• Journal of the Korean Society of Radiology
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• v.14 no.5
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• pp.545-552
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• 2020

The purpose of this study is to derive a lead thickness calculation formula for direct-shielded doors based on NCRP Report No.151 and IAEA Safety Report Series N0.47. After deriving the dose rate calculation formula for the direct shielded door, this formula was substituted for the lead shielding thickness calculation formula to derive the shielding thickness calculation formula at the door. The lead shielding thickness calculated from the derived direct shielded door shielding thickness calculation formula was about 6% lower than that calculated by the NCRP and IAEA secondary barrier shielding thickness calculation methods. This result is interpreted as meaning that the thickness calculation is more conservative from the NCRP and IAEA secondary barrier shielding thickness calculation methods and fits well for secondary beam shielding. In conclusion, it is thought that the formula for calculating lead shielding thickness of the direct shielded door derived in this study can be usefully used in the shield design of the door.

• 대한방사선방어학회:학술대회논문집
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• 2011.11a
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• pp.366-367
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• 2011

• The Bulletin of The Korean Astronomical Society
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• v.37 no.2
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• pp.135.2-135.2
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• 2012

일반적으로 전자파챔버는 패러데이 케이지(Faraday Cage)라고 불리는 금속재질의 차폐구조물과 구조물 내부에서 발생할 수 있는 전자파의 반사를 억제하는 전파 흡수체로 구성되어 있다. 전자파 환경시험의 무결성을 유지하기 위해서는 챔버 내부에서 발생하는 전자기파가 외부로 나가는 것이 차단되어야 하며 역으로 챔버 외부에서 발생하는 전자기파도 챔버 내부로 유입되지 않도록 전자파챔버 차폐완결성이 유지되어야 한다. 이를 정량적으로 측정함으로서 전자파챔버의 차폐율(Shielding Effectiveness)이 정의될 수 있다. 이상적으로는 전자파챔버의 차폐구조물이 이음새 없이 완벽한 차폐완결성이 유지되어야 하나, 시험품의 이동을 위한 도어 및 외부 EGSE와 시험품간 전기적인 연결을 위한 포트 플레이트의 설치로 인해 완벽한 차폐완결성을 유지하는 것은 불가능하다. 따라서, 본 논문에서는 항공우주연구원에 설치된 전자파챔버의 일반 차폐면, 도어, 포트 플레이트에 대한 차폐율 측정을 통해 차폐율을 정량적으로 검증하였다. 또한, 본 측정 경험과 결과 분석은 전자파 챔버에서 이뤄지는 전자파환경시험의 신뢰성을 증진하고 향후 전자파 챔버 유지보수 및 대형 위성의 전자파 환경시험을 위한 대형 전자파 시험시설의 성능시험을 위해 활용될 수 있을 것이다.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.39 no.9
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• pp.831-837
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• 2015

Many persons and electronic devices are exposed to electromagnetic (EM) waves generated from magnetic resonance imaging (MRI) equipment, EM pulses (EMPs), and many other kinds of EM wave devices. Finger strips are used to provide shielding from these EM waves. Because of the high thermal conductivity of finger strips, they are used in the design of specialized doors that are installed in shielded rooms. In this study, we perform an accelerated life test using the load acceleration stress, which affects the main failure mode of finger strips. We predict the life of the finger strip under normal usage conditions based on the results of the accelerated life test. We compare the results with those predicted from the life test under normal usage conditions to evaluate the validity of accelerated life testing.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.41 no.9
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• pp.887-895
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• 2017

This paper presents a study on the accelerated life tests of parts that operate during the opening and closing of door frames, particularly door hinges. Hinge theoretical verification and validation of the test equipment in the present study and the different structures and fault mode, depending on the purpose of usage analysis, failure mode for one of the hinges of the switchgear components used for electromagnetic shielding facilities and on-site operating conditions. The accelerated life test was designed for the characteristic lifetime prediction of the components, by estimating the shape parameter and the acceleration factor.