• 한국재료학회지
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• 제31권9호
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• pp.488-495
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• 2021

Solid state grain growth (SSCG) is a method of growing large single crystals from seed single crystals by abnormal grain growth in a small-grained matrix. During grain growth, pores are often trapped in the matrix and remain in single crystals. Aerosol deposition (AD) is a method of manufacturing films with almost full density from nano grains by causing high energy collision between substrates and ceramic powders. AD and SSCG are used to grow single crystals with few pores. BaTiO₃ films are coated on (100) SrTiO₃ seeds by AD. To generate grain growth, BaTiO₃ films are heated to 1,300 ℃ and held for 10 h, and entire films are grown as single crystals. The condition of grain growth driving force is ∆G_max < ∆G_c ≤ ∆G_seed. On the other hand, the condition of grain growth driving force in BaTiO₃ AD films heat-treated at 1,100 and 1,200 ℃ is ∆G_c < ∆G_max, and single crystals are not grown.

• 한국세라믹학회:학술대회논문집
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• 한국세라믹학회 2000년도 추계총회,초청강연,특별강연,연구발표회
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• pp.87.2-87
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• 2000

• 한국세라믹학회:학술대회논문집
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• 한국세라믹학회 2000년도 추계총회,초청강연,특별강연,연구발표회
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• pp.183.2-183
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• 2000

• 한국재료학회:학술대회논문집
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• 한국재료학회 1996년도 재료학회 춘계학술발표회
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• pp.37-37
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• 1996

• 한국재료학회:학술대회논문집
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• 한국재료학회 1998년도 IUMRS-ICEM ABSTRACT BOOK
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• pp.130.1-130
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• 1998

• 한국재료학회:학술대회논문집
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• 한국재료학회 1998년도 IUMRS-ICEM ABSTRACT BOOK
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• pp.42.1-42
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• 1998

• The Korean Journal of Ceramics
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• 제6권3호
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• pp.309-314
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• 2000

In the present study, preliminary experimental results of the change in the properties of perovskite-type oxides caused by the $^{18}O$- exchange have been reported. Two systems were selected for the exchange, (1) $ATiO_3$(A=Ca,Sr,Ba) and (2) manganese perovskite. The dielectric properties of isotope-exchanged $SrTi^{18}O_3$showed a drastic change from a quantum paraelectricity below 3K to ferroelectric-like behavior with a peak at 23K and an enhanced dielectric constant, 35000 at the peak. On the contrary, the $T_c$ for $BaTiO_3$was found to increase by 0.9K. The observed isotope shift of $T_c$ as well as $T_co$ for the manganese perovskites is correlated with the key parameters controlling the lattice such as $Mn^{3+}$ content, average ionic radius of the A-site cation <$r_A$> ad A-site ionic disorder $\sigma^2$.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 하계학술대회 논문집
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• pp.263-266
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• 2001

In this paper, we investigated dielectric properies for BST thin films that was deposited on MgO/Si substrates using RF magnetron sputtering. In here, MgO film was used to perform that a diffusion b arrier between the BST film and Si substrate and a buffer layer to assist the BST film growth. A d eposition condition for MgO films was RF Power of 50W, substrate temperature of room temperature and the working gas ratio of Ar:O$_2$ were varied from 90:10 to 60:47. Finally we manufactured the cap acitor of Al/BST/MgO/Si/Al structure to know electrical properties of this capacitor through I-V, C-V measurement. In the results, C-V aha racteristic curves was shown a ferroelectric property so we measured P-E. A remanent poliazation and coerceive electric field was present 2$\mu$C/cm$^2$ and -27kV/cm respectively at Ar:O$_2$=90:10. And a va clue of dielectric constant was 86 at Ar:02=90:10.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제54권1호
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• pp.13-17
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• 2005

The Pb(Zr/sub 0.52/Ti/sub 0.48/)O₃/(Ba/sub 0.6/Sr/sub 0.4/)TiO₃[PZT/BST] heterolayered thin films were deposited on Pt/Ti/SiO₂/Si substrates by using the RF sputtering method with different RF power. The PZT/BST heterolayered thin films had the tetragonal structure of the PZT phase and BST phase. Increasing the RF power. the intensity of the PZT (100), (110) peaks and BST (111) peaks were decreased and the intensity of the BST (100), (110) peaks were increased. The thickness ratio of the top layered BST thin film and the bottom layered PZT thin film was 2 to1. The atomic concentration of the Ba, Sr, Pb. Zr, Ti atoms were constant in the PZT thin films and BST thin films, respectively. The Pt atom was diffused to the PZT region in the PZT/BST heterolayered thin films deposited at condition of 60[W] RF power. Increasing the frequency, dielectric constant and loss of the PZT/BST heterolayered thin films were decreased. The dielectric constant and loss of the PZT/BST heterolayered thin films deposited with RF power of 90[W] were 406 and 3%, respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 추계학술대회 논문집
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• pp.21-22
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• 2007

내환원성을 가지는 (Ca,Sr)(ZrTi)$O_3$계 C0G 원료와 코어 쉘 구조를 가지는 $BaTiO_3$계 X7R 원료를 적용하여 고압용 적층 칩 캐패시터를 제작하여 내부전극 형상 및 원료에 따른 신뢰성 밑 전기적 특성을 연구하였다. C0G 특성의 원료는 X7R 원료에 비해 단위 두께당 내전압이 감소하는 경향이 적었으며 내전압 특성도 우수하게 나타났다. 또한, 내부 전극 설계에 있어 floating에 따른 영향은 C0G, X7R 특성 원료 모두 향상된 전기적 특성과 신뢰성을 가짐을 확인 할 수 있었다.