• Title/Summary/Keyword: 장치공간할당

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A Study on MAC Protocol Design for Mobile Healthcare (모바일 헬스케어를 위한 MAC 프로토콜 설계에 관한 연구)

  • Jeong, Pil-Seong;Kim, Hyeon-Gyu;Cho, Yang-Hyun
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.19 no.2
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    • pp.323-335
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    • 2015
  • Mobile healthcare is a fusion of information technology and biotechnology and is a new type of health management service to keep people's health at anytime and anywhere without regard to time and space. The WBAN(Wireless Body Area Network) technology that collects bio signals and the data analysis and monitoring technology using mobile devices are essential for serving mobile healthcare. WBAN consisting of users with mobile devices meet another WBAN during movement, WBANs transmit data to the other media. Because of WBAN conflict, several nodes transmit data in same time slot so a collision will occur, resulting in the data transmission being failed and need more energy for re-transmission. In this thesis, we proposed a MAC protocol for WBAN with mobility to solve these problems. First, we proposed a superframe structure for WBAN. The proposed superframe consists of a TDMA(Time Division Muliple Access) based contention access phase with which a node can transmit data in its own time slot and a contention phase using CSMA/CA algorithm. Second, we proposed a network merging algorithm for conflicting WBAN based on the proposed MAC protocol. When a WBAN with mobility conflicts with other WBAN, data frame collision is reduced through network reestablishment. Simulations are performed using a Castalia based on the OMNeT++ network simulation framework to estimate the performance of the proposed superframe and algorithms. We estimated the performance of WBAN based on the proposed MAC protocol by comparing the performance of the WBAN based on IEEE 802.15.6. Performance evaluation results show that the packet transmission success rate and energy efficiency are improved by reducing the probability of collision using the proposed MAC protocol.

A Study on the Methods of Building Tools and Equipment for Digital Forensics Laboratory (디지털증거분석실의 도구·장비 구축 방안에 관한 연구)

  • Su-Min Shin;Hyeon-Min Park;Gi-Bum Kim
    • Convergence Security Journal
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    • v.22 no.5
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    • pp.21-35
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    • 2022
  • The use of digital information according to the development of information and communication technology and the 4th industrial revolution is continuously increasing and diversifying, and in proportion to this, crimes using digital information are also increasing. However, there are few cases of establishing an environment for processing and analysis of digital evidence in Korea. The budget allocated for each organization is different and the digital forensics laboratory built without solving the chronic problem of securing space has a problem in that there is no standard that can be referenced from the initial configuration stage. Based on this awareness of the problem, this thesis conducted an exploratory study focusing on tools and equipment necessary for building a digital forensics laboratory. As a research method, focus group interviews were conducted with 15 experts with extensive practical experience in the digital forensic laboratory or digital forensics field and experts' opinions were collected on the following 9 areas: network configuration, analyst computer, personal tools·equipment, imaging devices, dedicated software, open source software, common tools/equipment, accessories, and other considerations. As a result, a list of tools and equipment for digital forensic laboratories was derived.

A Burn-in Test System with Dynamic Bone Allocation (동적 존 할당이 가능한 번인 시험 시스템)

  • Oh, Sam-Kweon;Shin, Joong-Han
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.10 no.1
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    • pp.75-80
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    • 2009
  • Bum-in test is one for eliminating semiconductor devices that are subject to early failures and other operational problems; it is usually carried out on the devices by imposing severe test conditions such as elevated voltages, temperatures, and time. In order for such a test to be performed, each burn-in board having devices to be tested, needs to be inserted into a corresponding slot. A set of such slots is called a zone. The slots comprising a zone can only have the burn-in boards with the devices of the same type. In order to test many different types of semiconductor devices, it is desirable to build a burn-in test system to have as many zones as possible. A zone controller controlling a zone, is a device that performs a burn-in test and collects test results. In case of existing systems, each zone controller takes care of a zone that consists of a fixed number of slots. Since a zone controller is, in most cases, embedded into a workstation that controls the overall testing process, adding new zone controllers is restricted by the spaces for them. As a way to solve or alleviate these problems, a dynamic zone system in which the number of slots in a zone can be dynamically allocated, is presented. This system maximizes the efficiency of system utilization, by altering the number of slots and hence minimizing the idle slots of a zone. In addition, all the test operations being performed must be aborted for maintenance in existing systems. In dynamic zone systems, however, a separate and independent maintenance is allowed for each slot, as long as the main power supply system has no problem.