical transmittance over 80 % in the visible region have been obtained on PC substrate at 2 mTorr.

기판온도 변화에 따른 ZnO:Al 투명 전도막의 특성 변화 (A study on the properties of transparent conductive ZnO:Al films on variation substrate temperature)

  • 양진석;성하윤;금민종;손인환;신성권;김경환
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집
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    • pp.525-528
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    • 2001
  • ZnO:Al thin film can be used as a transparent conducting oxide(TCO) which has low electric resistivity and high optical transmittance for the front electrode of amorphous silicon solar cells and display devices. This study of electrical, crystallographic and optical properties of Al doped ZnO thin films prepared by Facing Targets Sputtering (FTS), where strong internal magnets were contained in target holders to confine the plasma between the targets, is described. Optimal transmittance and resistivity was obtained by controlling flow rate of O$_2$ gas and substrate temperature. When the of gas rate of 0.3 and substrate temperature 200$^{\circ}C$ , ZnO:Al thin film had strongly oriented c-axis and lower resistivity(<10$\^$-4/Ω-cm).

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CORROSION BEHAVIOR OF Al-Zn ALLOY AS A SACRIFICIAL ANODE OF ORV TUBES

  • Jin, Huh;Lee, Ho-Kyun;Lee, Jae-Ho
    • 한국표면공학회지
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    • 제32권3호
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    • pp.452-455
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    • 1999
  • ORV which vaporizes LNG to NG is consisted of tube and header whose substrate is aluminum alloy. The corrosion of the tube is very severe because of sea water being used as the heating source. In this research to protect ORV substrate material, the corrosion behavior of aluminum alloys was investigated for the sacrificial role of Al-Zn alloy for ORV tubes. The electrochemical behavior of aluminum alloys in sea water was investigated. The corrosion behavior of thermally-sprayed and cladded samples were compared through salt spray tests. Al-Zn alloy can act as a sacrificial anode and cladded Al-Zn alloy has a better corrosion resistance than that of thermally sprayed one. The galvanic effect of Al-Zn to substrate material was conformed from scratched sample tests.

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나노 다층 TiAlSiN 박막의 고온 산화 (High-temperature Oxidation of Nano-multilayered TiAlSiN Filems)

  • 이동복;김민정
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2016년도 추계학술대회 논문집
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    • pp.189-189
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    • 2016
  • In this study, the Al-rich AlTiSiN thin films that consisted of TiN/AlSiN nano-multilayers were deposited on the steel substrate by magnetron sputtering, and their high-temperature oxidation behavior was investigated, which has not yet been adequately studied to date. Since the oxidation behavior of the films depends sensitively on the deposition method and deposition parameters which affect their crystallinity, composition, stoichiometry, thickness, surface roughness, grain size and orientation, the oxidation studies under various conditions are imperative. AlTiSiN nano-multilayer thin films were deposited on a tool steel substrate, and their oxidation behavior of was investigated between 600 and $1000^{\circ}C$ in air. Since the amount of Al which had a high affinity for oxygen was the largest in the film, an ${\alpha}-Al_2O_3-rich$ scale formed, which provided good oxidation resistance. The outer surface scale consisted of ${\alpha}-Al_2O_3$ incoporated with a small amount of Ti, Si, and Fe. Below this outer surface scale, a thin ($Al_2O_3$, $TiO_2$, $SiO_2$)-intermixed scale formed by the inwardly diffusing oxygen. The film oxidized slower than the $TiO_2-forming$ kinetics and TiN films, but faster than ${\alpha}-Al_2O_3-forming$ kinetics. During oxidation, oxygen from the atmosphere diffused inwardly toward the reaction front, whereas nitrogen and the substrate element of iron diffused outwardly to a certain extent.

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PLD 방법으로 Al2O3(0001) 기판 위에 증착한 Y2O3:Eu3+ 박막의 형광 특성 (Photoluminescence Characteristics Y2O3:Eu3+ Thin Film Grown on Al2O3(0001) Substrate by PLD)

  • 이성수
    • 센서학회지
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    • 제13권3호
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    • pp.252-257
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    • 2004
  • $Y_{2}O_{3}:Eu^{3+}$ thin films have been grown on $Al_{2}O_{3}$(0001) substrates by a pulsed laser deposition (PLD) method. The phosphor thin films were deposited at a substrate temperature of 500, 600, and $700^{\circ}C$ under the oxygen pressure of 100, 200, and 300 mTorr. The crystallinity, surface roughness and photoluminescence of the films are highly dependent on the substrate temperature and oxygen pressure. The films grown on $Al_{2}O_{3}$(0001) substrate even under the different substrate temperatures and oxygen pressures exhibited (222) preferred orientation. The luminescent spectra exhibited strong luminescence of ${^{5}D_{0}}-{^{7}F_{2}}$ transition within $Eu^{+3}$ peaking at 612 nm. The crystallinity and luminescence intensity of the films have been improved as the substrate temperature increasing. With increase of oxygen pressure from 50 to 300 mTorr, the crystallinity of the films has been uniformly decreased. The photoluminescence intensity and surface roughness have similar behaviors as a function of oxygen pressure. At 200 mTorr, both photoluminescence intensity and surface roughness show a maximum.