• Title/Summary/Keyword: 3D형상 측정

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Measurement of three dimensional shapes using phase-shifting shadow moire method (위상 이동 그림자 무아레 방법을 이용한 3차원 형상의 측정)

  • 강영준
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.6 no.4
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    • pp.39-45
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    • 1997
  • Shadow moire topography has been used as a noncontact method for measuring the 3-D shapes of objects. The moire fringes are results from the superposition of a master grating and its shadow projected on the surface of an object. But in case of the classical shadow moire method, in general, the resolution is a few tenths of millimeter. It is difficult to use a phase -shifting method in shadow moire because it is impossible to obtain uniform phase shifts on the whole field. But in this study , We introduce a phase-shifting method to improve the resolution of the classical shadow moire method. This method is based on the fact that if the depth of object is much less than the distance between the observer and the master grating, the phase shifts are almost uniform on the whole field area. Finally, we applied this new phase-shifting method to the measurement of the 3-D shape of a coin.

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A curvature profilometry using white-light (백색광을 이용한 곡률 측정법 개발)

  • Kim, Byoung-Chang
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.7 no.3
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    • pp.81-86
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    • 2008
  • I present a 3-D profiler specially devised for the profile measurement of specular surfaces that requires precision shape accuracy up to a few nanometer. A profile is reconstructed from the curvature of a test part of the surface at several locations along a line. The local curvature data are acquired with White-light Scanning Interferometry. Test measurement proves that the proposed profiler is well suited for the specular surface inspection like precision mirror.

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A method for the realistic Rendering of 3D Objects (3차원 객체의 사실적인 표현을 위한 측정데이터 기반 렌더링 기법)

  • Seo, Myoung-Kook;Kwon, Hyuk-Jin;Yoon, Bok-Joong
    • Annual Conference of KIPS
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    • 2015.10a
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    • pp.1499-1501
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    • 2015
  • 본 연구는 컴퓨터그래픽스 분야에서 3차원 객체를 사실적으로 표현하기 위해 사용되고 있는 주요 데이터 측정, 모델링, 렌더링 기술을 소개한다. 객체의 최종 외관은 객체의 형상과 표면 재질, 그리고 주변 광 조건에 크게 영향을 받는다. 따라서 임의 가상공간(디스플레이)에서 3차원 객체를 사질적으로 표현하기 위해서는 주요 영향 인자에 대한 정보가 확보되어야 한다. 최근 컴퓨터그래픽스 분야에서는 객체 형상 및 재질 정보 획득을 위한 다양한 기술 및 장비와 객체 가시화를 위한 다양한 기법을 제시하고 있다. 효과적인 객체 가시화하기 위해서는 각 객체의 구성 재질에 대한 광학 특성에 대한 선행 분석을 토대로, 적절한 측정 및 모델링, 렌더링 기법 적용이 필요하다. 본 연구는 측정 데이터 기반의 재질 렌더링 기법에 중심으로 다양한 재질에 적합한 요소 기술과 그 결과를 설명하고, 재질 렌더링 기법을 활용한 건설분야의 향후 연구 계획을 제시한다.

2D/3D Visual Optical Inspection System for Quad Chip (Quad Chip 외관 불량 검사를 위한 2D/3D 광학 시스템)

  • Han, Chang Ho;Lee, Sangjoon;Park, Chul-Geon;Lee, Ji Yeon;Ryu, Young-Kee;Ko, Kuk Won
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.17 no.1
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    • pp.684-692
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    • 2016
  • In the manufacturing process of the LQFP/TQFP (Low-profile Quad Flat Package/Thin Quad Flat Package), the requirement of a 3 dimensional inspection is increasing rapidly and a 3D inspection of the shape of a chip has become an important report of quality control. This study developed a 3 dimensional measurement system based on PMP (Phase Measuring Profilometry) for an inspection of the LQFP/TQFP chip and image processing algorithms. The defects of the LQFP/TQFP chip were classified according to the dimensions. The 2 dimensional optical system was designed by the dorm illumination to achieve constant light distribution, In the 3 dimensional optical system, PZT was used for moving 90 degree in phase. The problem of 2 ambiguity was solved from the measured moir? pattern using the ambiguity elimination algorithm that finds the point of ambiguity and refines the phase value. The proposed 3D measurement system was evaluated experimentally.

The shape measurement of 3D object by using the method of interference pattern projection. (간섭무늬 투영 방식의 3차원 형상 측정)

  • 이연태;강영준;박낙규;황용선;백성훈
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.271-274
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    • 2002
  • The 3-D measurement using interference pattern projection is very attractive because of its high measuring speed and high sensitivity. When a sinusoidal amplitude grating was projected on an object, the surface-height distribution of the object is translated into a phase distribution of the deformed grating image. The patters was generated by a interferometer, and a PZT was used to shift the fringes on the target surface. The phase-acquisition algorithms are so sufficiently simple that high-resolution phase maps using a CCD camera can be generated in a short time. A working system requires a interferometer, a PZT, and a detector array interfaced to a microcomputer. Results of measurements on the diffused test objects are described.

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