• Journal of KIISE
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• v.43 no.9
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• pp.998-1007
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• 2016

In recent years, the cost of automotive ECU (Electronic Control Unit) has accounted for more than 30% of total car production cost. However, the complexity of testing and debugging an automotive ECU is increasing because automobile manufacturers outsource automotive ECU production. Therefore, a large amount of cost and time are spent to localize faults during testing an automotive ECU. In order to solve these problems, we propose a fault localization method in memory for developers who run the integration testing of automotive ECU. In this method, memory is partitioned by utilizing memory map, and fault-suspiciousness for each partition is calculated by utilizing memory update information. Then, the fault-suspicious region for partitions is decided based on calculated fault-suspiciousness. The preliminary result indicated that the proposed method reduced the fault-suspicious region to 15.01(%) of memory size.

• KIPS Transactions on Software and Data Engineering
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• v.5 no.12
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• pp.641-652
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• 2016

This paper proposes a method to generate test scripts in an automatic manner, based on checklist used for testing embedded systems in the fields. The proposed method can reduce the mistakes which may be introduced during manual generation. In addition, it can generate test scripts to test various mode combinations, which is not possible to be tested by the typical checklist. The test commands in a checklist are transformed into a test script suit referencing the signal values defined in a test command dictionary. In addition, the method to generate test scripts in sequential, double permutation and random manners is proposed useful to test the inter-operations between modes, a series of operations for a specific behavior. The proposed method is implemented and the feasibility is shown through the experiments.

• KIPS Transactions on Software and Data Engineering
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• v.6 no.8
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• pp.401-410
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• 2017

This paper proposes a method to generate test cases in an automatic manner, based on checklist containing test cases used for testing embedded systems. In general, the items to be tested are defined in a checklist. However, most test case generation strategies recommend to test a system with not only the defined test items but also various mutated test conditions. The proposed method parses checklist in Korean file and figures out the system inputs and outputs, and operation information. With the found information and the user defined test case generation strategy, the test cases are automatically generated. With the proposed method, the errors introduced during manual test case generation may be reduced and various test cases not defined in checklist can be generated. The proposed method is implemented and the experiment is performed with the checklist for an medical embedded system. The feasibility of the proposed method is shown through the test cases generated from the checklist. The test cases are adequate to the coverages and their statistics are correct.