A study on phase change characteristics of $Ge_2Sb_2Te_5$ thin films for phase change random access memory
(상변화 메모리를 위한 $Ge_2Sb_2Te_5$ 박막의 상변화 특성 연구)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2009.06a
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- pp.70-70
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- 2009