• Title/Summary/Keyword: 열증발법

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Spectroscopic Characterization of 400℃ Annealed ZnxCd1-xS Thin Films (400℃ 열처리한 삼원화합물 ZnxCd1-xS 박막의 분광학적 특성 연구)

  • Kang, Kwang-Yong;Lee, Seung-Hwan;Lee, Nam-Kwon;Lee, Jeong-Ju;Yu, Yun-Sik
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.26 no.1
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    • pp.101-112
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    • 2015
  • II~VI compound semiconductors, $Zn_xCd_{1-x}S$ thin films have been synthesized onto indium-tin-oxide(ITO) coated glass substrates using thermal evaporation technique. The composition ratio x($0{\leq}x{\leq}1$) was varied to fabricate different kinds of $Zn_xCd_{1-x}S$ thin films including CdS(x=0) and ZnS(x=1) thin films. Then, the deposited thin films were thermally annealed at $400^{\circ}C$ to enhance their crystallinity. The chemical composition and electronic structure of films were investigated by using X-ray photoelectron spectroscopy(XPS). The optical energy gaps of the samples were determined by ultra violet-visible-near infrared(UV-Vis-NIR) spectroscopy and were found to vary in the range of 2.44 to 3.98 eV when x changes from 0 to 1. Finally, we measured the THz characteristics of the $Zn_xCd_{1-x}S$ thin films using THz-TDS(time domain spectroscopy) system to identify the capability for electronic and optical devices in THz region.

A Study on the Carbothermic Reduction of Nb-Oxide and the refining by Ar/Ar-$H_2$ plasma and Hydrogen solubility of Nb metal (Ar/Ar-$H_2$ 플라즈마에 의한 Nb금속제조와 Nb금속의 수소용해)

  • Jeong, Yong-Seok;Hong, Jin-Seok;Kim, Mun-Cheol;Baek, Hong-Gu
    • Korean Journal of Materials Research
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    • v.3 no.6
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    • pp.565-574
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    • 1993
  • The Ar/Ar- $H_{2}$ plasma method Lvas applied to reduce and refine high purity Nb metal. Inaddition, the reaction between molten Nb metal and hydrogen were also analyzed in the Ar-(20%)$H_{2}$plasma. The metallic Nb of 99.5wt% was obtained at the ratio of $C/Nb_{2}O_{5}$=5.00 in the Ar plasma reductionand the $O_2$ loss from the thermal decomposition of niobium oxides did not take place. In the Ar-(20%)Hi plasma the metallic Nb of 99.8wt% was produced at the ratio of $C/Nb_{2}O_{5}$=4.80. It was observedthat a major reaction of the deoxidation was the reaction with H, Hi, and a deoxidation by the evaporationof $NbO_x$ did not occur but a mass loss of Nb did by a "splash" effect. The deoxidation reaction rateobeyed the 1st order reaction kinetics and the reaction rate constant(k') of deoxidation was $7.8 \times 10_{-7}$(m/sec).The solubility of hydrogen in Nb metal was 60ppm and it was larger than the solubility of molecularstate hydrogen by 40ppm in the Ar-(20%)$H_{2}$ plasma method. A saturation was within 60sec anda hydrogen content was reduced below lOppm by a Ar plasma re-treatment.by a Ar plasma re-treatment.

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AC impedance study on the interface between organic electrolyte and amorphous $WO_3$ thin film relating to the electrochemical intercalation of lithium (비정질 $WO_3$ 박막과 전해질 계면에서의 리튬 층간 반응의 교류 임피던스 해석)

  • Kim Byoung-Chul;Ju Jeh-Beck;Sohn Tae-Won
    • Journal of the Korean Electrochemical Society
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    • v.1 no.1
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    • pp.33-39
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    • 1998
  • To AC impedance study was performed in this study on the interfacial reaction between organic electrolyte and amorphous tungsten oxides thin film, cathodically coloring oxide, prepared by e-beam evaporation method in the 1 M $LiClO_4/PC$ organic solution. The electrochemical reactions at the interface were analyzed by the transient method and the complex impedance spectroscopy. The impedance spectrums showed that the electro-chemical intercalation of lithium cations was consisted of the following three steps; the first step, the charge transfer reaction of lithium cation at the interface between amorphous tungsten oxides thin film and the organic electrolyte, the second step, the adsorption of lithium atom on the surface of amorphous tungsten oxides thin film, and then the third step, the absorption and the diffusion of lithium atom into amorphous tungsten oxides thin layer. The bleaching and the coloring characteristics of amorphous tungsten oxides thin film were explained in terms of thermodynamic and kinetic variables, the simulated $R_{ct},\;C_{dl},\;D$ and $\sigma_{Li}$ by CNLS fitting method. Especially it was found that the limiting values of electrochromic reaction were the molar ratio of lithium, y=0.167 and the electrode potential, E=2.245 V (vs. Li).

Estimation of Specific Yield Using Rainfall and Groundwater Levels at Shallow Groundwater Monitoring Sites (충적층 지하수 관측지점의 강우량 대비 지하수위 변동 자료를 활용한 비산출율 추정)

  • Kim, Gyoobum
    • Journal of the Korean GEO-environmental Society
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    • v.11 no.6
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    • pp.57-67
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    • 2010
  • Specific yield is an essential parameter of the water table fluctuation method for recharge calculation. Specific yield is not easily estimated because of limited availability of aquifer test data and soil samples at National Groundwater Monitoring Stations in South Korea. The linear relationship between rainfall and water level rise was used to estimate the specific yields of aquifer for 34 shallow monitoring wells which were grouped into three clusters. In the case of Cluster-1 and Cluster-2, this method was not applicable because of low cross correlation between rainfall and water level rise and also a long lag time of water level rise to rainfall. However, the specific yields for 19 monitoring wells belonging to Cluster-3, which have relatively high cross correlation and short lag time, within 2 days after rainfall, range from 0.06 to 0.27 with mean value of 0.17. These values are within the general range for sand and gravel sediments and similar to those from aquifer test data. A detailed field survey is required to identify monitoring sites that are not greatly affected by pumping, stream flow, evapotranspiration, or delayed response of water levels to rainfall, because these factors may cause overestimation of specific yield estimates.

Effects of Sodium and Gallium on Characteristics of CIGS Thin Films and CdS/CIGS Solar Cells by Co-evaporation Method (Na확산과 Ga첨가에 따른 동시진공증발법으로 제조된 CIGS 박막과 CdS/CIGS 태양전지의 특성)

  • Kwon, S.H.;Lee, J.C.;Kang, K.H.;Kim, S.K.;Yoon, K.H.;Song, J.S.;Lee, D.Y.;Ahn, B.T.
    • Solar Energy
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    • v.20 no.2
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    • pp.43-54
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    • 2000
  • We prepared and characterized $Cu(In_{1-x}Ga_x)Se_2$(CIGS) films using a elemental co-evaporation method for absorbing layer of high efficiency thin film solar cells. The CIGS films deposited on a soda-lime glass exhibited low resistivity because of higher carrier concentration. Na was accumulated at the CIGS surface and the 0 and Se were also accumulated at the surface, suggesting that oxidation is a driving force of Na accumulation. The structure of CIGS film was modified or a secondary phase was formed in the Cu-poor CIGS bulk films probably due to the incorporation of Na into Cu vacancy sites. As the Ga/(In+Ga) ratio increased, the diffraction peaks of $Cu(In_{1-x}Ga_x)Se_2$ films were shifted to larger angle and splitted, and the grain size of $Cu_{0.91}(In_{1-x}Ga_x)Se_2$ films became smaller. All $Cu_{0.91}(In_{1-x}Ga_x)Se_2$ films showed the p-type conductivity regardless of the Ga/(In+Ga) ratio. Ag/n-ZnO/i-ZnO/CdS/$Cu_{0.91}(In_{0.7}Ga_{0.3})Se_2$/Mo solar cells were fabricated. The currently best efficiency in this study was 14.48% for $0.18cm^2$ area ($V_{oc}=581.5mV,\;J_{sc}=34.88mA$, F.F=0.714).

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Interface study of ion irradiated Cu/Ni/Cu(001)/Si thin film by X-ray reflectivity (이온 조사된 Cu/Ni/Cu(001)/Si 자성박막에 있어서 X-ray reflectivity를 이용한 계면 연구)

  • Kim, T.G.;Song, J.H.;Lee, T.H.;Chae, K.H.;Hwang, H.M.;Jeon, G.Y.;Lee, J;Jeong, K.;Whang, C.N.;Lee, J.S.;Lee, K.B.
    • Journal of the Korean Magnetics Society
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    • v.12 no.5
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    • pp.184-188
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    • 2002
  • The Cu/Ni/Cu(002)/Si(100) films which have perpendicular magnetic anisotropy were deposited by e-beam evaporation methods. From the reflection high energy electron diffraction pattern, the films were confirmed to be grown epitaxially on silicon. After 2X lots ions/$\textrm{cm}^2$ C+ irradiation, magnetic easy-axis was changed from surface normal to in-plane as shown in the hysteresis loop of magneto-optical Kerr effects. It became manifest from analysis of X-ray reflectivity and grazing incident X-ray diffraction that even though interface between top Cu layer and Ni layer became rougher, the contrast of Cu and Ni's electron density became manifest after ion irradiation. In addition, the strain after deposition of the films was relaxed after ion irradiation. Strain relaxation related with change of magnetic properties and mechanism of intermixed layer's formation was explained by thermo-chemical driving force due to elastic and inelastic collision of ions.

Effect of Residual Chloride Ion on Thermal Decomposition Behaviour os Stannic Acid and Physical Properties of $SnO_2$ Powder Fabricated for Gas Sensor (가스센서용 $SnO_2$분말 제조시 잔류 염소이온이 Sn수화물의 열분해거동 및 분말물성에 미치는 영향)

  • Song, Guk-Hyeon;Choe, Byeong-U;Park, Jae-Hwan;Park, Sun-Ja
    • Korean Journal of Materials Research
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    • v.4 no.8
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    • pp.934-944
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    • 1994
  • Effects of residual chloride on thermal decomposition behaviour of a-stannic acid and physical properties of $SnO_{2}$ powder were observed. The powder was fabricated by hydroxide method; $\alpha$-stannic acid was precipitated by mixing acqueous solutions of $SnCl_{4}$ and $NH_{4}$OH . The precipitate was washed with $NH_{4}NO_{3}$ solution while washing was controlled to be of three grades to modify its residual chloride content. The precipitate was dried at $1100^{\circ}C$ ~ 24h and calcined in air at $500^{\circ}C$ ~ $1100^{\circ}C$ for one hour. Thermal decomposition behaviour of $\alpha$-stannic acid was examined by a DT-TGA and a FTIR. Chemical composition and physical properties of $SnO_{2}$ powder were observed by an AES, a BET and a TEM, respectively. With a reduction in chloride content, the relative crystallite size of $SnO_{2}$ powder slightly increased by a low-temperature-calcining. However, at a high calcining temperature(T), the reverse relation occured. It was suggested that chloride ion replaces part of lattice oxygen site of a-stannic acid. Also, chloride ion on the site was suggested to retard de-hydration as well as crystalization at a low T while to promote crystal growth of $SnO_{2}$ by forming oxygen vacancy at a high T.

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Electrical properties of CuInSe2 thin films formed by selenization of RF sputtered Cu-In-Se2 precursors for solar cell applications (Cu-In-Se2 전구체의 Selenization에 의해 형성된 CuInSe2 박막의 태양전지 응용을 위한 전기적 특성평가)

  • Jeong, Chaehwan;Park, Chanyoung;Kim, Jinhyeok;Lee, Suk Ho
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.06a
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    • pp.79-79
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    • 2010
  • 다른 물질에 비해 많은 우수한 특성을 가지고 있는 CuInSe2(CIS)박막 태양전지는 많은 연구자들에 의해 개발되어 오고 있다. CIS의 대표적인 장점으로는 직접천이형 밴드갭, 높은 흡수계수, 열 안정화상태 및 p형으로의 전도성물질의 가능성 등 다양하다. 또한 간단한 구조를 이용하여 유리같은 싼 기판을 이용하기 때문에 저가형 태양전지로서 많은 각광을 받고 있다. CIGS태양전지는 CIS의 In 사이트에 Ga을 도핑함으로서 만들어지는데 밴드갭은 약 1.4eV이다. CIS박막을 만드는 많은 방법이 존재하나 구성원소로부터 최적화된 조성을 찾을수 있는 방법이 가장 중요한 요소 중의 하나로 인식되고 있으며, 이런점에서 증발법 및 스퍼터링법 등 같은 진공방식이 비진공방식에 비해 훨씬 간편하게 조성비를 맞출수 있다. 그 중에 스퍼터링법은 대면적 박막태양전지로의 가능성으로 비출어 볼때 산업화를 위한 좋은 후보군이 될 수 있다. Selenization을 하기전에 Cu-In-Se의 전구체 조합은 여러개의 타겟으로부터 동시 스퍼터링법이나 다층 전구체법을 사용하여 준비되는데 어떤 방법이 되던지 Se의 부가적인 공급은 불가피하다. 지금까지 많은 관련 연구의 대부분인 구조적, 조성비적 그리고 광학적인 특성평가에 집중되어 오고 있는데, 전기적특성평가의 경우는 면저항, 비저항 같은 간단한 결과 위주로 보고되어 오고 있다. 또한 캐리어농도와 이동도에 대한 보고가 있음에도 불구하고 이해되기에는 충분치 못한 면이 많다.본 발표에서는 태양전지 제조 전단계로서 소다라임유리기판(SLG)위에 Mo의 유무에 따라 CIS박막의 전기적인 특성 변화에 대한 내용을 담고 있다. 소다라임유리($2cm{\times}2cm$)를 기판으로 사용하여 아세톤-에탄올 용액에 초음파세척을 수행하고, Mo 후면전극을 DC 스퍼터링방식을 이용하여 증착을 한다. SLG와 Mo이 코팅된 SLG를 각각 RF 스퍼터 챔버에 이송한 후 수증기 제거를 위해 약 10분간 예열을 한다. 샘플에 대한 전기적특성은 Hall효과 측정장치에 의해 측정이 되며 전기전도도, 캐리어농도, 이동도 및 전도형에 대한 정보가 각각의 변수에 따라 조사된돠. 부가적으로 구조적, 조성비적인 특성을 SEM,XRD 및 EDX를 통해 조사를 하여 전기적 특성에 따른 관계성을 검토한다. SLG와 Mo가 코팅된 SLG위의 CIS박막은 전기적으로 약간 다른 특성을 보일 것으로 예측되며, 이러한 기대를 바탕으로 조성비가 이상적인 화학양론에 근접할 때 p형으로서 제시될 수 있다는 것을 보여줄 것이다.

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c-BN 박막의 박리현상에 미치는 공정인자의 영향

  • 이성훈;변응선;이건환;이구현;이응직;이상로
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.148-148
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    • 1999
  • 다이아몬드에 버금가는 높은 경도뿐만 아니라 높은 화학적 안정성 및 열전도성 등 우수한 물리화학적 특성을 가진 입방정 질화붕소(cubic Boron Nitride)는 마찰.마모, 전자, 광학 등의 여러 분야에서의 산업적 응용이 크게 기대되는 자료이다. 특히 탄화물형성원소에 대해 안정하여 철계금속의 가공을 위한 공구재료로의 응용 또한 기대되는 재료이다. 특히 탄화물형성원소에 대해 안정하여 철계금속의 가공을 위한 공구재료로의 응용 또한 크게 기대된다. 이 때문에 각종의 PVD, CVD 공정을 이용하여 c-BN 박막의 합성에 대한 연구가 광범위하게 진행되어 많은 성공사례들이 보고되고 있다. 그러나 이러한 c-BN 박막의 유용성에도 불구하고 아직 실제적인 응용이 이루어지지 못한 것은 증착직후 급격한 박리현상을 보이는 c-BN 박막의 밀착력문제때문이다. 본 연구에서는 평행자기장을 부가한 ME-ARE(Magnetically Enhanced Activated Reactive Evaporation)법을 이용하여 c-BN 박막을 합성하고, 합성된 c-BN 박막의 밀착력에 미치는 공정인자의 영향을 규명하여, 급격한 박리현상을 보이는 c-BN 박막의 밀착력 향상을 위한 최적 공정을 도출하고자 하였다. BN 박막 합성은 전자총에 의해 증발된 보론과 (질소+아르곤) 플라즈마의 활성화반응증착(activated reactive evaporation)에 의해 이루어졌다. 기존의 ARE장치와 달리 열음극(hot cathode)과 양극(anode)사이에 평행자기장을 부여하여 플라즈마를 증대시켜 반응효율을 높혔다. 합성실험용 모재로는 p-type으로 도핑된 (100) Si웨이퍼를 30$\times$40 mm크기로 절단 후, 100%로 희석된 완충불산용액에 10분간 침적하여 표면의 산화층을 제거한후 사용하였다. c-BN 박막을 얻기 위한 주요공정변수는 기판바이어스 전압, discharge 전류, Ar/N가스유량비이었다. 증착공정 인자들을 변화시켜 다양한 조건에서 c-BN 박막의 합성하여 밀착력 변화를 조사하였다. 합성된 박막의 결정성 분석을 FTIR을 이용하였으며, Bn 박막의 상 및 미세구조관찰을 위해 투과전자현미경(TEM;Philips EM400T) 분석을 병행하였고, 박막의 기계적 물성 평가를 위해 미소경도를 측정하였다. 증착된 c-BN 박막은 3~10 GPa의 큰 잔류응력으로 인해 증착직후 급격한 박리현상을 보였다. 이의 개선을 위해 증착중 기판바이어스 제어 및 후열처리를 통해 밀착력을 수~수백배 향상시킬 수 있었다. c-BN 박막의 합성을 위해서는 증착중인 박막표면으로 큰 에너지를 갖는 이온의 충돌이 필요하기 때문에 기판 바이어스가 요구되는데, c-BN의 합성단계를 핵생성 단계와 성장 단계로 구분하여 인가한 기판바이어스를 달리하였다. 이 결과 그림 1에서 나타낸 것처럼 c-BN 박막의 핵생성에 필요한 기판바이어스의 50% 정도만을 인가하였을 때 잔류응력은 크게 경감되었으며, 밀착력이 크게 향상되었다.

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Preparation and Current-Voltage Characteristics of Well-Aligned NPD (4,4' bis[N-(1-napthyl)-N-phenyl-amino] biphenyl) Thin Films (분자배열된 4,4' bis[N-(1-napthyl)-N-phenyl-amino] biphenyl 증착박막 제조와 전기적 특성)

  • Oh, Sung;Kang, Do-Soon;Choe, Youngson
    • Applied Chemistry for Engineering
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    • v.17 no.6
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    • pp.591-596
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    • 2006
  • Topology and molecular ordering of NPD(4,4'-bis-[N-(1-naphthyl)-N-phenyl-amino]biphenyl) thin films deposited under magnetic field with post-deposition annealing were investigated. NPD was deposited onto ITO glass substrates via thermal evaporation process in vacuum. It is of great importance for highly oriented organic/metal films to have improved device performances such as higher current density and luminance efficiency. AFM (Atomic Force Microscope) and XRD (X-Ray Diffraction) analyses were used to characterize the topology and structure of oriented NPD films. The multi-source meter was used to observe the current-voltage characteristics of the ITO (Indium-Tin Oxide) / NPD (4,4'bis[N-(1-napthyl)-N-phenyl-amino]-biphenyl) / Al (Aluminum) device. While NPD thin films deposited under magnetic field were not molecularly well aligned according to the XRD results, the films after post-deposition annealing at $130^{\circ}C$ were well-oriented. AFM images show that NPD thin films deposited under magnetic field had a smoother surface than those deposited without magnetic field. The current-voltage performance of NPD thin films was improved due to the enhanced electron mobility in the well-aligned NPD films.