• The Korean Journal of Applied Statistics
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• v.8 no.2
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• pp.121-132
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• 1995

In this paper we consider optimal designs of partially step-stress life testing which is deviced for k-component series systems with the considerably long life time. Test items are first run simultaneously at use condition for a specified time, and the surviving items are then run at accelerated condition until a predetermined censoring time. The optimal criterion for the change time to accelerated condition is to minimized either the generalized asymptotic variance of maximum likelihood estimators of the hazard rates at use condition and the acceleration factors or the asymptotic variance of the maximum likelihood estimators of the acceleration factors.

• Journal of Korean Society for Quality Management
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• v.40 no.3
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• pp.270-277
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• 2012

Purpose: In this paper, storage lifetime of delay system in the fuse of 81MM illuminating projectile is estimated. Methods: Accelerated degradation testings of tungsten delay system using both temperature and humidity stresses were performed, and then delay time increase of the systems were analyzed as degradation data based on distribution-based degradation processes. Results: The estimated storage lifetime of detonator is between 11.8 years and 17.6 years with each stress-life relationship. Conclusion: Comparing with field data, storage lifetime of 90% reliability is about 12 years.

• Journal of Applied Reliability
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• v.14 no.1
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• pp.59-70
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• 2014

The requirements of reliability verification for new products and technology are increasing more and more in accordance with the trend of climate change prevention and GHG reduction technology, functional skills. SCA(Swirl Control Actuator) is the important part of a car intake manifold system. This device generates swirl that is mixing the fuel and air into the engine combustion chamber. This is to improve output for engine and reduce the emission for exhaust. In this article reliability assessment criteria for swirl control actuator for automobiles are established in terms of basic HALT and life time test.

• Proceedings of the KIPE Conference
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• 2015.11a
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• pp.101-102
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• 2015

이차전지의 수명 평가는 크게 Cycle life test 와 Calendar life test로 나뉘어져서 평가 되고 있다. Cycle life test로 수명 검증을 위해서는 일반적으로 3000 사이클 이상 테스트를 진행 하여야 하지만 이 방법은 시간이 장기화 되어 신뢰성 검증 및 새로운 부품 적용에 한계가 따른다. 따라서 본 논문에서는 고온 챔버 및 사이클 시험기를 사용하여 빠른 시간 내에 평가를 할 수 있는 가속시험법을 적용하여 수명을 평가 한 연구결과를 발표하고자 한다.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.34 no.4
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• pp.467-474
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• 2010

Stainless steel sheets are widely used as the structural material for railroad cars and commercial vehicles. Structures made of stainless steel sheets are commonly fabricated by gas welding, For the fatigue design of gas welded joints such as fillet joints, it is necessary to obtain design information of the stress distribution at the weldment as well as the fatigue strength of the gas-welded joints. Further, the influence of the geometrical parameters of gas-welded joints on stress distribution and fatigue strength must be evaluated. in this study, ${\Delta}P-N_f$ curves were obtained by fatigue tests. and, the ${\Delta}P-N_f$ curves were rearranged on the basis of the ${\Delta}{\sigma}-N_f$ relation for the hot-spot stresses at the gas-welded joints. These results, were used for conducting an accelerated life test(ALT) From the experiment results, an acceleration model was derived and factors were estimated. The objective is to obtain the information required for the analysis of the fatigue lifetime of fillet welded joints and for data analysis by the statistic reliability method to save time and cost and to develop optimum accelerated life prediction plans.

• Journal of Power Electronics
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• v.17 no.3
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• pp.811-820
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• 2017

The reliability issue of IGBT is a concern for researchers given the critical role the device plays in the safety of operations of the converter system. The reliability of power devices can be estimated from the intermittent life test, which aims to simulate typical applications in power electronics in an accelerated manner to obtain lifetime data. However, the test is time-consuming, as testing conditions are not well considered and only rough provisions have been made in the current standards. Acceleration of the test by changing critical test conditions is controversial due to the activation of unexpected failure mechanisms. Therefore, full investigations were conducted on critical test conditions of intermittent life test. A design optimization process for IGBT intermittent life testing program was developed to save on test times without imposing additional failure mechanisms. The applicability of the process has been supported by a number of tests and failure analysis of the test results. The process proposed in this paper can guide the test process for other power semiconductors.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2004.10a
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• pp.166-169
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• 2004

A fatigue test was used to evaluate the fatigue life of an actual structure. The loaded state and the constraint condition of an actual structure must be same as the specimen in order to apply the test results to an actual structure by the specimen. The loaded state and constraint conditions can't be same as the specimen in the actual structure which is complicated. In order to reduce these differences, an actual structure test with a lot of frequencies is need to get a fatigue life curve. Therefore, ten sets of accelerated test units which attached unbalanced mass were composed in this study. Acceleration history about the vibration of an actual structure was acquired. Rainflow counting was used on acceleration history, and the life curve return formula was assumed. The return formula that damage satisfied `1' was acquired in a feedback process by the Miner's rule, which was the linear cumulative damage theory. A conservative fatigue life curve was determined with a return formula to have been presumed by each set. The fatigue life of regular rpm condition was calculated by these conservative fatigue life curves.

• Proceedings of the KIEE Conference
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• 2005.07a
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• pp.377-380
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• 2005

In this paper, accelerated stress test(AST) for Magnetic Switch (MS) are applied to assure specified reliability of the products. Magnetic contactor that functions with over-current relay is called MS. Magnetic contactor closes and opens the motor load with ON/OFF switch of electronic contactor. It is also used for protecting and controlling the load. Magnetic contactor detects the over-current flow in the load with a over-current relay and disconnects the load by opening its control power. In this study, AST for product assembly are developed in order to improve the weak point so that increase the product reliability. Also we will show the basic information for the accelerated life test(ALT). The proposed AST results and procedures may be extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably. Finally the results of this study will contribute to improving reliability of products and strengthening competitiveness of our products in the world markets.

• Journal of Applied Reliability
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• v.13 no.1
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• pp.19-30
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• 2013

The requirements of reliability verification for new products and technology are increasing more and more in accordance with the trend change of strength for safety technology, functional skills and emotional quality. In order to conduct the purpose of robust design from the stage of product development recently, the application of reliability technology has gradually increased such as detecting the failure mode throughout the HALT technique, accelerated tests and so on. The main results are as follows; i) through the pre-test and analysis, detected the basic performance and predictable failure mode, ii) HALT technique and process has been developed that can be applied test methods for the next new products.

• Journal of Applied Reliability
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• v.10 no.2
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• pp.137-148
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• 2010

This study deals with the accelerated life test of high power phosphor converted white Light Emitting Diodes (High power LEDs). Samples were aged at $110^{\circ}C$/85% RH and $130^{\circ}C$/85% RH up to 900 hours under non-biased condition. The stress induced a luminous flux decay on LEDs in all the conditions. Aged devices exhibited modification of package silicon color from white to yellowish brown. The instability of the package contributes to the overall degradation of optical lens and structural degradations such as generating bubbles. The degradation mechanisms of lumen decay and reduction of spectrum intensity were ascribed to hygro-mechanical stress which results in package instabilities.