• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2007년도 추계학술대회 논문집
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• pp.255-256
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• 2007

• 대한기계학회:학술대회논문집
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• 대한기계학회 2005년도 창립60주년 기념 추계 학술대회
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• pp.136.1-136.1
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• 2005

• 한국정밀공학회지
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• 제23권10호
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• pp.36-43
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• 2006

• 한국정밀공학회지
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• 제23권4호
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• pp.22-28
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• 2006

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2005년도 춘계학술대회 논문집
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• pp.556-560
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• 2005

The measurement method by Laser Speckle Interferometry which uses the interference law which will grow precedes and with it explains a resolution measurement ability and together the change of place arrowhead and general measurement, at real-time measurement sensitivity it has application boat song from candle precise measurement field it is increasing. But, currently the domestic application technique to sleeps and optical science military merit by optical science interferometer and directness it composes purchases to the level which it applies the expensive commercial business equipment the outside and in spite of the technical ripple effect is deficient even in many strong point. The hazard which complements like this problem point form technical development it leads from the research which it sees and an application degree and to sleep as the measurement equipment which tries to develop the small-sized optical science interference sensor and an interpretation program it raises it does.

• 한국정밀공학회지
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• 제16권12호
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• pp.190-197
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• 1999

Electronic speckle contouring(ESC) is the optical method for measuring shape by using fringe-projection techniques in electronic speckle pattern interferometry. It has the advantage of being non-contacting and can also give a field view of the surface under investigation. Fringes in ESC represent the difference in depth along the view direction between the master wavefront and the test component. The contour maps of three-dimensional diffuse objects are obtained by small shifts of optical fiber carrying the dual-object-beams and 4-frame phase shift. We proposed the contouring method by shifting the collimated illumination beams through optical fiber in order to obtain the contour fringe patterns. And also, we performed addition of incremental addition of images and experiments based on it. we obtained both quantitative increment without decorrelation effect and qualitative improvement by reducing the noise of contour fringes.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2004년도 추계학술대회 논문집
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• pp.29-33
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• 2004

This paper presents ESPI system for the measurement of thermal expansion coefficient of STS430 up to 1,000$^{\circ}C$. Existing methods, strain gauge and moire have the limitation of contact to object and do not supply the coefficient up to 800$^{\circ}C$. There needs to measure the data up to 800$^{\circ}C$, because heat resistant materials have high melting temperature up to 1,000$^{\circ}C$. In previous studies related to thermal strain analysis, the quantitative results are not reported by ESPI at high temperature, yet. In-plane ESPI and vacuum chamber for the reduction of air turbulence and oxidation are designed for the measurement of the coefficient up to 1,000$^{\circ}C$and speckle correlation fringe pattern images are processed by commercial image filtering tool-smoothing, thinning and enhancement- to obtain quantitative results, which is compared with references data. The comparison shows two data are agreed within 4.1％ blow 600$^{\circ}C$ however, there is some difference up to 600$^{\circ}C$. Also, the incremental ratio of the coefficient is changed up to 800$^{\circ}C$. The reason is the phase transformation of STS430 probably begins at 800$^{\circ}C$.

• 비파괴검사학회지
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• 제21권2호
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• pp.177-181
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• 2001

광학적 비접촉 비파괴검사 방법인 ESPI, Shearography를 이용한 측정은 자동차나 항공기산업 등에서 최근 폭넓게 이용되고 있다. 빠른 측정 속도와 측정 대상의 전 영역을 한번에 측정할 수 있는 장점을 가진 Shearography를 이용한 비파괴검사 방법을 기존의 광계측법인 ESPI와 비교하였다. 또한 이러한 장점을 살려 산업현장에서 수행한 여러 가지 비파괴검사 사례를 제시하였다.

• 한국공작기계학회:학술대회논문집
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• 한국공작기계학회 1998년도 춘계학술대회 논문집
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• pp.239-244
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• 1998

ESP(Electronic Speckle Pattern Interferometry) is an optical technique to measure deforamtion of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive measuring method, is capable of providing full-field results with high spatial resolution and high speed. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and a shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring. And by this geometric analysis, we performed the electronic speckle contouring experiment. We used 4-frame phase shifting method with PZT for quantitative analysis of contour fringes. Finally, we showed good agreements between the geometric analysis and experimental results.

• 비파괴검사학회지
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• 제25권2호
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• pp.81-86
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• 2005

본 논문에서는 반도체 패키지 내부결함의 비파괴 정량평가를 위한 ESPI 기법을 이용한 시스템 및 검사기 법을 제안하고 있으며, 검사시스템은 ESPI 검사장치, 열변형유도장치, 단열챔버로 구성되어있다. 기존 초음파, X-ray 기반의 검사기법에 비하여 측정시간 및 검사방법이 용이하며, 결함의 정량검출이 가능하다는 장점이 있다. 검사결과에서 대부분의 결함이 열 방출이 많은 칩 주위에서 박리결함으로 나타났으며, 원인은 층간 접착강도의 약화와 열분배 설계에서 문제점인 것으로 사료된다.