• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.1
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• pp.14-19
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• 2008

Semiconductor testing area challenges many testing issues due to the minimization and ultra high performance of current semiconductors. Among these issues, signal integrity test on interconnections must be solved for highly integrated circuits like SoC. In this paper, we propose an effective pattern application method for signal integrity test on interconnects. Proposed method can be applied by using boundary scan architecture and very efficient test can be preceded with pretty short test time.

• Journal of the Korean Data and Information Science Society
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• v.22 no.1
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• pp.37-47
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• 2011

Stock price index option market has various investment strategies that have been developed. Specially, arbitrage strategies are very important to be efficient in option market. The purpose of this study is to improve profit using rough set and Box spread by using past option trading data. Option trading data was based on an actual stock exchange market tick data ranging from 2001 to 2006. Validation process was carried out by transferring the tick data into one-minute intervals. Box spread arbitrage strategies is low risk but low profit. It can be accomplished by back-testing of the existing strategy of the past data and by using rough set, which limit the time line of dealing. This study can make more stable profits with lower risk if control the strategy that can produces a higher profit module compared to that of the same level of risk.

• The Transactions of the Korea Information Processing Society
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• v.6 no.7
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• pp.1805-1816
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• 1999

This paper presents the Module Class Dependency Graph for expressing the dependency relations between classes effectively. The object-oriented language is developed independently at design time, and consists of relationship between classes. Therefore we need to consider these characteristics of independence, and to express effectively the relation of classes which is existed in class hierarchy. In the System Dependence Graph and Class Dependence Graph, the relationship of classes is not expressed. To express the class relationship, we propose the Module Class Dependence Graph, and we verify the effectiveness of this method applying to object constructor, inheritance relationship and dynamic binding. Also, we presents the expressing method of parameter to identify the member data of classes. Using this Module Class Dependency Graph, we can analyze the relationship of module class correctly at design time. This method can be applied to reverse engineering, testing, visualization and other various fields to analyze system.

• Journal of Korea Multimedia Society
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• v.12 no.2
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• pp.231-243
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• 2009

Currently interests of embedded software in various areas such as automotive field, ship field, robot field is increasing according to expand market of embedded systems. Various researches such as embedded operating systems, embedded software modeling technique, embedded software testing, and so on are going in progress. However systematic engineering approach in embedded system development is poor because embedded areas focus on hardware parts until now. Furthermore, framework-based de sign technique considering reusability is not reflected in embedded system development. Those development results in many of dead codes scattered in system, and results in poor reusability of system. This paper suggests a framework of embedded system for reusability and a static meta-model for reuse framework. Proposed meta-model expresses not only the structure of reuse framework, but also allows a designer to extend and design easily models of embedded system based on reuse framework according to various embedded system types.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.36C no.2
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• pp.14-25
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• 1999

The IEEE standard 1149.1, which was proposed to increase the observability and the controllability in I/O pins, makes it possible the board level testing. In the boundary-scan environments, many shift operations are required due to their serial nature. This increases the test application time and the test application costs. To reduce the test application time, the method based on the parallel opereational multiple scan paths was proposed, but this requires the additional I/O pins and the internal wires. Moreover, it is difficult to make the designs in conformity to the IEEE standard 1149.1 since the standard does not support the parallel operation of data shifts on the scan paths. In this paper, the multiple scan path access algorithm which controls two scan paths simultaneously with one test bus is proposed. Based on the new algorithm, the new algorithm, the new board level BIST architecture which has a relatively small area overhead is developed. The new BIST architecture can reduce the test application time since it can shift the test patterns and the test responses of two scan paths at a time. In addition, it can reduce the costs for the test pattern generation and the test response analysis.

• The KIPS Transactions:PartD
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• v.9D no.5
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• pp.847-858
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• 2002

A purpose of the object-oriented programming is to promote reuse and development time, and to improve software quality. A way for this purpose is using a design information well-defined and tested in previous time when developing software. Such design information is called design patterns. The design patterns are descriptions of abstract solution to recurse software design problems In a systematic and general way. But because the design patterns are descriptions of abstract solution, the specification and application of patterns generally rely on manual implementation and is applied to various forms. As a result, we need to spend a lot of time to develop software program not only because of difficulty in analyzing and applying to patterns consistently, but also because of the frequent programing faults. And because the applied design patterns don't express inside application visually, it is difficult to analyze and test for this design patterns. In this paper, we propose automatic source code generating technique to be able to efficiently apply the element of design patterns when developing application. And we show a way to analyze and use the applied design patterns in application. As a result, the design patterns in application provide the consistent structure and efficiency, and make analysis and using effect increased.