• Title/Summary/Keyword: 이온 밀링 시스템

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Fabrication and Performance of Electron Cyclotron Resonance Ion Milling System for Etching of Magnetic Film Device (자성박막 소자 에칭용 전자 사이클로트론 공명 이온밀링 시스템 제작과 특성연구)

  • Lee, Won-Hyung;Hwang, Do-Guwn;Lee, Sang-Suk;Rhee, Jang-Roh
    • Journal of the Korean Magnetics Society
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    • v.25 no.5
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    • pp.149-155
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    • 2015
  • The ECR (Electron Cyclotron Resonance) Ar ion milling was manufactured to fabricate the device of thin film. The ECR ion milling system applied to the device etching operated by a power of 600W, a frequency of 2.45 GHz, and a wavelength of 12.24 cm and transferred by a designed waveguide. In order to match one resonant frequency, a magnetic field of 908 G was applied to a cavity inside of ECR. The Ar gas intruded into a cavity and created the discharged ion beam. The surface of target material was etched by the ion beam having an acceleration voltage of 1000 V. The formed devices with a width of $1{\mu}m{\sim}9{\mu}m$ on the GMR-SV (Giant magnetoresistance-spin valve) multilayer after three major processes such as photo lithography, ion milling, and electrode fabrication were observed by the optical microscope.

Surface Milling for the Study of Pore Structure in Shale Reservoirs (셰일 저류층 내 공극 구조 연구를 위한 표면 밀링)

  • Park, Sun Young;Choi, Jiyoung;Lee, Hyun Suk
    • Korean Journal of Mineralogy and Petrology
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    • v.33 no.4
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    • pp.419-426
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    • 2020
  • Understanding the pore structure including pore shape and connectivity in unconventional reservoirs is essential to increase the recovery rate of unconventional energy resources such as shale gas and oil. In this study, we found analysis condition to probe the nanoscale pore structure in shale reservoirs using Focused Ion Beam (FIB) and Ion Milling System (IMS). A-068 core samples from Liard Basin are used to probe the pore structure in shale reservoirs. The pore structure is analyzed with different pretreatment methods and analysis condition because each sample has different characteristics. The results show that surface milling by FIB is effective to obtain pore images of several micrometers local area while milling a large-area by IMS is efficient to observe various pore structure in a short time. Especially, it was confirmed that the pore structure of rocks with high content of carbonate minerals and high strength can be observed with milling by IMS. In this study, the analysis condition and process for observing the pore structure in the shale reservoirs is established. Further studies are needed to perform for probing the effect of pore size and shape on the enhancement of shale gas recovery.

Application and Development of Focused Ion Beams (집속 이온빔의 응용 및 개발)

  • 강승언
    • Journal of the Korean Vacuum Society
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    • v.2 no.3
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    • pp.304-313
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    • 1993
  • 집속 이온빔 기술은 고해상도의 이온빔 리토그라피, 마스크가 필요없는 이온주입, 그리고 Ion beam induced deposition 등 반도체 소자의 미세가공에 널리 이용되어 왔다. 좋은 안정도와 높은 전류밀도, 적은 에너지 퍼짐 그리고 낮은 에미턴스와 높은 선명도를 갖는 집속 이온빔 장비를 위한 액체 갈륨 이온원이 한국에서 개발 시업되었다. 이온빔의 전압이 15kV, 렌즈전압이 7kV 그리고 렌즈상단에 위치한 aperture의 직경이 0.2mm일 때, 0.1$mu extrm{m}$의 빔 직경으로 집속되는 정전 einzel렌즈가 설계 조립되었고, FIB 진공 chamber는 렌즈부와의 차 등 진공시스템으로 구성되어 설계제작되었다. FIB 장비가 조만간 한국에서 이온빔 밀링, ion beam induced deposition 그리고 잘못된 부분의 수정 등 반도체 제작공정에서의 응용에 큰 기여를 할 것이라 기대된다.

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Cutting performance of Cr-Al-Si-N micro end-mill tool deposited by a hybrid coatings (하이브리드 코팅에 의한 Cr-Al-Si-N 마이크로 엔드밀공구의 가공성능)

  • Gang, Myeong-Chang;Sin, Seok-Hun;Kim, Min-Uk;Tak, Hyeon-Seok;Kim, Gwang-Ho;Kim, Jeong-Seok
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2009.05a
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    • pp.211-211
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    • 2009
  • 높은 이온화율과 복잡한 형상의 모재에도 표면 도포성 및 균일성을 나타내는 아크이온플래이팅 기술과 비전도성 세라믹 타겟물질에 적용가능한 스퍼터링 기술이 결합된 하이브리드 코팅 시스템(Hybrid coating system)을 이용하였다. 그리고 Cr-Al-N과 Cr-Si-N 코팅막의 강화 기구를 복합시킨 새로운 개념의 Cr-Al-Si-N 코팅막을 초경(WC-Co)시험편에 증착하여 Si 첨가량에 따른 미세구조의 미세경도 특성을 파악하였다. 공구성능 평가는 고속가공조건하에 마이크로 밀링기에서 무코팅(초경공구), Cr-Al-Si-N (Si : 0, 4.5, 8.7, 16 at.%) 코팅 마이크로엔드밀에 대하여 공구마멸에 대한 공구수명을 비교, 평가하였다.

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Applications of Focused Ion Beam for Biomedical Research (의생물 연구 분야에서 집속이온빔장치의 응용)

  • Kim, Ki-Woo;Baek, Saeng-Geul;Park, Byung-Joon;Kim, Hyun-Wook;Rhyu, Im-Joo
    • Applied Microscopy
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    • v.40 no.4
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    • pp.177-183
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    • 2010
  • A focused ion beam (FIB) system produces a beam of positive ions (usually gallium) which are heavier than electrons and can be focused by electrostatic lenses into a spot on the specimen. With its ability milling of the specimen material by 10 to 100 nm with each pass of the beam, FIB is widely adopted in materials science, semiconductor industry, and ceramics research. Recently, FIB has been increasingly employed in the field of biomedical sciences. Here we provide a brief introduction to FIB and its applications for a wide variety of biomedical research. The surface of specimen can be in situ processed and quasi-real time visualized by two beam combination of FIB and field emission scanning electron microscope (FESEM). Due to its milling process, internal structures can be exposed and analyzed: yeast cells, fungus-inoculated wheat leaf, mannitol particles in inhalation aerosols, and oyster shell. Serial blockface tomography with the system kindles 3-dimensional reconstruction researches in the realm of nervous system and life sciences. Two-beam system of FIB/FESEM is a versatile tool to be utilized in the biomedical sciences, especially in 3-dimensional reconstruction studies.