• Proceedings of the Safety Management and Science Conference
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• 2010.04a
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• pp.537-548
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• 2010

현대의 산업은 점차 분야가 다양해지고 기술이 첨단화되며, 고객의 요구사항이 복잡해지고 있다. 이에 따라 현대의 첨단산업에서 제조파트는 제조기술의 초정밀, 극소불량, 고신뢰도가 요구되어지고 있는 실정이다. 이런 제조파트의 핵심 기술인 SPC기법 중에서 누적합(CUSUM) 관리도는 공정의 작은 변화에 대해서 민감하다는 장점 때문에 첨단 산업인 반도체나 화학공정 등에서 활용도가 높은 관리도 기법이다. 하지만 복잡한 이론 체계로 인하여 사용편리성이 떨어진다는 단점이 있어서 널리 사용되지는 못 하고 있는 실정이다. 본 논문에서는 누적합 관리도의 이론적 전개에 관한 체계적인 동향 분석을 통해 누적합 관리도의 복잡한 이론 체계를 이해하는데 도움을 주고 더 나아가 앞으로의 제조 기술의 방향성을 제시하고자한다.

• Journal of the Korea Society of Computer and Information
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• v.12 no.4
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• pp.201-207
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• 2007

In some manufacturing industries, there are many situation in which the simultaneous monitoring or control of two or more related quality characteristics is necessary. However, monitoring these two or more related quality characteristics independently can be very misleading. When several characteristics of manufactured component are to be monitored simultaneously, multivariate $x^2$ or $T^2$ control chart can be used. In this paper, establishing a early warning system(EWS) using multivariate control charts to analyze early out-of-control signals in melting process with many quality characteristics was presented. This module which we developed to control several characteristics improved efficiency and effectiveness of process control in the melting process.

• Journal of the Korea Society for Simulation
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• v.20 no.4
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• pp.67-79
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• 2011

The statistical process control (SPC) assumes that observations follow the particular statistical distribution and they are independent to each other. However, the time-series data do not always follow the particular distribution, and most of cases are autocorrelated, therefore, it has limit to adopt the general SPC in tim series process. In this study, we propose a MPBC (Model Parameter Based Control-chart) method for fault detection in time-series processes. The MPBC builds up the process as a time-series model, and it can determine the faults by detecting changes parameters in the model. The process we analyze in the study assumes that the data follow the ARMA (p,q) model. The MPBC estimates model parameters using RLS (Recursive Least Square), and $K^2$-control chart is used for detecting out-of control process. The results of simulations support the idea that our proposed method performs better in time-series process.

• Journal of radiological science and technology
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• v.45 no.6
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• pp.491-502
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• 2022

The purpose of this study was to retrospectively investigate the upper and lower control limits of treatment planning parameters using EBT film based delivery quality assurance (DQA) results and to analyze the results of statistical process control (SPC) in helical tomotherapy (HT). A total of 152 patients who passed or failed DQA results were retrospectively included in this study. Prostate (n = 66), rectal (n = 51), and large-field cancer patients, including lymph nodes (n = 35), were randomly selected. The absolute point dose difference (DD) and global gamma passing rate (GPR) were analyzed for all patients. Control charts were used to evaluate the upper and lower control limits (UCL and LCL) for all the assessed treatment planning parameters. Treatment planning parameters such as gantry period, leaf open time (LOT), pitch, field width, actual and planning modulation factor, treatment time, couch speed, and couch travel were analyzed to provide the optimal range using the DQA results. The classification and regression tree (CART) was used to predict the relative importance of variables in the DQA results from various treatment planning parameters. We confirmed that the proportion of patients with an LOT below 100 ms in the failure group was relatively higher than that in the passing group. SPC can detect QA failure prior to over dosimetric QA tolerance levels. The acceptable tolerance range of each planning parameter may assist in the prediction of DQA failures using the SPC tool in the future.

• Journal of the Korean Data and Information Science Society
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• v.21 no.5
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• pp.841-852
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• 2010

An integrated process control (IPC) procedure is a scheme which simultaneously applies the engineering control procedure (EPC) and statistical control procedure (SPC) techniques to reduce the variation of a process. In the IPC procedure, the observed deviations are monitored during the process where adjustments are repeatedly done by its controller. Because the effects of the noise, the special cause, and the adjustment are mixed, the use and properties of the SPC procedure for the out-of-control process are complicated. This paper considers efficiency of EWMA charts for detecting special causes in an ARMA(1,1) noise model with a minimum mean squared error adjustment policy. And we propose the readjustment procedure after having a true signal. This procedure can be considered when the elimination of the special cause is not practically possible.

• Journal of the Korean Data and Information Science Society
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• v.21 no.6
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• pp.999-1008
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• 2010

The objective of this paper is to develop variable sampling interval multivariate control charts that can offer significant performance improvements compared to standard fixed sampling rate multivariate control charts. Most research on multivariate control charts has concentrated on the problem of monitoring the process mean, but here we consider the problem of simultaneously monitoring both the mean and variability of the process.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.10
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• pp.103-112
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• 1998

The evolution of semiconductor manufacturing technology has accelerated the reduction of device dimensions and the increase of integrated circuit density. In order to improve yield within a short turn around time and maintain it at high level, a system that can rapidly determine problematic processing steps is needed. The statistical process control detects abnormal process variation of key parameters. Expert systems in SPC can serve as a valuable tool to automate the analysis and interpretation of control charts. A set of IF-THEN rules was used to formalize knowledge base of special causes. This research proposes a strategy to apply expert system to SPC in semiconductor manufacturing. In analysis, the expert system accomplishes the instability detection of process parameter, In diagnosis, an engineer is supported by process analyzer program. An example has been used to demonstrate the expert system and the process analyzer.

• The Korean Journal of Applied Statistics
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• v.16 no.1
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• pp.71-85
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• 2003

In the economic design of the process control procedure, where quality is measured at certain time intervals, its properties are difficult to derive due to the discreteness of the measurement intervals. In this paper a Markov chain representation of the process monitoring procedure is developed and used to derive its properties when the process follows an ARIMA(0,1,1) model, which is designed to describe the effect of the noise and the special cause in the process cycle. The properties of the Markov chain depend on the transition matrix, which is determined by the control procedure and the process distribution. The derived representation of the Markov chain can be adapted to most different types of control procedures and different kinds of process distributions by obtaining the corresponding transition matrix.

• The Korean Journal of Applied Statistics
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• v.10 no.2
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• pp.385-401
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• 1997

Cumulative sum (CUSUM) control charts are widely used in industry for the statistical process control. The statistical design procedure in CUSUM charts tells how to choose the decision interval value. The decision interval is primarily determied by the desired in - control ARL - that is, by the acceptable frequency of false out-of-control signals. In this paper we propose a new approximation method for calculating the ARL and determining the decision interval. The performance of the proposed method is examined by evaluating the accuracy of estimated ARLs and decision intervals in normal and exponential cases.

• Journal of the KSME
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• v.33 no.1
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• pp.47-65
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• 1993

판재의 스탬핑 성형성평가를 위해 소재제조업체와 자동차업체에서 널리 사용되고 있는 2,3개의 대표적인 모사실험과 컴퓨터 모드의 실험에 대하여 소개하였고 각각의 특징들에 대하여 논하 였다. 스탬핑금형의 개발과 연속생산공정에 있어서 성형한계선은 원형그리드해석기법과 함께 핀재의 성형난이도 평가 및 불량원인 규명과 조치에 유용하게 사용가능하다. 또한 돔장출실험과 평면변형장출실험에서 각각 얻어지는 한계돔높이와 한계펀치높이는 입하코일에 대한 스탬핑성 공여부의 사전확인 및 연속생산 공정에 대한 통계적 품질관리수단으로 활용하면 스탬핑공정에 서의 불량률감소 및 생산성향상에 기여할 수 있을 것으로 생각된다.