• Korean Journal of Crystallography
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• v.5 no.1
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• pp.24-32
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• 1994

The study of (0001), (1120) and (1011) GAN epitaxy films grown on the (0001),(1012) and (1120) α-Al2O3 substrates have been investigated using the haliar vapor phaes epitaxy(HVPE) method in Ga/HCI/NH3/He system. XRD, RHEED and SEM are used for the study of the films struction and surface morphology. Chemical composition of the film surface is estimsted by XPS. The following orientation relationships are observed; (0001) GaN /(0001) Al2O3 (1120) GaN/ (1012) Al2O3 and (0001) and (1011) GaN/ (1120) Al2O3 in accordance with growth conditions. The (0001) GaN films grown on(0001) and (1120) a-Al2O3 substrates at higer temperature(1050℃) have shown two dimensional grownth mechanism. Form SEM and RHEED, the smoother surface morphology and better structure are observed for the (1011) GaN films grown on (1120) sapphire at higer temperature.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.300-300
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• 2008

In this study, the advanced DuoPIGatron-type ion beam (IB) system was applied to inorganic thin film for aligning liquid crystal (LC). LC alignment on $Ta_2O_5$ via IB irradiation was embodied. As a result of IB irradiation, the homogeneously aligned liquid crystal display (LCD) on $Ta_2O_5$ was observed with low pretilt angles. The $Ta_2O_5$ were deposited on indium-tin-oxide coated Coming 1737 glass substrates by rf magnetron sputtering at $200^{\circ}C$. The deposition process resulted in forming very uniform thin film on glass substrates without any defects. To confirm the application of the inorganic alignment on modem display optical devices, we fabricated twisted nematic LCD and measured optical property and response time. As a result of the experiment, the electro optical characteristics of the LCD fabricated by using IB irradiation on $Ta_2O_5$ alignment layer were similar with the other LCD fabricated by using rubbing process.

• Journal of Sensor Science and Technology
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• v.4 no.2
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• pp.7-13
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• 1995

A new FET type semiconductor pressure sensor (PSFET : pressure sensitive field effect transistor) was fabricated and its operational characteristics were investigated. A ZnO thin film as a piezoelectric layer, $5000{\AA}$ thick, was deposited on a gate oxide of FET by RF magnetron sputtering. The deposition conditions to obtain a c-axis poling structure were substrate temperature of $300^{\circ}C$, RF power of 140watt, and working pressure of 5mtorr in Ar ambience. The fabricated PSFET device showed good linearity and stability in the applied pressure range($1{\times}10^{5}\;Pa{\sim}4{\times}10^{5}\;Pa$).

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.3
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• pp.558-564
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• 2012

We fabricated Ga doped ZnO (GZO) thin films on the glass substrate (Eagle 2000) with various of Ga doping concentration and annealing temperatures using sol-gel method, electrical and optical properties were investigated. When the GZO thin films doped with 1 mol% of Ga and annealed at $600^{\circ}C$, the excellent (002) orientation was observed. In the results of Hall measurement, carrier concentration decreased and resistivity increased due to segregation effect with increasing of the Ga doping concentration. The largest carrier concentration and lowest resistivity were $9.13{\times}10^{18}cm^{-3}$ and $0.87{\Omega}cm$, respectively, in the GZO thin films doped with 1 mol% Ga and annealed at $600^{\circ}C$. All films is higher than 80 % in the visible light region. Energy band gap narrowing due to Burstein-Moss effect was observed with increasing of Ga doping concentration from 1 to 4 mol%.

• Polymer(Korea)
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• v.24 no.1
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• pp.90-96
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• 2000

Organic electroluminescent (EL) device was fabricated with Alq$_3$ as an emitting material and PDPMA ultra thin film prepared by Langmuir-Boldgett technique as a polymer hole transport layer. A stable condensed PDPMA monolayer was obtained using arachidic acid as a surface active material. The thickness and absorbance of PDPMA LB film increased line-arly with the layer numbers. The organic multilayered device consisted of ITO/PDPMA LB film (19 layers)/Alq$_3$/Al emitted green light with brightness of 2500 cd/m$^2$ at a DC 14 V Especially, the drive voltage of EL device having PDPMA LB film of 15 layers exhibited the value as low as 4 V. The effects of thickness control and molecular orientation in the PDPMA LB film on EL performance were discussed.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.11a
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• pp.22-23
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• 2005

In order to increase the critical current of coated conductor, highly Bi-axially textured substrates are required. Texture uniformity of substrate is also important to fabricate high quality superconducting coated conductor because the amount of current flow along the coated conductor is limited by the defects such as bad textured area. Therefore, we need to evaluate the distribution of texture of Ni substrate along the length before buffer layer deposition on Ni tape. R2R(reel-to-reel) XRD system was used to measure the texture of long Ni substrate continuously. $\theta-2\theta$ scan of 10 m long Ni tape was measured and indicates that some of Ni(111) planes equally remain on Ni(002) textured substrate. The results of continuous Ni(220) $\Phi$-scan indicate that average FWHM is 9$^{\circ}$ within $\pm$1.

• Journal of the Korean Chemical Society
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• v.39 no.1
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• pp.1-6
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• 1995

The surface of a sapphire substrate used for hetero-epitaxy was chemically polished in a mixture of $H_3PO_4\;and\;H_2SO_4$ solution. The extent of etching for various crystal orientations was found to be dependent on the etching time at $315{\pm}2^{\circ}C$ and at the composition of $H_2SO_4 : H_3PO_4$=3 : 1. In addition, the etching rates of the substrates were investigated in the mixture of $H_2SO_4 : H_3PO_4$=3 : 1 by volume and in the temperature range of 280~320$^{\circ}C$. From the plot of log R against 1/T, the activation penergy ($(E_a)$) was found to be in the order of $({\bar1}012) > (10{\bar1}0) > (11{\bar2}0) > (0001)$ plane. After removing the surface layers of the sapphire with (0001), $({\bar1}012),\;(10{\bar1}0)\;and\;(11{\bar2}0)$ plane by a thickness of 64.6, 46.5, 16.2 and 5.1 ${\mu}m$, respectively, the morphology of the resulting surface was observed by SEM.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.79-79
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• 2010

최근, 차세대 디스플레이, 터치스크린, 전자파 차폐 및 흡수 등의 분야에 응용하기 위해서 현재 주로 사용되고 있는 ITO박막을 대체하기 위한 연구가 활발하게 진행 되고 있다. ITO 박막은 희소원소인 인듐에서 기인하는 높은 비용뿐만 아니라 매장량도 한계가 있어 대체 재료의 개발이 시급하게 요구되고 있다. 더구나, 다양한 차세대 응용에 있어서는 투명전도성 뿐만 아니라 휠 수 있는 유연성까지 요구되어 ITO박막을 대체할 새로운 투명전도성 유연 박막의 개발에 관한 연구들이 활발히 이루어지고 있다. 탄소나노튜브(CNT)는 금속을 능가하는 이론적인 전기전도도를 갖고 있으며, 높은 탄성등의 우수한 기계적 성질을 갖고 있어, 전도성 확보 및 유연성 구현이라는 투명전도성 플렉서블 박막소재에 요구되는 사항들을 충족시킬 뿐만 아니라, 최근의 대량 합성법등의 개발로 저가에 공급할 수 있다는 장점들이 있어 ITO대체 재료로서 주목을 받고 있다. 그러나, CNT는 튜브 사이에 강한 반데르발스 인력을 가지고 있어 용매 중에 분산하는데 많은 어려움이 있으며, 액상 분산과정을 통한 CNT기반의 플렉서블 박막 제작에 있어서 큰 과제로 남아있다. 본 연구에서는 플라즈마 기능화 처리를 통하여 CNT에 친수성을 부여하였고, 초음파 처리를 통하여 에탄올 중에 CNT를 균일하게 분산한 후, 스프레이 분사법을 이용해 투명 유연기판인 PET고분자 필름위에 균일 박막을 제작하였다. CNT는 아세틸렌 가스를 이용한 열화학증기증착법으로 1mm 이상의 길이를 갖는 수직배향 CNT를 합성하였으며, 이를 아르곤 및 암모니아 플라즈마로 기능화 처리를 실시하였다. 플라즈마 처리를 통해 기능화 된 탄소나노튜브는 플라즈마 처리되지 않은 탄소나노튜브와 분산 속도에서 현저한 차이를 보였다. 제작한 CNT 기반의 투명전도성 유연박막들은 막두께에 따른 전도도 및 투광도의 관계를 조사하였고, 기판에 분사된 CNT 박막의 표면 특성은 AFM, Raman, 접촉각 실험 등을 통하여 분석하였다.

• Korean Journal of Materials Research
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• v.9 no.12
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• pp.1216-1221
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• 1999

GaN films were deposited on sapphire [$Al_2O_3(0001)$] substrates at relatively low temperature by MOCVD using N-atom source based on a Dielectric Barrier Discharged method. Ammonia gas($NH_3$is commonly used as an N-source to grow GaN films in conventional MOCVD process, and heating to high temperature is required to provide sufficient dissociation of $NH_3$. We used a dielectric barrier discharge method instead of $NH_3$ to grow GaN film relatively low temperature. DBD is a type of discharge, which have at least one dielectric material as a barrier between electrode. DBD is a type of controlled microarc that can be operated at relatively high gas pressure. Crystallinity and surface morphology depend on growth temperature and buffer layer growth. With the DBD-MOCVD method, wurtzite GaN which is dominated by the (0001) reflection was successfully grown on sapphire substrate even at $700^{\circ}C$.

• Journal of the Korean Magnetics Society
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• v.4 no.1
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• pp.25-31
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• 1994

The magnetic properties of aluminum anodized film in which Co-Fe alloy electrodeposited are investigated with regard to the alloy composition of magnetic films. The electrodeposited Co-Fe particles are confirmed to be single phase Co-Fe alloys by X-ray diffractions. At 34 at% Co, the sample with small pore diameter(particle diameter $150\;{\AA}$) has a large magnetic energy product($B_{max}$) of about 1.44 MGOe due to the large saturation magnetization, the high coercive force and good squareness of the M-H curve. However, for the samples with particle diameter larger than $450\;{\AA}$, the bottom of each particle forms abnormal particle claaed branch-shaped unlike the sample of the particle diameter $150\;{\AA}$. In this case, the magnetic anisotropy energy was about zero at the compositions of 45 and 75 at% Co. Moreover, at the compositions from 50 to 70 at% Co, the anisotropy became negative value. This means that an easy axis of magnetization of the film is in plane in plane in spite of the perpendicular shape anisotropy of the particle. It was found that the bottom extremity of the particle contains FeC from the X-ray diffraction. Thus the effect of the bottom extremity, that is, an unusal magnetic property was removed by electrodepositing Cu at the bottom extremity of the particle. Itis clear that the magnetic properties of the ilms are influenced by he branch-shaped bottom extremity filled with FeC.