• The korean journal of orthodontics
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• v.40 no.3
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• pp.156-166
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• 2010

Objective: The surface roughness of orthodontic materials is an essential factor that determines the coefficient of friction and the effectiveness of tooth movement. The aim of this study is to evaluate the surface roughness change of the brackets and wires after experimental sliding quantitatively. Methods: Before and after experimental sliding tests, the surface roughness of stainless steel brackets, ceramic brackets, stainless steel wires, and beta-titanium (TMA) wires were investigated and compared using atomic force microscopy (AFM). Results: After sliding tests, changes in the surface of the wire were greater than changes in the bracket slot surface. The surface roughness of the stainless steel bracket was not significantly increased after sliding test, whereas the roughness of ceramic brackets was decreased. Both the surface roughness of stainless steel and TMA wires were increased after sliding test. More changes were observed on the ceramic bracket than the stainless steel bracket. Conclusions: AFM is a valuable research tool when analyzing the surface roughness of the brackets and wires quantitatively.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.30 no.12 s.255
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• pp.1611-1617
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• 2006

A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head was developed for use in the nano-metrology field. The x and y position of the sample with respect to the tip are acquired by using the laser interferometer in the open-loop state, when each z data point of the AFM head is taken. The sample scanner which has a motion amplifying mechanism was designed to move a sample up to $100{\times}100{\mu}m^2$ in orthogonal way, which means less crosstalk between axes. Moreover, the rotational errors between axes are measured to ensure the accuracy of the calibrated AFM within the full scanning range. The conventional homodyne laser interferometer was used to measure the x and y displacements of the sample and compensated via an X-ray interferometer to reduce the nonlinearity of the optical interferometer. The repeatability of the calibrated AFM was measured to sub-nm within a few hundred nm scanning range.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1778-1783
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• 2008

A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head was developed for use in the nanometrology field. The x and y position of the sample with respect to the tip are acquired by using the laser interferometer in the open-loop state, when each z data point of the AFM head is taken. The sample scanner which has a motion amplifying mechanism was designed to move a sample up to $100{\times}100{\mu}m^2$ in orthogonal way, which means less crosstalk between axes. Moreover, the rotational errors between axes are measured to ensure the accuracy of the calibrated AFM within the full scanning range. The conventional homodyne laser interferometer was used to measure the x and y displacements of the sample and compensated via an X-ray interferometer to reduce the nonlinearity of the optical interferometer. The repeatability of the calibrated AFM was measured to sub-nm within a few hundred nm scanning range.

• The korean journal of orthodontics
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• v.40 no.5
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• pp.294-303
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• 2010

Objective: This study was designed to measure the surface roughness at the slot floor of various ceramic brackets. Methods: One kind of stainless steel bracket ($Succes^{(R)}$), two kinds of monocrystalline brackets (Inspire $Ice^{(R)}$, $Perfect^{(R)}$) and two kinds of polycrystalline brackets (Crystalline $V^{(R)}$, $Invu^{(R)}$) were examined. Atomic force microscopy (AFM) was used to measure the surface roughness of each bracket. Data acquisition and processing were performed using $SPIP^{TM}$. Results: The differences in values of Sa, Sq, and Sz in $Invu^{(R)}$ and Inspire $Ice^{(R)}$ were not statistically different from the control group $Succes^{(R)}$. The values of Sa, Sq, and Sz of $Perfect^{(R)}$ and Crystalline $V^{(R)}$ were greater than those of $Succes^{(R)}$. Differences of all the Sa, Sq, and Sz values between $Perfect^{(R)}$ and Crystalline $V^{(R)}$ were not statistically significant. Conclusions: It is concluded that the slot surfaces of $Succes^{(R)}$, Inspire $Ice^{(R)}$, and $Invu^{(R)}$ were smooth compared to those of Crystalline $V^{(R)}$ and $Perfect^{(R)}$.