• Title/Summary/Keyword: 문장 검출율 측정법

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New Fault-detection Methodology of high-level event in VHDL models (VHDL 모델의 상위레벨고장 검출방법)

  • 김강철
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2004.05b
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    • pp.651-654
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    • 2004
  • In this paper, high-level events that adjust or control the conflicts between blocks or process statement, or job sequences are defined compared to low-level events. This paper proposes that high-level events consist of resources conflicts and protocol or specification-dependent conflicts, and two low-level coverage metrics can be used to defect high-level events.

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