• Journal of the Institute of Electronics Engineers of Korea TC
• /
• v.42 no.7 s.337
• /
• pp.63-70
• /
• 2005

We investigated the phase noise of an oscillator with a extremely high-Q resonator used as the resonant element. A TE$_{011}$ mode rutile-loaded resonator with high-temperature superconductive (HTS) $YBa_2Cu_3O_{7-\delta}$(YBCO) films used as the endplates is prepared for this purpose. At 23.5 K, the unloaded Q and the loaded Q are 863000 and 180000, respectively. The phase noise of -104.8 dBc/Hz at 1 KHz offset was observed for the oscillator having a resonator with $Q_{L}$ =180000 at the $TE_{01\delta$ mode resonant frequency of 8.545 GHz at 23.5 K Such oscillators with very low phase noise are expected to be used for building up communication systems capable of efficient use of the frequency band and high-speed data transmission as well as for Doppler radars. Frequency tuning could be realized for the resonator by using a piezoactuator Applicability of the tunable rutile resonator for fabricating tunable oscillators of high performances is discussed.

• Progress in Superconductivity
• /
• v.4 no.2
• /
• pp.137-143
• /
• 2003

In measuring the microwave surface resistance of high-Tc superconductor (HTS) films using the dielectric-loaded cavity resonator method, one of the most important factors that limit the measurement sensitivity is the measurement error in the loss tangent ($tan\delta$) of the dielectric rod placed inside the cavity. We have measured the effective surface resistance ( $R_{S}$ $^{eff}$) of$ YBa_2$$_Cu3$$_{7-{\delta}}$ (YBCO) films and the $tan\delta$ of rutile ($TiO_2$) using the 'two-tone'method suggested by Kobayashi et at. [IEEE, MTT-S Digest, 495, (2001)], which enables simultaneous measurements of both the $R_{S}$ $^{eff}$ fof HTS films and the $tan\delta$ of the rutile with high sensitivity. A rutile-loaded cavity resonator with the $TE_{012}$ and $TE_{021}$ resonant frequencies at 13.67 - 14.01 GHz is used for this purpose. At temperatures where the two modes do not couple with other modes, the $R_{S}$ $^{eff}$ of YBCO films and $tan\delta$ of rutile measured by the two-tone method appear to match well with the corresponding values measured using the reported $tan\delta$ values of sapphire within 10 %. Usefulness of the 'two-tone' method for microwave characterization of HTS films and dielectrics is discussed.d.ielectrics is discussed.ussed.