• Journal of the Korean Society for Nondestructive Testing
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• v.32 no.2
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• pp.177-184
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• 2012

An optical defect detection method using ESPI(electronic speckle pattern interferometry) is proposed. ESPI is widely used as a non-contact measurement system which show deformation and phase map in real time. ESPI can be divided as the in-plane, out-of-plane and shearography by operation principle and target object and also divided with bulk type and optic fiber type by the optic configurations. This paper is focused on optic fiber type out-of-plane ESPI, which has the following advantages: (1) low cost; (2) reduction of the unreliable factors generated by separated optic components; (3) simplification of the optic configuration; (4) great reduction of volume; (5) flexibility, to be easily designed into different structures to adapt to inaccessible environments such as pipeline cavity and so on.