• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.484-487
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• 2000

This study is for assessing a reliability of diagnostic device through comparing diagnostic results to ACDB strength. The dielectric diagnosis using IRC (isothermal relaxation current) measurement was carried on service-aged cables. From this study, there was little correlation between dielectric diagnosis and ACBD strength in long distance cables. But the correlation between them showed in short distance below 200 m. Therefore, it is desirable to diagnose the URD cables in short distance.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1998.11a
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• pp.203-206
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• 1998

Effects of types of semicon compounds on electrical properties of XLPE were investigated. The amounts of charge of XLPE were changed with the contents of additive included in semicon electrodes, but homocharge in cathode was observed. In the aging experiment under high voltage, it was found that semiconductive layer with high impurity contents played an important role in the decrease of ACBD strength of XLPE.