• Journal of the Korean Society of Radiology
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• v.4 no.2
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• pp.31-35
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• 2010

In this study, we surveyed students recognition of the base units and radiation related units among international standard units, and determined the necessity of unit education. The survey was conducted using a questionnaire composed of 18 questions, and in the survey, students at the Radiology Department were asked about recognition and education. According to the results of the survey, around 44% of the students answered wrongly on base unit kV, and around 28% answered wrongly on km. Particularly with regard to the relation between units and numbers, around 57% of the students chose wrong answers. As to prefix mega and giga, respectively, 22% and 20% of the students chose wrong answers. To the question on radiation related unit Sv, around 30% gave wrong answers. Recognition of radiation related units was higher in senior students. To the question of whether to have received special education on units, over 50% of the students replied negatively. These results suggest the necessity of education on international standard units.

• Journal of radiological science and technology
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• v.3 no.1
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• pp.3-6
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• 1980

• Electrical & Electronic Materials
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• v.5 no.2
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• pp.244-251
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• 1992

무독성 혼합안정제 Zn/Ca-stearate의 방사선 안정화 효과를 증진시키기 위해서 oxy-methylene, oxy-ethylene 및 oxy-porpylene 구조의 직쇄형 및 고리형 에테르 화합물을 PVC에 배합하여 방사선조사 하였을 때 PVC의 색차변화를 측정하여 이들 에테르 화합물의 방사선 안정화 효과를 비교 검토하였다. 에테르 화합물에서 oxy-ethylene 구조단위수 4이상인 직쇄형 에테르 또는 고리형 에테르와 oxy-propylene 구조단위수 7인 직쇄형 에테르는 매우 우수한 방사선 안정화 효과를 나타내고 있다. oxy-ethylene 또는 oxy-propylene 구조의 에테르의 방사선 안정화는 Zn/Ca-stearate에서 생성되는 ZnCl$_{2}$와 에테르의 주쇄구조 oxy-ethylene 또는 oxy-propylene의 착체반응에 의한 것으로 추정된다.

• Journal of Radiation Protection and Research
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• v.6 no.1
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• pp.78-82
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• 1981

• Nuclear Engineering and Technology
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• v.8 no.2
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• pp.124-128
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• 1976

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2016.05a
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• pp.775-777
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• 2016

In this paper presents an analysis of pulsed radiation effects of unit devices. Unit devices are the nMOSFET, pMOSFET, NPN Transistor and those fabricated by the 0.18um CMOS process. Pulsed radiation test results in nMOSFET, the photocurrent of tens nA was generated in $2.07{\times}10^8rad(si)/s$. For the pMOSFET, a photocurrent generation was not observed in $3{\times}10^8rad(si)/s$. For the NPN transistor, the photocurrent was generated with about 1uA. Therefore, the MOSFET must be used than BJT transistor when radhard IC design.

• Journal of the Korean Society for Aeronautical & Space Sciences
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• v.34 no.11
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• pp.84-91
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• 2006

Recently, all the electrical parts for satellite application are required more strong against cosmic rays, because spacecraft's life time and function are depending on the their conditions. Also, a TID effect test was undertaken with units and/or subsystems which are already assembled on the PCB in past time. However, it is very hard to know and analyze that some abnormal states are appeared after launch. Moreover, it is necessary to perform a test of TID effects based on the parts level for preparing preliminary data in cosmic rays. Therefore, this paper presents a test-bed to perform a TID effect test of Metal-Oxide Semiconductor Field Effect Transistor (MOSFET) which is a fundamental element for electronics.

• Nuclear industry
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• no.1011 s.18
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• pp.45-48
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• 1979

• Nuclear industry
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• v.20 no.2 s.204
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• pp.68-79
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• 2000

• Journal of Radiation Protection and Research
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• v.20 no.3
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• pp.201-213
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• 1995

Protection against non-ionizing radiation(NIR) is the subject of an increasing interest but the use of very different concepts depending on the type of radiation or application, makes it rather difficult to compile studies and the data obtained in an uniformity in this field. The main object of the present paper is to summarizes and provide an inventory of concepts, quantities, units and terminology currently used for purposes of NIR protection. Furthermore a systematic classification and comparison of these quantities is given, and in particular the concepts used to quantify exposure limitation and radiation protection standards are summarized and discussed.