• Title/Summary/Keyword: 리던던트 분석

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Speech Compression by Non-uniform Sampling at the maxima and minima (극대 및 극소점에서의 비균일 표본화에 의한 음성압축)

  • Rheem, Jae-Yeol;Baek, Sung-Joon;Ann, Sou-Guil;Kim, Bum-Hoon
    • The Journal of the Acoustical Society of Korea
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    • v.11 no.4
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    • pp.36-44
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    • 1992
  • To reduce the redundancy within samples that resulted from uniform sampling method, nonuniform sampling or nonredundant-sample coding methods can be considered. But it is well-known that when conventional nonuniform sampling methods are applied directly to speech signal, the amount of data required is comparable to or more than that required by uniform sampling method like PCM. To overcome this problem, we consider properties of speech signal in the sense of perception, and suggest a nonuniform sampling method at the maxima and minima of speech wave. To analyze the performance of the suggested method, compression ratio is considered. We show that compression ratio can be improved by silence detection, which can't be implemented by conventional methods based on uniform sampling. As experimental results, compression ratios of 1.54 without silence detection and 2.88 with silence detection for 8kHz 8-bit PCM signals are obtained.

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RRAM (Redundant Random Access Memory) Spare Allocation in Semiconductor Manufacturing for Yield Improvement (수율향상을 위한 반도체 공정에서의 RRAM (Redundant Random Access Memory) Spare Allocation)

  • Han, Young-Shin
    • Journal of the Korea Society for Simulation
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    • v.18 no.4
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    • pp.59-66
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    • 2009
  • This has been possible by integration techniques such as very large scale integration (VLSI) and wafer scale integration (WSI). Redundancy has been extensively used for manufacturing memory chips and to provide repair of these devices in the presence of faulty cells. If there are too many defects, the momory has to be rejected. But if there are a few defects, it will be more efficient and cost reducing for the company to use it by repairing. Therefore, laser-repair process is nedded for such a reason and redundancy analysis is needed to establish correct target of laser-repair process. The proposed CRA (Correlation Repair Algorithm) simulation, beyond the idea of the conventional redundancy analysis algorithm, aims at reducing the time spent in the process and strengthening cost competitiveness by performing redundancy analysis after simulating each case of defect.