• 한국정밀공학회지
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• 제18권7호
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• pp.149-154
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• 2001

This study discusses a non-contact optical technique, electronic speckle pattern interferometry(ESPI), that is well suited for a deformation measurement of structure. Phase shifting method and unwrapping method have used to make deformation quantitative widely. In this paper, a previous numerical formula for phase shifting method is reconstructed in addition to least square fitting method to improve sensitivity and phase unwrapping based on vertical-horizontal scanning method is applied to analyze in-plane and out-of-plane deformation quantitatively.

• 소음진동
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• 제9권3호
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• pp.509-516
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• 1999

The ESPI (Electronic Speckle Pattern Interferometry) algorithm has been simulated to calculate vibrational modes of a thin right-angled STS304 plate. The phase transformation of the reference wave of the ESPI is carried out only one time during vibration in order to clarify ESPI speckle patterns. Two dimensional vibrational modes are calculated from one ESPI pattern before vibration onset and two ESPI patterns during vibrations but with and without the phase transformation. The ESPI harmonic results are compared with those derived from the finite element method (FEM), and they agree very well. Additionally a phase unwrapping algorithm has been newly developed to derive a displacement map from an ESPI phase map.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2000년도 추계학술대회 논문집
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• pp.93-96
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• 2000

This study discusses a non-contact optical technique, phase shifting electronic speckle pattern interferometry, that is well suited for a deformation measurement. However, the phase shifting method has difficulties for determinating a deformation quantitatively beacuse of the characteristics of arctan function. In order to solve this problem, phase unwrapping methods has been studied during the last few years. In this study, using phase unwrapping based on line by line scanning phase shifted fringe patterns are studied to determinate a deformation quantitatively. Also least square fitting method is applied to reduce noise and improve image resolution.