• Journal of KIISE
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• v.44 no.2
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• pp.171-178
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• 2017

In this study, we propose an automated unit test generation technique for detecting vulnerabilities of Android kernel modules. The technique automatically generates unit test drivers/stubs and unit test inputs for each function of Android kernel modules by utilizing dynamic symbolic execution. To reduce false alarms caused by function pointers and missing pre-conditions of automated unit test generation technique, we develop false alarm reduction techniques that match function pointers by utilizing static analysis and generate pre-conditions by utilizing def-use analysis. We showed that the proposed technique could detect all existing vulnerabilities in the three modules of Android kernel 3.4. Also, the false alarm reduction techniques removed 44.9% of false alarms on average.