• Journal of Sensor Science and Technology
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• v.9 no.2
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• pp.90-95
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• 2000

The substrate for pyroelectric IR sensor which has orientation similar to MgO single crystal was fabricated by depositing the MgO thin film on $Si_3N_4/SiO_2/Si_3N_4$/Si. The MgO thin film was deposited by RF magnetron sputtering. The c-axis orientation of PLT thin film deposited on Pt/MgO(100)/$Si_3N_4/SiO_2/Si_3N_4$/Si substrate was investigated. The MgO thin film deposited at $500^{\circ}C$ at a gas pressure of 30 mTorr with RF power of 160 W exhibited a good a-axis orientation. The PLT thin films deposited on these substrates also exhibited c-axis orientation similar to the PLT thin films deposited on MgO single crystal substrate.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.221-221
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• 2010

NiO 산화물 타겟을 이용한 RF 마그네트론 스퍼터 방법로 glass 기판 위에 NiO 온도를 R.T(room temperature)~$400^{\circ}C$ 변화시켜 Ar 가스만을 사용하여 박막을 증착시켜, 증착 온도에 따라 NiO 박막 특성에 미치는 영향을 조사하였다. XRD 측정으로부터 증착된 박막의 결정구조는 $200^{\circ}C$이하에서 (111) 면의 우선 배향성으로 보이다가 $300^{\circ}C$ 이상에서 (220)의 우선 배향성으로 보이는 다결정 입방구조임을 확인하였다. NiO 박막의 전기적 특성의 변화는 기판의 온도가 $200^{\circ}C$까지는 $10^5\;{\Omega}cm$대를 보였고 기판의 온도가 $300^{\circ}C$ 이상에서는 $10^{-2}{\sim}10^{-1}{\Omega}cm$대로 감소하는 것을 관측하였다. 이러한 ${\sim}10^7$ 정도의 큰 저항 변화를 관측하였고, 전기적 변화 특성을 결정성, 결정립의 변화 및 NEXAFS를 통한 밴드 구조 변화 등으로 설명하였다.

• Korean Journal of Crystallography
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• v.7 no.2
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• pp.175-182
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• 1996

ZnO thin films were deposited on Corning 7059 glass substrates to study fundamental properties of films. According to the experimental results, (002) preferred ZnO thin films were grown by purging Ar/O2 mixed gas, but not without oxygen gas. The structure and the orientation of ZnO thin films were much affected by the substrate temperature and rf power. High quality ZnO films were obtained by increasing their values. Optimum deposition parameters were : 300W rf power, 300℃ substrate temperature, Ar/O2=70/30. To characterize SAW propagation properties, IDT was fabricated by etching Al films deposited on diamond/Si wafer with RIE. Measured λ(wavelength) was 24μm and experimental results were well matched with simulation. Center frequency was 250MHz, and the calculated phase velocity of ZnO/ diamond structure was about 6000m/s.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.368-368
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• 2011

최근에 보고된 양질의 고효율Cu(In,Ga)Se2 (CIGS) 태양전지는 CIGS광흡수층이 강한 (220:204) 우선배향성을 갖는 것으로 알려져 있다 [1]. 이러한 CIGS우선배향성은 Se 증착압력, Na농도, 기판온도 및 Mo후면전극의 표면상태에 영향을 받는 것으로 알려져 있지만 정확한 상호관계는 아직 명확히 알려져 있지 않으며, 특히 Mo후면전극의 영향에 대해서는 체계적인 연구결과조차 극히 드문 상황이다 [2]. 본 연구에서는 CIGS 박막의 우선배향성에 대해 Mo후면전극의 미세구조가 미치는 영향 및 이에 따른 cell특성의 변화에 대해서 연구하였다. Mo후면전극의 미세구조는 2 mTorr~16 mTorr까지 증착압력을 변화시켜 제어되었고, CIGS광흡수층은 이렇게 준비된 Mo후면전극상에 3단계 동시증밥법(3-stage process)을 사용하여 형성하였다. XRD를 통한 박막의 우선배향성 평가에서, Mo 증착압력에 대한 IGS I(300)/I(006) 및 CIGS I(220:204)/I(112)의 거동은 Mo 미세구조와 밀접한 관련이 있는 잔류응력(residual stress)의 변화 거동과 상당히 일치함을 보였다. 이에 반해, 높은 압력의 Mo위에 형성된 강한 (220:204) 우선배향성의 CIGS와 bare-glass위에서 형성된 강한 (112) 우선배향성의 CIGS내 Na농도는 서로 유사하였다. 상기의 결과는 Mo미세구조 그 자체가 CIGS 박막 우선배향성의 원인이 됨을 나타낸다. Selenized Mo시편의 XRD분석 및 IGS/Mo 시편의 TEM분석결과을 통해 MoSe2의 반응성이 잔류응력과 비례하는 Mo in-gain 밀도에 의존하는 함을 알 수 있었고, 이러한 MoSe2반응성(reactivity)과 IGS우선배향성 사이에 상당히 밀접한 관련이 있으며 이에 CIGS의 우선배향성이 결정됨을 확인하였다. 마지막으로, Mo변수에 의해 제작된 cell의 특성분석으로부터 cell의 효율이 주로 VOC의 증가에 기인하여 CIGS (220:204) 우선배향성의 정도에 비례하였다.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.246-246
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• 2011

졸-겔 스핀코팅(sol-gel spin-coating)법을 이용하여 실리콘 기판에 ZnO 박막을 증착하였다. 증착된 졸 용액을 전열처리(pre-heat treatment) 후, 다른 속도로 상온까지 냉각시켰다. ZnO 박막의 특성 분석을 위하여 atomic force microscopy (AFM), X-ray diffraction (XRD), Raman, photoluminescence (PL)을 이용하였다. 전열처리 후 5$^{\circ}C$/min의 속도로 천천히 냉각시킨 ZnO 박막은 산맥구조(mountain chain structure)로 표면이 매우 거친 반면, 빠르게 냉각시킨 ZnO 박막은 매우 매끄러운 표면을 나타내었다. 빠르게 냉각시킨 ZnO 박막의 c-축 배향성(c-axis preferred orientation)이 느리게 냉각시킨 ZnO 박막의 배향성보다 더 우세하게 나타났고, 결정성도 우수하였다. 뿐만 아니라, 빠르게 냉각시킨 ZnO 박막의 광학적 특성이 느리게 냉각시킨 ZnO 박막의 특성보다 우수하게 나타났다. 후열처리(post-heat treatment)에 의해 ZnO 박막의 구조적 및 광학적 특성이 더욱 향상되었다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2009.10a
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• pp.136-137
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• 2009

RF 마그네트론 스퍼터링 방법을 이용하여 증착 power density에 따른 AlN 박막의 배향성과 표면 거칠기 그리고 열전도도 특성의 변화를 조사하였다. 특히 power density가 1.79 W/$cm^3$일 때 가장 우수한 배향성을 얻을 수 있었다. 이러한 배향성과 연관시켜 박막의 미세구조, 표면거칠기, 유전율 등을 분석하였으며, 이러한 특성이 열전도도에 미치는 영향에 대하여 연구하였다.

• Korean Journal of Materials Research
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• v.10 no.1
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• pp.90-96
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• 2000

The effects of the type and thickness of underlayers on the crystallographic texture and the sheet resistance of aluminum thin films were studied. Sputtered Ti and Ti/TiN were examined as the underlayer of the aluminum films. The texture and the sheet resistance of the metal thin film stacks were investigated at various thicknesses of Ti or TiN, and the sheet resistance was measured after annealing at $400^{\circ}C$ in an nitrogen ambient. For the Ti underlayer, the minimum thickness to obtain excellent texture of aluminum <111> was 10nm, and the sheet resistance of the metal stack was greatly increased after annealing due to the interdiffusion and reaction of Al and Ti. TiN between Ti and Al could suppress the Al-Ti reaction, while it deteriorated the texture of the aluminum film. For the Ti/TiN underlayer, the minimum Ti thickness to obtain excellent texture of aluminum <111> was 20nm, and the minimum thickness of TiN to function as a diffusion barrier between Ti and Al was 20nm.

• Journal of Satellite, Information and Communications
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• v.10 no.3
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• pp.89-93
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• 2015

Ion-beam irradiation(IB) on $HfO_2$ surface induced high-performance liquidcrystal(LC) driving at a 1-V threshold with vertical alignment of liquid crystals(LC). The high-k materials Atomic layer deposition was used to obtain LC orientation on ultrathin and high-quality films of $HfO_2$ layers. To analyze surface morphological transition of $HfO_2$ which can act as physical alignment effect of LC, atomic force microscopy images are employed with various IB intensities. The contact angle was measured to elucidate the mechanism of vertical alignment of LC on $HfO_2$ with IB irradiation. Contact angle measurement show the surface energy changes via IB intensity increasing.

• Journal of the Korean Ceramic Society
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• v.39 no.12
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• pp.1171-1176
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• 2002

The growth characteristics on the MgO thin films prepared by the e-beam evaporation method have been investigated. We observed the film of preferred orientation and surface morphology with various parameters such as substrate temperature, deposition rate on Si(100) and slide glass respectively. Consequently, it was shown that MgO(111) preferred orientation films can be obtained as the deposition rate was increased on Si(100) substrate. MgO(220) peak was found as the substrate temperature was increased. Whereas, in case of slide glass the orientation is changed from (200) to (111) by substrate temperature. Also we investigated the relationship between the film characteristics and the orientation of MgO thin films.

• Journal of the Korean Vacuum Society
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• v.9 no.4
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• pp.394-399
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• 2000

The effects of the type and thickness of underlayer on the crystallographic texture and the sheet resistance of aluminum thin film were studied. Ti and Ti/TiN were examined as the underlayer of aluminum. Ti and TiN were prepared by ionized physical vapor deposition (I-PVD) metalorganic chemical vapor deposition (MOCVD), respectively. The texture and the sheet resistance of metal thin film stacks were investigated at various thicknesses of Ti or TiN, and the sheet resistance was measured after annealing at $400^{\circ}C$ in an nitrogen ambient. For I-PVD Ti underlayer, the excellent texture of aluminum <111> was obtained even at top of 5 nm of Ti. However, the sheet resistance of the metal stack was greatly increased after annealing due to the interdiffusion and reaction of Al and Ti. MOCVD TiN between Ti and Al could suppress the Al-Ti reaction without severe degradation of aluminum <111> texture. Excellent texture of aluminum was obtained for the MOCVD TiN thinner than 4 nm.