• Korean Journal of Materials Research
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• v.7 no.6
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• pp.517-521
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• 1997

고분해능 전자현미경과 컴퓨터 이미지 시뮬레이션이 La이 첨가되고 또한 첨가되지 않은 Pb(Mg/ sub 1/3/Nb$_{2}$3/)O$_{3}$고용체의 미세구조를 연구하기 위해서 사용되었다. 불규칙격자 영역의 격자 이미지는 정방정 형태와 유사 육방정 형태를 각각 보였다. 규칙격자 영역에서 Mg과 Nb의 비화학양론적인 규칙격자 구조 현상이 <111>방향에 따라 관찰되었다. 실험 격자 이미지와 컴퓨터 시뮬레이션 이미지의 비교로부터, 규칙격자 구조를 가지는 영역의 장거리 규칙도는 0.2-0.7의 값을 가지고 있었고, 또한 규칙격자는 (NH$_{4}$)$_{3}$FeF$_{6}$결정구조를 가지고 있었다. 작은 값의 장거리 규칙도를 가지는 규칙격자를 가지는 영역에서, 변형률 파형이 관찰되지 않았다. 이것은 대부분 두 양이온이 그들의 위치에 있기 때문에, 원자 변위가 없었기 때문이다.

• Applied Microscopy
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• v.36 no.1
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• pp.1-6
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• 2006

In this review, the important ideas of coherence theory are introduced. The transfer function and damping envelopes of the microscope due to temporal and spatial coherence are described. The passbands and the condition of Scherzer focus are discussed in associated with the resolution of transmission electron microscope. The characterization of coherence is also described.

• Journal of the Society of Cosmetic Scientists of Korea
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• v.28 no.2
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• pp.58-72
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• 2002

The high resolution transmission electron microscope(HRTEM) is one of the most powerful methods fer investigating internal structures of various materials on an atomic scale. In fact, HRTEM images are becoming much more common in scientific papers, and are making valuable contributions to development of industrial products. With rapid improvement of current HRTEMS, their maximum resolution reaches almost 0.1 nm. In this paper we describe the fundamental formulation of the imaging process of HRTEM and their practical application f3r nano materials.

• Journal of the Mineralogical Society of Korea
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• v.16 no.3
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• pp.255-263
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• 2003

Margarite, occurring in an Unkyori Formation of Miwon area, Chungcheongbukdo, South Korea, was investigated using a high-resolution transmission electron microscope (HRTEM) to reveal the microstructural intergrowth textures of margarite. HRTEM images of margarite, which was previously confirmed to have intergrowth textures by petrographic microscope and back-scattered electron images, show that chlorite occurs as thin packets of layers interlayered within margarite crystals, and intercalated chlorite layers are intergrown irregularly in areas as a few hundred angstroms thick slabs or isolated chlorite unit layers. Margarite crystals observed by HRTEM consist of a well-ordered 2M polytype, and electron diffraction pattern shows no prominent streaking along the 001 (or $c^{*}$) direction, indicating that there is no significant stacking disorder in margarite. Intercalated extra brucite-like layers, which are approximately 5 $\AA$ thick, are observed locally within margarite crystals. Insertion of such extra brucite-like layer at the interlayer of margarite would result in a chlorite-like structure unit. (001) margarite layers are parallel to (001) of chlorite, and margarite layers are not extended from (001) of chlorite, indicating that margarite was apparently produced through a dissolution-precipitation mechanism.m.

• Korean Journal of Crystallography
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• v.14 no.2
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• pp.79-83
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• 2003

The microstructure of bulk electrolytic MnO₂ (EMD) was studied using x-ray diffraction and transmission electron microscopy (TEM). The bulk sample showed a typical powder x-ray diffraction pattern of EMD materials. TEM study showed that the structure of EMD is present at two length scales;grains, ∼0.2 ㎛ in diameter, and ∼10 nm crystallites within the grain. The electron beam microdiffraction study revealed that each grain is an assemblage of multiphase with a common crystallographic orientation, and_that ∼50% of the crystallites are Ramsdellite, ∼30% are ε-MnO₂, and ∼15% are Pyrolusite. The ｛1120｝peak located at about 67° in powder XRD pattern as well as a high-resolution electron microscope (HREM) image of (0001) plane support the existence of ε-MnO₂ phase.

• Journal of the Korean Institute of Telematics and Electronics
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• v.26 no.8
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• pp.1203-1210
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• 1989

A cross-sectional transmission electorn microscopy study of the MBE grown GaAs/Al0.3 Ga0.7As layers was carried out at high-resolution so that the atomic arrangement of the well, barrier and the interface could be understood on an atomic level. Results show that the images reveal directly the atomic structure of the GaAs, Al0.3Ga0.3 Ga0.7 As interface is sharply defined but is not smooth on the atomic scale. The roughness arises from the presence of hills with heights of several{002} GaAs interplanar spacings. The atomic arrangement at the interface is almost completely coherent without any structural disorder. Alloy clustering at the interface was not observed.

• Applied Microscopy
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• v.34 no.4
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• pp.255-264
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• 2004

The three-dimensional (3D) structure of an inorganic crystal, $SmZn_{0.67}Sb_2$ (space group P4/nmm, $a=4.26{\AA}\;and\;c=10.37{\AA}$) was solved by electron crystallography. High resolution electron microscopy (HREM) images from 3 different major zone axes and selected-area electron diffraction patterns from 16 different zone axes were combined to obtain a 3D information. A crystallographic image processing (CIP) of HREM images was used for more accurate determination of the crystal structure. As a result of this electron crystallography, average phase errors (${\Phi}_{res}$) of [001], [100] and [110] HREM images are $17.0^{\circ},\;8.3^{\circ}\;and\;21.9^{\circ}$, respectively. Xray crystallography of $SmZn_{0.67}Sb_2$ has attempted to compare accuracy of the structure determination by electron crystallography, which resulted in the cell parameters of $a=4.2976(6){\AA}\;and\;c=10.287(2){\AA}$, and the R-factor ($R_{sym}$) of 4.16%.

• Journal of the Korean Ceramic Society
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• v.38 no.8
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• pp.755-760
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• 2001

본 연구에서는 카본전극의 표면개질에 따른 리튬이온 전지의 전지특성 변화에 대해서 연구하였다. 즉, mesocarbon microbeads(MCMB) 카본에 에폭시 수지(resin)를 코팅시킴으로서 카본전극 표면에 개질시켰으며, 이에 따른 전극의 전기화학적 특성을 고찰하였다. 에폭시 수지에 의한 카본의 표면코팅은 30%의 H$_2$SO$_4$용액에서 2시간 동안 refluxing한 MCMB를 에폭시 수지를 용해시킨 THF(tetrahydrofuran) 용액에 넣어 혼합함으로써 MCMB 표면에 에폭시 수지가 코팅되도록 하였다. 이렇게 에폭시 수지가 코팅된 MCMB를 약 1000-130$0^{\circ}C$로 열처리하여 고분해능 투과전자현미경으로 관찰한 결과, 코팅층은 비정질 카본 구조를 갖게됨을 알 수 있었다. 또한, 에폭시 수지에 의하여 코팅된 MCMB는 코팅되지 않은 MCMB보다 더 높은 BET 비표면적을 나타내었다. Li/MCMB 전지 cell을 만들어 충방전시험을 수행한 결과, 에폭시 수지에 의하여 코팅된 MCMB로 만든 전극이 더 우수한 충방전 용량과 싸이클 특성을 나타내었다. 에폭시 수지 코팅으로 전극 표면을 개질시킴으로서 전지특성이 개선된 원인에 관하여 에폭시 코팅의 결정구조와 전극계면에서의 부동태 피막(passivation film) 형성과 연계하여 논의하였다.

• Journal of the Korean Ceramic Society
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• v.26 no.2
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• pp.276-288
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• 1989

Interpretation of high-resolution transmission electron microscopy images of defects and complex structures such as found in ceramics generally requires matching of the images with compound image simulations for reliable interpretation. A transmission electron microscopy study of the aluminum oxide was carried out at high-resolution, so that the crystal structure of the aluminum oxide could be modelled on an atomic level. In conjunction with computer simulation comparisons, the images reveal directly the atomic structure of the oxide. Results show that comparison between experimental high-resolution electron microscopy images and simulated images leads to a one to one correspondence of the image to the atomic model of the aluminum oxide. The aluminum atoms are disordered in the octahedral sites and the tetrahedral sites in the spinel aluminum oxide.

• Journal of the Korean Vacuum Society
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• v.2 no.3
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• pp.374-383
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• 1993

필라멘트와 Si 기판 사이의 기전력을 20, 80, 140, 200V로 증가시키면서 EACVD에 의하여 성장된 다이아몬드 박막에 대하여 다이아몬드/Si 계면분석 및 계면강도를 측정하였다. 주사형전자현미경(SEM), 고분해능투과형전자현미경(HRTEM), 오제이전자분석기(AES)에 의해 계면상태를 분석한 결과, 기전력 증가에 따라 활성탄화수소 이온(CmHn-)에너지가 증가되어져 CmHn-이 Siso로 침투(Impringement)가 증가되고 침투된 높은 에너지의 CmHn-이 Si과 화학결합하여 생성되는 SiC층 깊이 및 농도 분포도 증가된다. 풀 시험(Pull test)에 의한 계면강도 측정 결과, SiC층 깊이 및 농도분포가 증가할수록 계면강도가 증가하였다. 관찰된 파면과 파면의 X-선 메핑 결과 및 HRTEM과 AES에 의한 분석 결과, 기전력 증가에 따라 공극율이 적고 치밀한 다이아몬드 박막이 성장된다. 그리고 생성되는 SiC층 농도 및 깊이 분포가 증가함에 따라 다이아몬드/Si 계면이 강화되고, 상대적으로 파괴는 다이아몬드/Si 계면이 아닌 SiC층이나 Si 내부에서 발생된다. 결국, 기전력을 증가하여 활성탄화수소이온의 에너지를 증가함으로써 계면강도가 우수하며 공극율이 매우 적고 치밀한 다이아몬드 박막을 성장할 수 있다.