A TFT-LCD Defect Detection Method based on Defect Possibility using the Size of Blob and Gray Difference (블랍 크기와 휘도 차이에 따른 결함 가능성을 이용한 TFT-LCD 결함 검출)
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- Journal of Korea Society of Industrial Information Systems
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- v.19 no.6
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- pp.43-51
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- 2014