• Proceedings of the KIEE Conference
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• 2011.07a
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• pp.1552-1553
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• 2011

The HVDC transformer which is one of the main equipments for HVDC(High Voltage Direct Current) electric power transmission systems is exposed to not only AC voltage but also the inflowing DC voltage which comes from the DC-AC converter systems. Therefore, the HVDC transformer insulation system is required to withstand the electric field stress under AC, DC and DC polarity reversal conditions. However the electric field distributions under those conditions are different because the AC electric field and DC electric field are governed by permittivity and conductivity, respectively. In this study, the changes of electric potential and electric field of conventional AC transformer insulation system under DC polarity reversal test condition were analyzed by FEM(Finite Element Method). The DC electric field stress was concentrated in the solid insulators while the AC electric field stress was concentrated in the mineral oil. In addition, the electric stress under that condition which is affected by the surface charge accumulation at the interfaces between insulators was evaluated. The stress in some parts could be higher than that of AC and DC condition, during polarity reversal test. The result of this study would be helpful for the HVDC transformer insulation system design.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.6
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• pp.586-591
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• 2004

We studied the dependence of hot-tarrier-induced degradation characteristics on nitrogen concentration in NO(Nitrided-Oxide) gate of nMOS, under ac and dc stresses. The $\Delta$V$_{t}$ and $\Delta$G$_{m}$ dependence of nitrogen concentration were observed, We observed that device degradation was suppressed significantly when the nitrogen concentration in the gate was increased. Compared to $N_2$O oxynitride, NO oxynitride gate devices show a smaller sensitivity to ac stress frequency. Results suggest that the improved at-hot carrier immunity of the device with NO gate may be due to the significantly suppressed interface state generation and neutral trap generation during stress.ess.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.2
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• pp.13-18
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• 2007

This paper presents the experimental findings on the different degradation mechanism which depends on the gate oxide thickness in lateral DMOS transistors. For thin oxide devices, the generation of interface states in the channel region and the trapped holes in the drift region is found to be the causes of the device degradation. For thick devices, the generation of interface states in the channel region is found to be the causes of the device degradation. We confirmed the different degradation mechanism using device simulation. From the comparison of device degradation under DC and AC stress, it is found that the device degradation is more significant under DC stress than one under AC stress. The device degradation under AC stress is more significant in high frequency. Therefore the hot carrier induced degradation should be more carefully considered in the design of RF LDMOS transistors and circuit design.

• Journal of Power Electronics
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• v.13 no.2
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• pp.186-196
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• 2013

This paper presents a low voltage-stress AC-linked charge equalizing system for balancing the energy in a serially connected, valve-regulated lead acid battery string using a modular converter that consists of multiple transformers coupled together. Each converter was coupled through an AC-linked bus to increase the overall energy transfer efficiency of the system and to eliminate the problem of the unbalanced charging of batteries. Previous solutions are based on centralized and modularized topologies. A centralized topology requires a redesign of the hardware and related components. It also faces a high voltage stress when the number of batteries is expanded. Modularized solutions use low-voltage-stress, double-stage, DC-linked topologies which leads to poor energy transfer efficiency. The proposed solution uses a low-voltage stress, AC-linked, modularized topology that makes adding more batteries easier. It also has a better energy transfer efficiency. To ensure that the charge equalization system operates smoothly and safely charges batteries, a small intelligent microcontroller was used in the control section. The efficiency of this charge equalization system is 85%, which is 21% better than other low-voltage-stress DC-linked charging techniques. The validity of this approach was confirmed by experimental results.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.20 no.5
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• pp.541-546
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• 2011

This study was numerically investigated on thermal deformation of AC4C and AC7A aluminum alloy casting material for manufacturing the automobile tire mold. The metal casting device was used in order to manufacture the mold product of automobile tire at the actual industrial field. The temperature distribution and the cooling time of these materials were numerically calculated by finite element analysis. Thermal deformation with stress distribution was also calculated form the temperature distribution results. The thermal deformation was closely related to the temperature difference between the surface and inside of the casting. As shown by numerical analysis result, the thermal deformation of AC7A casting material became higher than AC4C casting material. In addition, the results of displacement and stress distributions appeared to be larger at the center parts of casting than on its sides because of the shrinkage caused by the cooling speed difference.

• Journal of the Korea Society of Computer and Information
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• v.9 no.1
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• pp.9-15
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• 2004

New WSW(Wrap Side Wall) is proposed to decrease junction electric field in this paper. WSW process is fabricated after first gate etch, followed NM1 ion implantation and deposition & etch nitride layer. New WSW structure has buffer layer to decrease electric field. Also we compared the hot carrier characteristics of WSW and conventional. Also, we design a test pattern including pulse generator, level shifter and frequency divider, so that we can evaluate AC hot carrier degradation on-chip. It came to light that the universality of the hot carrier degradation between DC and AC stress condition exists, which indicates that the device degradation comes from the same physical mechanism for both AC and DC stress. From this universality, AC lifetime under circuit operation condition can be estimated from DC hot carrier degradation characteristics.

• Proceedings of the Materials Research Society of Korea Conference
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• 2004.05a
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• pp.82-82
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• 2004

• Journal of the Society of Naval Architects of Korea
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• v.46 no.5
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• pp.498-509
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• 2009

Present study is concerned with the simulation of plasticity models for the cyclic stressstrain behavior of aluminum alloy AC4C-T6 that can be used for primary materials of LNG cargo pump. Material model of cyclic hardening and plasticity for aluminum alloy AC4C-T6 was investigated through experiments and numerical simulations. Monotonic tensile and cyclic tension-compression test under symmetric load cycles was performed at both room temperature and cryogenic temperature of $-165^{\circ}C$. Based on the experimental data plastic hardening models were evaluated for isotropic/kinematic/combined hardening. FEA (Finite Element Analysis) models which describe the cyclic stress-strain relationship were evaluated for the simulation of plasticity. An appropriate hardening model is proposed comparing the results of FEA with those of experiments.

• Proceedings of the KIEE Conference
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• 2006.04b
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• pp.275-277
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• 2006

This paper proposes a snubber circuit for a PWM Cuk AC-AC converter. The proposed snubber makes use of an Undeland snubber as a commutation aids. So the snubber keeps such good features as small count of snubber elements, reduction of voltage/current stress of main switching devices and improved efficiency. This paper shows simulation results to verify the adaptability and feasibility of the proposed snubber.

• Proceedings of the KIPE Conference
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• 2006.06a
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• pp.143-145
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• 2006

This paper proposes a snubber circuit for a PWM AC-AC Cuk converter. The proposed snubber applies a modified Undeland snubber as a commutation aid. The snubber circuit has some good features such as reduction of voltage/current stress of the main switches, improved efficiency. The experiment results show the adaptability and feasibility of the proposed snubber circuit.