• The Korean Journal of Ceramics
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• v.7 no.1
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• pp.30-35
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• 2001

The contribution of the non-$180^{\circ}C$ domains to the electric-field-induced strains (EFI-strains) of PZT ceramics was evaluated by an XRD method and by an interferometric method. The XRD intensity ratio of 200 and 002 diffraction peaks of tetragonal PZT was measured under strong electric fields. The amount of the $90^{\circ}$ domain reorientation was evaluated and the strain due to the domain reorientation was calculated. It was confirmed that the EFI-strain of PZT ceramics was equal to the sum of the strain calculated from the d$_33$ constant determined by the resonance-antiresonance method and the strain due to the $90^{\circ}$ domain reorientation. The amount of the $90^{\circ}$domain reorientation has a linear relation with the c/a ratio in the "soft" PZT ceramics. A Mech-Zehnder interferometer was constructed to measure the EFI-strains vs. electric-field curves of PZT ceramics as a function of frequency. The EFI-strain vs. electric-field curve showed a hysteresis due to the effect of the non-$180^{\circ}$ domain reorientation when the applied voltage was high and its frequency was low. The apparent piezoelectric constant increased from the d$_33$ value determined by the resonance-antiresonance method with decreasing frequency. This deviation was attributed to the non-$180^{\circ}$ domain contribution.tribution.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.10
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• pp.896-901
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• 2002

The polarization and strain behavior of multilayer ceramic actuators fabricated by tape casting using a PNN-PZT ceramics were investigated in association with electrode size and internal layer number. Spontaneous polarization and strain decreased with increasing electrode size. In addition, the increase of internal layer number brought reduced spontaneous polarization and increased the field-induced strain. Because the actuators structure is designed to stack ceramic layer and electrode layer alternatively, the ceramic-electrode interfaces may act as a resistance to motion of domain wall. To analyze the effect of ceramic-electrode interface, the diffraction intensity ratio of (002) to (200) planes was calculated from X-ray diffraction patterns of samples subjected to a voltage of 200 V. The diffraction intensity ratio of (002) to (200) planes was decreased with increasing electrode size and internal layer number. The diffraction intensity ratio and straining behavior analyses indicate that the Polarization and strain were affected by the amount of 90°domain decreasing with increasing electrode size and internal layer number. Consequently, the change of polarization and displacement with respect to electrode size and layer number is likely to be caused by readiness of the domain wall movement around the interface.