• International Journal of Precision Engineering and Manufacturing
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• 제6권2호
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• pp.50-54
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• 2005

We report a simple, low cost, and reliable method for assembling a multi-walled nanotube (MWNT) to the end of a metal coated scanning probe microscopy (SPM) tip. By dropping the MWNT solution and applying an electric field between an SPM tip and an electrode, MWNTs which were dispersed into a dielectric solution were directly assembled onto the apex of the SPM tip due to the attraction by the dielectrophoretic force. The effective measurement of a MWNT -attached SPM tip was demonstrated by direct comparison with AFM images of a standard sample with a bare AFM tip.

• 펄프종이기술
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• 제30권4호
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• pp.49-58
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• 1998

The SPM could image the most detailed microstructure of a sample in a wet and dry state by measuring the interaction between the atoms on the sample surface and the extremely sharp probe tip. The refined fibre exhibited large wrinkles formed by fibrillar bundles, the disintegrated fibres extensively showed “scale-like features”. By using the Non-Contact Atomic Force Microscopy (NC-AFM) and Contact Atomic Force Microscopy (C-AFM) including Phase Detection Microscopy (PDM) and Force Modulation Microscopy (FMM), it was possible to investigate surface topography, surface roughness and mechanical property (hardness or visco-elasticity) of fibre surface in detail. The PDM and FMM images showed that the disintegrated only fibre displayed uniform mechanical properties, whereas the refined one did not. The surface roughness of pulp fibres was higher in refined fibres than in disintegrated fibres due to the presence of external fibrils. These SPM images would be used to provide visual evidence of morphological change of a single fibre created during mechanical treatments such as refining, drying, calendering and so on.

• Tribology and Lubricants
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• 제21권1호
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• pp.1-7
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• 2005

Effect of Surface roughness on nanoscale adhesion was studied experimentally by using colloidal probe technique. Glass micro balls having the radius of $3.3\~17.4{\mu}m$ were glued at the end of AFM cantilevers to prepare colloidal probes. Adhesion force between the colloidal probe and Si-wafer was measured using pull-off force measuring method. Results showed that the measured adhesion forces are not the function of the radius of the glued balls because the ball surfaces are rough. It is also found that roughness parameters such as $R_a,\;R_q\;and\;R_{max}$ do not have important role on nanoscale adhesion. In order to find the effect of surface roughness on nanoscale adhesion, the bearing areas were extracted from the measured topography of glued balls. After normalizing the measured adhesion force with the bearing area, it was found that the normalized adhesion force kept constant as function of the radius of glued ball.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2004년도 춘계학술대회논문집
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• pp.83-86
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• 2004

Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip to demonstrate the non-linear features including tip amplitude saturation preceding the dynamic buckling of the MWCNT. Surface scanning is performed using a MWCNT tip on a SiO$_2$ grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT probe tip are discussed using the experimental results.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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• pp.98.2-98.2
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• 2013

Electrochemical phenomena underpin a broad spectrum of energy, chemical, and information technologies such as resistive memories and secondary batteries. The optimization of functionalities in these devices requires understanding electrochemical mechanisms on the nanoscale. Even though the nanoscale electrochemical phenomena have been studied by electron microscopies, these methods are limited for analyzing dynamic electrochemical behavior and there is still lack of information on the nanoscale electrochemical mechanisms. The alternative way can be an atomic force microscopy (AFM) because AFM allows nanoscale measurements and, furthermore, electrochemical reaction can be controlled by an application of electric field through AFM tip. Here, I will summarize recent studies to probe nanoscale electrochemical reaction in battery applications by AFM. In particular, we have recently developed electromechanical based AFM techniques for exploring reversible and irreversible electrochemical phenomena on the nanoscale. The present work suggests new strategies to explore fundamental electrochemical mechanisms using the AFM approach and eventually will provide a powerful paradigm for probing spatially resolved electrochemical information for energy applications.

• Bulletin of the Korean Chemical Society
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• 제28권1호
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• pp.81-84
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• 2007

Ab initio periodic Hartree-Fock calculations with the full potential and minimum basis set are applied to interpretation of scanning tunneling microscope (STM) and atomic force microscope (AFM) images on 1TVTe2. Our results show that the simulated STM image shows asymmetry while the simulated AFM image shows the circular electron densities at the bright spots without asymmetry of electron density to agree with the experimental AFM image. The bright spots of both the STM and AFM images of VTe2 are associated with the surface Te atoms, while the patterns of bright spots of STM and AFM images are different.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2000년도 추계학술대회논문집
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• pp.161-164
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• 2000

Currently, Atomic Force Microscope(AFM) has been widely used to measure the surface topography of a sample by detecting interaction force between atoms on the sample and extremely sharp probe tip. The vertical resolution of AFM is mainly determined by external vibration noise. The resolution of AFM shows different values for the different environment, thus it is necessary to determine relationship between the criteria and the resolution of AFM regardless of environment. In this paper, we discuss the allowable level of floor vibration for AFM equipment at given resolution. The vibration criteria can be used as reference data to design mechanical structure and to analyze the structural dynamics of AFM equipment.

• 한국표면공학회지
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• 제47권6호
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• pp.362-367
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• 2014

We report the design, fabrication of a $Si_3N_4$ probe and calculation of its mechanical properties for DPN(dip pen nanolithography), which consists of dual tips. Concept of dual tip probe is to employ individual tips on probe as either an AFM tip for imaging or a writing tip for nano patterning. For this, the dual tip probe is fabricated using low residual stress $Si_3N_4$ material with LPCVD deposition and MEMS fabrication process. On the basis of FEM analysis we show that the functionality of dual tip probe for imaging is dependent on the dimensions of dual tip probe, and high ratio of widths of beam areas is preferred to minimize curvature variation on probe.

• 한국발생생물학회:학술대회논문집
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• 한국발생생물학회 2004년도 추계학술대회
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• pp.9-17
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• 2004

• Korean Chemical Engineering Research
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• 제47권5호
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• pp.538-545
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• 2009

본 총설에서는 주사형프로브현미경의 원리와 응용에 관하여 간략히 설명하고 최근 본 그룹에 의하여 활발하게 연구되고 있는 나노탐침과 AFM(원자간력현미경 atomic force microscopy)을 이용한 저침습성(low-invasive) 단일세포 조작기술과 고효율 유전자 도입기술을 소개하고자 한다. 시판 AFM 탐침을 침상구조로 가공한 나노탐침과 AFM을 이용하였을 경우, 탐침의 세포삽입의 성공여부를 force-distance curve 상의 척력소실의 유무로 판단할 수 있다. 침상 나노탐침을 사용하면 대부분의 세포에서 80~90%의 고효율 세포삽입이 가능하여 마이크로인젝션용 미세관을 이용하는 경우보다 세포삽입효율이 높았다. 또한 나노탐침의 직경이 400 nm 이하의 경우에는 세포 종류에 관계없이 장시간 나노탐침의 삽입에도 세포활성에 큰 영향이 없었다. 침상나노탐침을 이용하여 DNA를 도입하였을 경우에도 기존의 DNA 도입방법과 비교하여 높은 도입효율과 유전자 발현율로 DNA를 도입할 수 있는 가능성을 확인하였다.