• Applied Microscopy
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• v.37 no.2
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• pp.111-121
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• 2007

Coefficient of spherical aberration of the objective lens in the KBSI-HVEM was evaluated by diffractogram method. Instrumental resolution was also discussed with this method. In order to improve the accuracy, digital processing and graphical curve fitting for intensity profile of diffractogram were employed. Experimental concerns where the optimal procedure of the measurement con be accomplished for this study were discussed. The spherical aberration coefficient $(C_s)$ was estimated to be $2.628{\pm}0.04\;mm$ from this study, which was almost coincident with the value of the manufacture's suggestion $(C_s=2.65\;mm)$.

• Korean Journal of Optics and Photonics
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• v.20 no.6
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• pp.311-318
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• 2009

We present an attractive real time in-vivo endoscopic microscope with a resolution of submicron, in which two kinds of optical correcting plates are inserted to eliminate higher order spherical aberration and field curvature. And, since the conventional objective lens is replaced to GRIN lenses with diameter of 1 mm, the above endoscopic microscope can be effectively utilized to invade minimally for live animals.

• Korean Journal of Optics and Photonics
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• v.18 no.2
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• pp.117-121
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• 2007

A fundamental problem in the in-line digital holography microscope is that the real image and virtual image and zero-order image are not separated spatially. In this paper, we have eliminated the zero-order noise by an averaging method and the twin image is divided using a geometrical set-up in an in-line digital holographic microscope. The size of the virtual image depends on the distance between the objective lens and the hologram plane and on the distance between the hologram plane and the image plane. We found that the virtual image size is smallest when the distance between the objective lens and the hologram plane is equal to the back focal length of the objective lens. We could divide the virtual image and real image by controlling the distance between the hologram plane and the objective lens.

• 한국전자현미경학회:학술대회논문집
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• 2004.05a
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• pp.69-73
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• 2004

• Proceedings of the Optical Society of Korea Conference
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• 2009.10a
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• pp.278-279
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• 2009

• Korean Journal of Optics and Photonics
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• v.31 no.6
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• pp.295-303
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• 2020

A Lister objective of NA 0.25 and 10×, stabilized against chromatic variation for a wavelength of 405 nm is designed. We develop a new solution for stabilizing a cemented doublet that has specified axial thicknesses. Using the new method, we can easily obtain a useful design for some practical purpose. At the initial design stage, two cemented doublets corrected independently are used. The stabilizing conditions for the whole system are maintained during optimization. The final design of the Lister objective shows that the chromatic variation of EFL, BFL, and RMS wavefront errors are very small at the 405-nm wavelength, as expected.

• Applied Microscopy
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• v.38 no.4
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• pp.285-291
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• 2008

We have evaluated the effects of experimental factors on transmitted electron beam intensities for quantitative analysis in electron tomography. For the correct application of Beer's law in electron tomography, the transmitted beam intensity should reflect the net effect of mass properties on beam path. So, the any other effects of the objective aperture and the specimen holder on beam path should be removed. The cut-off effects of objective aperture were examined using Quanti-foil holey carbon film and a transmission electron microscope operated at 120 kV. The transmitted beam intensities with $30{\mu}m$ objective aperture dropped about 16.7% compared to electron beam intensities without the objective aperture. Also, the additional losses of about 14.2% at high tilt angles were occurred by cut-off effects of the objective apertures. For the precise quantitative analysis in electron tomography, the effect of the objective aperture on transmitted electron beam intensities should be considered. It is desirable that 2-D tilt series images are obtained without the objective aperture for correct application of Bee's law.

• Proceedings of the Optical Society of Korea Conference
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• 2006.02a
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• pp.113-114
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• 2006

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2008.11a
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• pp.427-428
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• 2008

• Journal of the Korean Society for Precision Engineering
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• v.26 no.11
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• pp.92-98
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• 2009

The scanning electron microscope (SEM) contains an electron optical system in which electrons are emitted and moved to form a focused beam, and generates secondary electrons from the specimen surfaces, eventually making an image. The electron optical system usually contains two condenser lenses and an objective lens. The condenser lenses generate a magnetic field that forces the electron beams to form crossovers at desired locations. The objective lens then focuses the electron beams on the specimen. The present study covers the design and analysis of an objective lens for a thermionic SEM. A finite element (FE) analysis for the objective lens is performed to analyze its magnetic characteristics for various lens designs. Relevant beam trajectories are also investigated by tracing the ray path of the electron beams under the magnetic fields inside the objective lens.