• Transactions of the Korean Society of Mechanical Engineers A
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• v.41 no.8
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• pp.721-728
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• 2017

High-grade gray cast iron (HCI350) was prepared by adding Cr, Mo and Cu to the gray cast iron (GC300). Their microstructure, mechanical properties and fatigue strength were studied. Cast iron was made from round bar and plate-type castings, and was cut and polished to measure the percentage of each microstructure. The size of flake graphite decreased due to additives, while the structure of high density pearlite increased in volume percentage improving the tensile strength and fatigue strength. Based on the fatigue life data obtained from the fatigue test results, the probability - stress - life (P-S-N) curve was calculated using the 2-parameter Weibull distribution to which the maximum likelihood method was applied. The P-S-N curve showed that the fatigue strength of HCI350 was significantly improved and the dispersion of life data was lower than that of GC300. However, the fatigue life according to fatigue stress alleviation increased further. Data for reliability life design was presented by quantitatively showing the allowable stress value for the required life cycle number using the calculated P-S-N curve.

• Journal of Korean Tunnelling and Underground Space Association
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• v.25 no.6
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• pp.509-523
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• 2023

The high-level nuclear waste (HLW) repository is exposed to complex environmental conditions consisting of high temperature, high humidity, and radiation, resulting in structural deterioration. Therefore, structural health monitoring is essential, and piezo sensors are used to detect cracks and estimate strength. However, since the monitoring sensors installed in the disposal tunnel and disposal container cannot be replaced or removed, the quantitative life of the monitoring sensor and its suitability must be assessed. In this study, the life of a piezo sensor for monitoring was assessed using an accelerated life test (ALT). The failure mode and mechanism of the piezo sensor under high temperature conditions were determined, and temperature stress's influence on the piezo sensor's life was analyzed. ALT was conducted on temperature stress and the relationship between temperature stress and piezo sensor life was suggested. The life of the piezo sensor was assessed using the Weibull probability distribution and the Arrhenius acceleration model. The suggested relationship can be used in multiple stress ALT designs for more precise life assessment.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.17 no.8
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• pp.62-68
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• 2016

The feeder cable assembly is an automotive part used for telecommunication. If it malfunctions, the control and safety of the automobile can be put at risk. ALT (Accelerated Life Testing) is a testing process for products in which they are subjected to conditions (stress, strain, temperatures, etc.) in excess of their normal service parameters in an attempt to uncover faults and potential modes of failure in a short amount of time. Failure is caused by defects in the design, process, quality, or application of the part, and these defects are the underlying causes of failure or which initiate a process leading to failure. Thermal shock occurs when a thermal gradient causes different parts of an object to expand by different amounts. Thermal shock testing is performed to determine the ability of parts and components to withstand sudden changes in temperature. In this research, the main causes of failure of the feeder cable assembly were snapping, shorting and electro-pressure resistance failure. Using the Coffin-Manson model for ALT, the normal conditions were from Tmax = $80^{\circ}C$ to Tmin = $-40^{\circ}C$, the accelerated testing conditions were from Tmax = $120^{\circ}C$ to Tmin = $-60^{\circ}C$, the AF (Acceleration Factor) was 2.25 and the testing time was reduced from 1,000 cycles to 444 cycles. Using the Bxlife test, the number of samples was 5, the required life was B0.04%.10years, in the acceleration condition, 747 cycles were obtained. After the thermal shock test under different conditions, the feeder cable assembly was examined by a network analyzer and compared with the Weibull distribution modulus parameter. The results obtained showed good results in acceleration life test mode. For the same reliability rate, the testing time was decreased by a quarter using ALT.

• Korean journal of applied entomology
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• v.55 no.2
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• pp.119-128
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• 2016

This study was conducted to develop temperature-driven models for a population model of turnip aphid, Lipaphis erysimi: nymphal development rate models and apterious adult's oviposition (larviparous) model. Nymphal development and the longevity and fecundity of adults were examined on cabbage at six constant temperatures (10, 15, 20, 25, 30, $35{\pm}1^{\circ}C$, 16L:8D). L. erysimi nymphs did not survive at $10^{\circ}C$. Development time of nymphs increased with increasing temperature up to $30^{\circ}C$ and thereafter slightly decreased, ranging from 18.5 d at $15^{\circ}C$ to 5.9 d at $30^{\circ}C$. The lower threshold temperature and thermal constant were estimated as $7.9^{\circ}C$ and 126.3 degree days, respectively. The nonlinear model of Lactin 2 fitted well for the relationship between the development rate and temperature of small (1+2 instar), large (3+4 instar) and total nymph (all instars). The Weibull function provided a good fit for the distribution of development times of each stage. Temperature affected the longevity and fecundity of L. erysimi. Adult longevity decreased as the temperature increased and ranged from 24.4 d at $20^{\circ}C$ to 16.4 d at $30.0^{\circ}C$ with abnormal longevity 18.2 d at $15^{\circ}C$, which was used to estimate adult aging rate model for the calculation of adult physiological age. L. erysimi showed a maximum fecundity of 91.6 eggs per female at $20^{\circ}C$. In this study, we provided three temperature-dependent components for an oviposition model of L. erysimi: total fecundity, age-specific cumulative oviposition rate, and age-specific survival rate.

• Journal of the Korean Vacuum Society
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• v.21 no.5
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• pp.273-278
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• 2012

Over the last decade, the hafnium-based gate dielectric materials have been studied for many application fields. Because these materials had excellent behaviors for suppressing the quantum-mechanical tunneling through the thinner dielectric layer with higher dielectric constant (high-K) than $SiO_2$ gate oxides. Although high-K materials compensated the deterioration of electrical properties for decreasing the thickness of dielectric layer in MOSFET structure, their nano-mechanical properties of $HfO_2$ thin film features were hardly known. Thus, we examined nano-mechanical properties of the Hafnium oxide ($HfO_2$) thin film in order to optimize the gate dielectric layer. The $HfO_2$ thin films were deposited by rf magnetron sputter using hafnium (99.99%) target according to various oxygen gas flows. After deposition, the $HfO_2$ thin films were annealed after annealing at $400^{\circ}C$, $600^{\circ}C$ and $800^{\circ}C$ for 20 min in nitrogen ambient. From the results, the current density of $HfO_2$ thin film for 8 sccm oxygen gas flow became better performance with increasing annealing temperature. The nano-indenter and Weibull distribution were measured by a quantitative calculation of the thin film stress. The $HfO_2$ thin film after annealing at $400^{\circ}C$ had tensile stress. However, the $HfO_2$ thin film with increasing the annealing temperature up to $800^{\circ}C$ had changed compressive stress. This could be due to the nanocrystal of the $HfO_2$ thin film. In particular, the $HfO_2$ thin film after annealing at $400^{\circ}C$ had lower tensile stress, such as 5.35 GPa for the oxygen gas flow of 4 sccm and 5.54 GPa for the oxygen gas flow of 8 sccm. While the $HfO_2$ thin film after annealing at $800^{\circ}C$ had increased the stress value, such as 9.09 GPa for the oxygen gas flow of 4 sccm and 8.17 GPa for the oxygen gas flow of 8 sccm. From these results, the temperature dependence of stress state of $HfO_2$ thin films were understood.