A Method of Detecting Short and Protrusion-type FAB Defects Based on Local Binary Pattern Analysis (국부지역 이진 패턴 분석법에 기초한 단락 및 돌기형 FAB불량 검출기법)
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- Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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- 2013.10a
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- pp.1018-1020
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- 2013