• 제목/요약/키워드: 복합재 빔

검색결과 21건 처리시간 0.015초

수렴성 빔 전자회절법을 이용한 $SiC_p/Al$ 복합재에서의 계면 생성물의 상분석 (Phase Identification of the Interfacial Reaction Product of $SiC_p/Al$ Composite Using Convergent Beam Electron Diffraction Technique)

  • 이정일;이재철;석현광;이호인
    • Applied Microscopy
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    • 제26권1호
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    • pp.95-104
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    • 1996
  • A comprehensive methodology to characterize the interfacial reaction products of $SiC_p/2024$ Al composites is introduced on the basis of the experimental results obtained using XRD, SEM and TEM. XRD performed on the electrochemically extracted $SiC_p$ and bulk $SiC_p/2024$ Al composite have shown that the interfacial reaction products consist of $Al_{4}C_3$ having hexagonal crystallographic structure, pure eutectic Si having diamond cubic crystallographic structure, and $CuAl_2$, having tetragonal crystalloraphic structure, respectively. According to the images observed by SEM, $Al_{4}C_3$, which has been reported to have needle shape, has a hexagonal platelet-shape and eutectic Si is found to have a dendritic shape. In addition eutectic $CuAl_2$, was observed to form near interface and/or along the grain boundaries. In order to confirm the results obtained by XRD, the primitive cell volume and reciprocal lattice height of such interfacial reaction products were calculated using the data obtained from convergent beam electron diffraction (CBED) patterns, and then compared with theoretical values.

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