• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.31 no.1
• /
• pp.1-5
• /
• 2018

This study analyzed the change of electrical characteristics of a photocoupler when a narrow-band electromagnetic wave was combined with the photocoupler. A magnetron (3 kW, 2.45 GHz) was used as the narrow-band electromagnetic source. The EUT was Photocoupler (6N139) and the input signal was divided into two types: a square pulse and the second signal is 0 V. The malfunction of the photocoupler was confirmed by monitoring the variation in the output voltage of the photocoupler. As a result of the experiment, changes in the malfunctioning was observed as the electric field was increased. There are three types of malfunction modes: delay, output voltage off, and fluctuation. Bit errors were analyzed to verify the electrical characteristics of the photocoupler by narrow-band electromagnetic waves. The result of this study can be used as basic data for the effect analysis of photocoupler protection and impact analysis of high-power electromagnetic waves.

• Journal of Sensor Science and Technology
• /
• v.12 no.4
• /
• pp.185-190
• /
• 2003

Recently, sensors which use the infrared light, supersonic waves, and electromagnetic waves have been used for many applications to detect information of the object. For these sensors, the accompanying system which utilizes the sensor should be systematically developed. In this paper, a general microwave radar sensor system is briefly described, and then basic applications of a CW doppler radar sensor system are introduced. For the CW doppler radar sensor applications, a highly-stable, low-cost Dielectric Resonator Oscillator (DRO) has also been designed and implemented, which can be used for commercial microwave sensor systems. The implemented DRO has output power of +5.33 dBm at 12.67 GHz and phase noise of -108.5 dBc/Hz at the 100 kHz offset frequency.

• Journal of the Korea Institute of Building Construction
• /
• v.19 no.3
• /
• pp.209-217
• /
• 2019

EMP (Electromagnetic Pulse) usually means High Power Electromagnetic Wave (HPEM). In the case of the shielding plate against the EMP, there is a possibility of deterioration of the electromagnetic wave shielding performance due to the skill of the constructor, bad construction, deformation of the shielding plate at the connection portion (joint portion). The inefficient use of space due to the separation distance is also pointed out as a problem. Therefore, this study aims to derive the optimum electromagnetic shielding condition by applying ATMSM to concrete as a part of securing electromagnetic wave shielding performance with reflection loss against concrete wall. Experimental parameters included concrete wall thickness and application of Zn-Al ATMSM. For the concrete wall, the wall thickness was 100 to 300mm, which is generally applied, and experimental parameters were set for the application of Zn-Al metal spraying method to evaluate electromagnetic shielding performance. Experimental results showed that as the thickness increases, the electromagnetic shielding performance increases due to the increase of absorption loss. In addition, after the application of Zn-Al ATMSM, the average shielding performance increased by 56.68 dB on average, which is considered to be increased by the reflection loss of the ATMSM. In addition, it is considered that the shielding performance will be better than that when the conductive mixed material and the ATMSM are simultaneously applied.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.29 no.9
• /
• pp.559-564
• /
• 2016

This study examined the malfunction mode of the HCMOS IC under narrow-band high-power electromagnetic wave. Magnetron is used to a narrow-band electromagnetic source. MFR (malfunction failure rate) was measured to investigate the HCMOS IC. In addition, we measured the resistance between specific pins of ICs, which are exposed and not exposed to the electromagnetic wave, respectively. As a test result of measurement, malfunction mode is shown in three steps. Flicker mode causing a flicker in LED connected to output pin of IC is dominant in more than 7.96 kV/m electric field. Self-reset mode causing a voltage drop to the input and output of IC during electromagnetic wave radiation is dominant in more than 9.1 kV/m electric field. Power-reset mode making a IC remained malfunction after electromagnetic radiation is dominant in more than 20.89 kV/m. As a measurement result of pin-to-pin resistance of IC, the differences between IC exposed to electromagnetic wave and normal IC were minor. However, the five in two hundred IC show a relatively low resistance. This is considered to be the result of the breakdown of pn junction when latch-up in CMOS occurred. Based on the results, the susceptibility of HCMOS IC can be applied to a basic database to IC protection and impact analysis of narrow-band high-power electromagnetic waves.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.21 no.12
• /
• pp.67-76
• /
• 2020

The purpose of this study was to derive the directionality of technology development of high-power electromagnetic pulse (EMP) shielding concrete and standardization of a shielding performance evaluation method. Because the EMP shielding mechanism of concrete has not been identified clearly, and the verification method for EMP shielding performance has not been standardized, it is difficult to compare the research results between researchers. The development direction of EMP shielding concrete was derived from a consideration of the electromagnetic wave loss mechanism of metal. The standardization direction for verifying the EMP shielding performance of concrete was derived from a consideration of the electrical properties of concrete and the shielding performance evaluation methods of previous studies. As a result, the development of electrically conductive concrete is required, and test methods classified by the electromagnetic wave loss mechanism should be applied. For quality verification, the development of EMP shielding concrete will be feasible and its performance can be evaluated if a test method referencing the generalized shielding evaluation method (MIL-STD, etc.) is applied.

• Asia-pacific Journal of Multimedia Services Convergent with Art, Humanities, and Sociology
• /
• v.7 no.1
• /
• pp.219-227
• /
• 2017

Current military command information system uses electronic equipment a lot on which semiconductor chip is attached. It seems its' importance will increase more with latest information communication technology developing. Electronic equipment which uses electricity contains regular tolerance to high output electric signal. And EMC specification is the standardized of this electronic equipment's tolerance. On the other hand, the Institute of Atomic Energy Research has ever declared that high output electromagnetic pulse(EMP) will be broken out within the radius of 170Km when 10kt nuclear explosion occurs at an altitude of 40Km above Seoul. Then, the region suffer from the damage of most electronic equipments. Therefore, the norm to protect the influences in that case is defined by EMP protection specification. Most common electronic equipments meet the EMC norm, but there is no way to check whether they meet the EMP norm or not. That is because it is difficult to check whether they meet EMP protection norm and is on the matter of cost. Except inevitable cases, there is no review of checking whether they meet the norm or not. Considering the above, in this research, we speculate about the measures to improve military EMP protection ability by analyzing the EMC-EMP correlation and checking the EMP protection ability of general electronic equipment through the analysis.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
• /
• v.28 no.5
• /
• pp.391-399
• /
• 2017

At present the general trend of modern electronics is toward smaller packages and high performance. As an antenna requires high powers, the EMC(Electromagnetic Compatibility) problems of the transmission line stage is becoming crucial day by day. In this paper, a transmission line excited by the electromagnetic fields from an infinitesimal electric dipole antenna is analyzed using the modified telegrapher's equations. The analytical equations are derived for arbitrarily positioned electric dipole with reference to a transmission line. To verify our approach, the induced voltage and current at the terminal were computed by the proposed approach and compared with those obtained by the electromagnetic simulation solver. Furthermore, the induced currents at the terminal of a transmission line excited by the electric dipoles at various positions were investigated using our approach.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.30 no.9
• /
• pp.535-540
• /
• 2017

The changes in the electrical characteristics of CMOS ICs due to coupling with a narrow-band electromagnetic wave were analyzed in this study. A magnetron (3 kW, 2.45 GHz) was used as the narrow-band electromagnetic source. The DUT was a CMOS logic IC and the gate output was in the ON state. The malfunction of the ICs was confirmed by monitoring the variation of the gate output voltage. It was observed that malfunction (self-reset) and destruction of the ICs occurred as the electric field increased. To confirm the variation of electrical characteristics of the ICs due to the narrow-band electromagnetic wave, the pin-to-pin resistances (Vcc-GND, Vcc-Input1, Input1-GND) and input capacitance of the ICs were measured. The pin-to-pin resistances and input capacitance of the ICs before exposure to the narrow-band electromagnetic waves were $8.57M{\Omega}$ (Vcc-GND), $14.14M{\Omega}$ (Vcc-Input1), $18.24M{\Omega}$ (Input1-GND), and 5 pF (input capacitance). The ICs exposed to narrow-band electromagnetic waves showed mostly similar values, but some error values were observed, such as $2.5{\Omega}$, $50M{\Omega}$, or 71 pF. This is attributed to the breakdown of the pn junction when latch-up in CMOS occurred. In order to confirm surface damage of the ICs, the epoxy molding compound was removed and then studied with an optical microscope. In general, there was severe deterioration in the PCB trace. It is considered that the current density of the trace increased due to the electromagnetic wave, resulting in the deterioration of the trace. The results of this study can be applied as basic data for the analysis of the effect of narrow-band high-power electromagnetic waves on ICs.