• Journal of Applied Reliability
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• v.11 no.2
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• pp.127-140
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• 2011

This paper presents an accelerated life test of aviation taxiway lights installed in the airport to help safe navigation of airplanes at night or in bad weather. Recently halogen lamps of taxiway lights are replaced by LED ones and their reliability needs yet to be verified. Thus, effective test conditions are designed reflecting the failure modes and mechanisms from the previous studies on LED, which include the accelerated degradation process. The test is performed under the temperature $70^{\circ}C$ and $90^{\circ}C$ for two types of LED lights, taxiway center line lights(TCLL) and taxiway edge lights (TEDL). The failure time data were analyzed using lognormal distribution and Arrhenius model to find the life-stress relationship, acceleration factor and life characteristics under the normal condition temperature $30^{\circ}C$.

• International Journal of Reliability and Applications
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• v.1 no.1
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• pp.89-104
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• 2000

Accelerated testing consists of a variety of test methods for shortening the life of products or hastening the degradation of their performance. This paper presents practical, modern statistical methods for evaluating the reliability of Nickel-Cadmium batteries at their design temperature of 2$0^{\circ}C$ by accelerated life test. Batteries have been life tested at three high temperature conditions, 50, 60, 7$0^{\circ}C$, respectively to yield failures quickly. The failures have been observed and judged by means of charge and discharge current integration. Analyses of life data from those conditions resulted in the Weibull distribution, which has been verified on the ground of the Kolmogorov-smirnov test and the pairwise t-test. Life data are modeled according to the Arrhenius life-temperature relationship. The mean life of tested batteries is assessed at about 590 cycles, and the activation energy of this chemical reaction is concluded to be 0.39eV as results. This study provides procedures for estimating the reliability of batteries in a short period, which has little been possible in domestic industries. The results can be applied in many fields such as proof testing, acceptance testing, and estimating assurance periods.

• Journal of the Korea Safety Management & Science
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• v.9 no.5
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• pp.43-48
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• 2007

This paper is to present linkage parameter to integrate statistical models and physical models for accelerated life test. Statistical models represent the relationship of probability distribution and life. Physical models show the relationship of life and stress. Moreover, this study proposes the four steps for construction of integrated models for accelerated life test using linkage parameter. Finally, this paper develops new integrated models such as extreme value distribution-general Eyring, linearly increasing failure rate function-general Eyring, etc., and estimates various reliability measures.

• Journal of Applied Reliability
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• v.2 no.1
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• pp.15-22
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• 2002

This paper is concerned about an Accelerated Life Test for Micro Display Device which is being used in a Projection TV, in order to find a failure mode occurred in field in a short time, to identify a major factor to affect a life, and to estimate a mean life. For this purpose, we selected a temperature as a accelerated factor to perform a test and measured degradation of display device using visual inspection and chromaticity table. In the result of Accelerated Life Test, it is confirmed that failure mode is equal to the degradation of display device by vendor and the Temperature is a major factor to affect a failure. Besides, according as the display device is turned to green as degraded, it is identified that the change of the chromaticity value is one method to measure the degree of the degradation . So, we applied the optimal condition, which consider a cost and life to lower the Temperature which is a major factor acquired by the result of ALT, to PTV design

• Journal of Applied Reliability
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• v.17 no.1
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• pp.50-57
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• 2017

Purpose : This paper is a comparative analysis results of the fatigue test for dental implants and accelerated life test by using a static type loading device commonly used in Korea and a dynamic type loading device (universal-joint) recommended by FDA. Methods : Fatigue tests of dental implant is based on ISO 14801 and classified into static load test and dynamic load test. The tests were carried out on three test specimens by four load stress steps under each loading device. For analysis on failure mode such as crack, fracture and permanent deformation of test specimens, we used X-ray three-dimensional computed tomography on test specimens before and after the fatigue tests. The design of the accelerated life test was based on the analysis results of the fatigue life data obtained from the dynamic load test and the statistical analysis software (Minitab ver.15) was used to analyze the appropriate life distribution. Results : As a result of the fatigue tests and the accelerated life tests at same acceleration condition under each test method, the fatigue life under the dynamic type loading device (universal-joint) was shorter than when static type loading device was applied. Conclusion : This paper can be used as a reference when the universal-joint type loading device for implants fatigue test is applied as ISO 14801.

• Journal of the Korea Safety Management & Science
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• v.15 no.1
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• pp.109-120
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• 2013

As information-oriented industry has been developed and electronic devices has come to be smaller, lighter, multifunctional, and high speed, the components used to the devices need to be much high density and should have find pattern due to high integration. Also, diverse reliability problems happen as user environment is getting harsher. For this reasons, establishing and securing products and components reliability comes to key factor in company's competitiveness. It makes accelerated test important to check product reliability in fast way. Out of fine pattern failure modes, failure of Electrochemical Migration(ECM) is kind of degradation of insulation resistance by electro-chemical reaction, which it comes to be accelerated by biased voltage in high temperature and high humidity environment. In this thesis, the accelerated life test for failure caused by ECM on fine pattern substrate, $20/20{\mu}m$ pattern width/space applied by Semi Additive Process, was performed, and through this test, the investigation of failure mechanism and the life-time prediction evaluation under actual user environment was implemented. The result of accelerated test has been compared and estimated with life distribution and life stress relatively by using Minitab software and its acceleration rate was also tested. Through estimated weibull distribution, B10 life has been estimated under 95% confidence level of failure data happened in each test conditions. And the life in actual usage environment has been predicted by using generalized Eyring model considering temperature and humidity by developing Arrhenius reaction rate theory, and acceleration factors by test conditions have been calculated.

• Journal of Applied Reliability
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• v.18 no.1
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• pp.8-19
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• 2018

Purpose: This study has developed the accelerated lifetime test method for smps for outdoor lighting LED through two factors of temperature and humidity. Methods: Acceleration condition was confirmed for each stress and model, and acceleration life test model was estimated according to acceleration condition. Results: As a result of confirming the accelerated life test model, in the case of humidity, acceleration was established only in the foreign products. Therefore, it is confirmed that the acceleration condition is insufficient. However, the estimated parameters for temperature are relatively constant. It is therefore suitable for power supply acceleration tests for outdoor lighting LEDs. Conclusion: The SMPS acceleration test for outdoor lighting LED can improve the availability of the product by developing an accelerated life test method that guarantees the reliability of the product.

• Transactions of The Korea Fluid Power Systems Society
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• v.2 no.4
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• pp.14-22
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• 2005

The safety factor of hydraulic piston pumps & motors due to high pressurization, high speedization and low weight/volume realization to enhance the output density shows a tendency to decrease. Therefore more effective test methods are necessary to predict the exact life. The failure of hydraulic pumps & motors operating in high pressure and high speed mainly occurs in piston-shoe assemblies, and the major failure mode is wearout of the shoe surface. The sensitive parameters in the endurance life test are speed, pressure and temperature, and the failure production increases in proportion to the operating time. In this research, the authors propose the combined accelerated life test model using the analysis method of the combined accelerated life test results of piston-shoe assemblies by applying simultaneously high speed, high pressure and high temperature in accordance with variation of speed, pressure and temperature to reduce the life test time.

• Journal of the Korean Data and Information Science Society
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• v.14 no.4
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• pp.951-963
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• 2003

In this paper, we propose goodness of fit test statistics based on the estimated Kullback-Leibler information functions using the data from three step stress accelerated life test. This acceleration model is assumed to be a tampered random variable model. The power of the proposed test under various alternatives is compared with Kolmogorov-Smirnov statistic, Cramer-von Mises statistic and Anderson-Darling statistic.

• Journal of Applied Reliability
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• v.17 no.1
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• pp.22-27
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• 2017

Purpose: The purpose of this study is to estimate the life time of OLED TV panel through electric current ADT(Accelerated Degradation Test). Methods: We performed accelerated degradation test for OLED TV Panel at the room temperature to avoid high temperature impact on the luminance. Results: we got more accurately the life time of the OLED TV when we applied ADT without temperature factor than including both current and temperature. Conclusion: Until now, the ADT of the OLED TV has been conducted with temperature and current at the same time for reducing test time and costs. We estimate incorrect life time when the temperature is adopted as an accelerated factor. Due to the high temperature impact on the luminance of the OLED TV panel. So as to solve this problem, we discard temperature and use electric current only.