A Method for Evaluating the Temperature Coefficient of a Compound Semiconductor Energy Gap by Infrared Imaging Technique (적외선 영상기법에 의한 화합물 반도체 에너지갭의 온도계수 측정 방법)
-
- Journal of the Institute of Electronics Engineers of Korea SD
- /
- v.38 no.5
- /
- pp.338-346
- /
- 2001